168297 ⎘
Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups – , or by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials; Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor Goniometers
X-RAY DIFFRACTION APPARATUS AND MEASUREMENT METHOD
#2METHOD, X-RAY DIFFRACTION SYSTEM, AND PROGRAM FOR CALCULATING MISCUT ANGLE OF SINGLE-CRYSTAL SOLID SAMPLE
#3RECORDING APPARATUS, SYSTEM, METHOD, AND PROGRAM
#4SPECTROMETER
#5MONITORING MODULE, X-RAY DIFFRACTION APPARATUS, AND MONITORING SYSTEM
#6X-RAY ANALYSIS APPARATUS AND METHOD
#7SPECIMEN HOLDERS FOR X-RAY DIFFRACTOMETER
#8PROCESSING APPARATUS, SYSTEM, METHOD, AND PROGRAM FOR CALCULATING A STRUCTURAL FACTOR
#9Single-crystal X-ray structure analysis apparatus and method, and sample holder unit therefor
#10DEVICE FOR ROTATING A SPECIMEN ABOUT TWO ORTHOGONAL AXES
#11Transmissive small-angle scattering device
#12Transmissive small-angle scattering device
#13CORRECTION APPARATUS, SYSTEM, METHOD, AND PROGRAM
#14X-RAY DETECTOR FOR X-RAY DIFFRACTION ANALYSIS APPARATUS
#15TRANSMISSION X-RAY DIFFRACTION APPARATUS AND RELATED METHOD
#16X-ray diffraction apparatus and measurement method
#17Correction amount specifying apparatus, method, program, and jig
#18SAMPLE HOLDER FOR PERFORMING X-RAY ANALYSIS ON A CRYSTALLINE SAMPLE, AND SAMPLE HOLDER HANDLING SYSTEM
#19Device for hosting a probe solution of molecules in a plurality of independent cells
#20X-ray examination device
#21X-ray device having multiple beam paths
#22Spectrometer
#23X-ray analysis apparatus
#24Transmissive small-angle scattering device
#25Single-crystal X-ray structure analysis apparatus and sample holder
#26Single-crystal X-ray structure analysis apparatus and sample holder attaching device
#27Single-crystal x-ray structure analysis apparatus and method, and sample holder unit therefor
#28Ball-mapping system comprising a sample stage and a sample holder for receiving ball-shaped sample, and method of operating ball-mapping system for collecting x-ray diffraction data at measurement points located on ball-shaped sample
#29SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS AND METHOD, AND SAMPLE HOLDER THEREFOR
#30Anti-frosting and anti-dew device for spectroscopic measurements
#31Determining sucrose concentration in honey based on fluorescence spectroscopy
#32Control apparatus, system, method, and program
#33Airtight box for measurement, airtight apparatus, measurement system and measurement apparatus
#34Device, system and method for X-ray diffraction analysis of an electrode of an electrochemical cell, at operating temperature and under current
#35System and method for computed laminography x-ray fluorescence imaging
#36X-ray inspection device
#37X-ray analysis apparatus
#38Divergent beam two dimensional diffraction
#39Apparatus and method for X-ray analysis with hybrid control of beam divergence
#40X-ray analysis apparatus
#41X-ray diffraction apparatus
#42Hybrid inspection system
#43X-ray inspecting device, X-ray thin film inspecting method, and method for measuring rocking curve
#44Soller slit, X-ray diffraction apparatus, and method
#45Measuring and analyzing residual stresses and their gradients in materials using high resolution grazing incidence X-ray diffraction
#46Measuring and analyzing residual stresses and their gradients in materials using high resolution grazing incidence X-ray diffraction
#47Measuring and analyzing residual stresses and their gradients in materials using high resolution grazing incidence X-ray diffraction
#48Systems and methods for materials analysis
#49Methods for aligning a spectrometer
#50X-ray diffraction device and method to measure stress with 2D detector and single sample tilt
#51Detection of crystallographic properties in aerospace components
#52X-ray apparatus having a motor-driven torque compensation at the detector circle of the goniometer
#53Processing method, processing apparatus and processing program configured to determine conditions of pole figure measurement by X-ray diffraction
#54Measurement chamber for a compact goniometer in an x-ray spectrometer
#55Method of generating a fingerprint for a gemstone using x-ray imaging
#56Operation guide system for X-ray analysis,operation guide method therefor, and operation guide program therefor
#57Method for collecting accurate X-ray diffraction data with a scanning two-dimensional detector
#58Method for scanning a sample by means of X-ray optics and an apparatus for scanning a sample
#59Detection of crystallographic properties in aerospace components
#60Systems and methods for materials analysis
#61Device for spatially orienting an X-ray optical unit and apparatus having such a device
#62Integrated reciprocal space mapping for simultaneous lattice parameter refinement using a two-dimensional X-ray detector
#63Method of conducting an X-ray diffraction-based crystallography analysis
#64X-ray analyzing apparatus and method
#65Optical axis adjustment method for X-ray analyzer and X-ray analyzer
#66X-ray topography apparatus
#67X-ray diffraction based crystal centering method using an active pixel array sensor in rolling shutter mode
#68Temperature control chamber for compact X-ray machine
#69Method for correcting timing skew in X-ray data read out of an X-ray detector in a rolling shutter mode
#70Method for correcting timing skew in X-ray data read out of an X-ray detector in a rolling shutter mode
#71Motion control system and X-ray measurement apparatus
#72Goniometer base apparatus and method
#73Object-positioning device for charged-particle beam system
#74Goniometer
#75X-ray diffractometer for mechanically correlated movement of the source, detector, and sample position
#76Goniometer
#77X-ray thin film inspection apparatus and thin film inspection apparatus and method for patterned wafer
#78X-ray diffraction screening system convertible between reflection and transmission modes
#79Combinatorial screening system and X-ray diffraction and Raman spectroscopy
#80X-ray diffraction apparatus and method
#81X-ray analysis apparatus
#82Devices and methods for detecting the position of a beam