ClassID:

168299

G01N23/20033 - CPC Classification

Classification description:

Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups – , or by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials; Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor; Sample holders or supports therefor provided with temperature control or heating means

Recent Application in this class:
#1
20250377319
2025-12-11

OPEN-AIR, VARIABLE-TEMPERATURE X-RAY DIFFRACTOMETER

#2
20250264424
2025-08-21

IMPROVED X-RAY ANALYSIS FOR HEATED SPECIMENS IN ELECTRON MICROSCOPES

#3
20240328969
2024-10-03

SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM

#4
20240319120
2024-09-26

Serial synchrotron crystallography sample holding system

#5
20230314349
2023-10-05

MULTI-PHYSICAL FIELD MEASUREMENT DEVICE FOR METAL SOLIDIFICATION PROCESS AND HOUSING THEREOF, AND MEASUREMENT METHOD

#6
20230273134
2023-08-31

TRANSMISSION X-RAY DIFFRACTION APPARATUS AND RELATED METHOD

#7
20220146441
2022-05-12

Serial synchrotron crystallography sample holding system

#8
20220099603
2022-03-31

Structure for pressurization analysis, X-ray diffraction apparatus and pressurization analysis system

#9
20220011248
2022-01-13

Soaking machine and soaking method of sample for single-crystal X-ray structure analysis

#10
20210223191
2021-07-22

Anti-frosting and anti-dew device for spectroscopic measurements

#11
20210109043
2021-04-15

Device, system and method for X-ray diffraction analysis of an electrode of an electrochemical cell, at operating temperature and under current

#12
20200411277
2020-12-31

MEMS frame heating platform for electron imagable fluid reservoirs or larger conductive samples

#13
20200150061
2020-05-14

Device for clamping and controlling the temperature of planar samples for x-ray diffractometry

#14
20190310209
2019-10-10

Specimen holder

#15
20190195814
2019-06-27

Modular specimen holders for high pressure freezing and X-ray crystallography of a specimen

#16
20190187075
2019-06-20

System for detecting and real time processing x-ray pulses from microcalorimeter detectors

#17
20190145915
2019-05-16

Cell for X-ray analysis and X-ray analysis apparatus

#18
20190074498
2019-03-07

In-situ coin cell support device for transmission mode X-ray diffraction analysis capable of controlling temperature

#19
20180088100
2018-03-29

Analysis device

#20
20180024081
2018-01-25

Sample holder for X-ray analysis

#21
20180024032
2018-01-25

Cryogenic cooling positioning apparatus, methods and applications

#22
20170212062
2017-07-27

Furnace for transmission mode X-ray diffractometer and transmission mode X-ray diffractometer using thereof

#23
20150071409
2015-03-12

Temperature control chamber for compact X-ray machine

#24
20140185768
2014-07-03

Method of measuring scattering of X-rays, its applications and implementation device

#25
20130052100
2013-02-28

Sample presentation device for radiation-based analytical equipment

#26
20130017125
2013-01-17

SAMPLE PRESENTATION DEVICE FOR RADIATION-BASED ANALYTICAL EQUIPMENT

#27
20130014528
2013-01-17

Cryogenic specimen holder

#28
20120307233
2012-12-06

Heated wafer carrier profiling

#29
20120304926
2012-12-06

Heated wafer carrier profiling

#30
20120024086
2012-02-02

Cryogenic specimen holder

#31
20110147364
2011-06-23

Heating apparatus for X-ray inspection

#32
20110096902
2011-04-28

HEATING APPARATUS FOR X-RAY INSPECTION

#33
20110064191
2011-03-17

Microcalorimetry for X-ray spectroscopy