168300 ⎘
Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups – , or by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials; Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor; Sample holders or supports therefor for high pressure testing, e.g. anvil cells
HIGH-THROUGHPUT HIGH-PRESSURE SMALL-ANGLE NEUTRON SCATTERING SAMPLE CELLS AND ENVIRONMENTS
#2Structure for battery analysis and X-ray diffraction device
#3Structure for pressurization analysis, X-ray diffraction apparatus and pressurization analysis system
#4Diamond anvil cell having an integrated sensor
#5Modular specimen holders for high pressure freezing and X-ray crystallography of a specimen
#6Sample handling apparatus for pressurized fluids and X-ray analyzer applications thereof
#7Anvils and ultra-high pressure apparatuses using the same