168302 ⎘
Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups – , or by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials Measuring diffraction of electrons, e.g. low energy electron diffraction [LEED] method or reflection high energy electron diffraction [RHEED] method
CALCULATION APPARATUS, CALCULATION METHOD, PROGRAM AND MACHINE-LEARNING MODEL GENERATING METHOD
#2NON-DESTRUCTIVE IMAGING OF POLAR DOMAINS AND CRYSTALLOGRAPHIC SYMMETRY IN THE SCANNING ELECTRON MICROSCOPE
#3Image Acquisition Method and Scanning Transmission Electron Microscope
#4MEASUREMENT AND DETERMINATION OF CRYSTALLOGRAPHIC TEXTURE WITH RESPECT TO POSITION
#5DEVICES AND SYSTEMS FOR EXPERIMENTAL FORWARD MODEL INDEXING OF ELECTRON BACKSCATTER DIFFRACTION PATTERNS
#6METHOD AND SYSTEM FOR ORIENTATING A SAMPLE FOR INSPECTION WITH CHARGED PARTICLE MICROSCOPY
#7INTERFACE DETECTION IN RECIPROCAL SPACE
#8TRANSMISSION ELECTRON MICROSCOPE AND SAMPLE ANALYSIS METHOD USING TRANSMISSION ELECTRON MICROSCOPE
#9AUTOMATED THIN FILM DEPOSITION SYSTEM AND THIN FILM DEPOSITION METHOD TO WHICH MACHINE LEARNING IS APPLIED
#10METHOD OF ANALYZING CRYSTAL STRUCTURE, CRYSTAL MORPHOLOGY, OR CRYSTAL DISTRIBUTION OF RUBBER MATERIAL IN STRETCHING
#11HIGH RESOLUTION, LOW ENERGY ELECTRON MICROSCOPE FOR PROVIDING TOPOGRAPHY INFORMATION AND METHOD OF MASK INSPECTION
#12TEM Orientation Mapping via Dark-Field Vector Images
#13ELECTRON DIFFRACTION SYSTEM FOR CHARACTERIZING NANOCRYSTALLINE STRUCTURES
#14PROXIMITY SENSOR FOR ELECTRON BACKSCATTER DIFFRACTION SYSTEMS
#15SYSTEM AND METHOD OF OPERATING AN ELECTRON ENERGY LOSS SPECTROMETER
#16LAMINATE FOR WIRING BOARD
#17SURFACE CHARACTERIZATION OF MATERIALS USING CATHODOLUMINESCENCE
#18Methods and systems for determining the absolute structure of crystal
#19METHOD AND SYSTEM FOR INDEXING ELECTRON DIFFRACTION PATTERNS
#20SPIN-RESOLVED ULTRAFAST ELECTRON DIFFRACTION
#21APPARATUS, METHOD, AND RECORDING MEDIUM STORING COMMAND FOR CONTROLLING THIN-FILM DEPOSITION PROCESS
#22ELECTRON MICROSCOPE ANALYSIS SYSTEM
#23HIGH THROUGHPUT MICROCRYSTAL SOAKING FOR STRUCTURAL ANALYSIS OF PROTEIN-LIGAND INTERACTIONS
#24IMPROVED CAMERA FOR ELECTRON DIFFRACTION PATTERN ANALYSIS
#25METHODS FOR COLLECTING ELECTRON DIFFRACTION PATTERNS
#26AUTOMATED MAPPING METHOD OF CRYSTALLINE STRUCTURE AND ORIENTATION OF POLYCRYSTALLINE MATERIAL WITH DEEP LEARNING
#27Methods for determining crystal structure and apparatus for carrying out the methods
#28Method for the detection and correction of lens distortions in an electron diffraction system
#29Methods and systems for acquiring three-dimensional electron diffraction data
#30Crystal defect observation method for compound semiconductor
#31Mass spectrometer
#32Method for improving an EBSD/TKD map
#33Systems and methods for performing serial electron diffraction nanocrystallography
#34METHOD AND SYSTEM FOR AUTOMATIC ZONE AXIS ALIGNMENT
#35Hyperdimensional scanning transmission electron microscopy and examinations and related systems, methods, and devices
#36Method and system for automatic zone axis alignment
#37Electron microscopy analysis method
#38Methods and systems for acquiring electron backscatter diffraction patterns
#39Photocathode emitter system that generates multiple electron beams
#40Methods and compositions for micro-electron diffraction
#41Apparatus, method, and recording medium storing command for controlling thin-film deposition process
#42Laser welding method between different kinds of metals for optimizing welding conditions through intermetallic compound analysis
#43System and method of analyzing a crystal defect
#44Crystal structure analysis system and crystal structure analysis method
#45Method for automatically aligning a scanning transmission electron microscope for precession electron diffraction data mapping
#46System and method for performing nano beam diffraction analysis
#47Quantitative phase analysis device, quantitative phase analysis method, and quantitative phase analysis program
#48Scanning transmission electron microscope and method of image generation
#49Scanning transmission electron microscope
#50Scanning transmission electron microscope with an objective electromagnetic lens and a method of use thereof
#51POLYCRYSTALLINE SILICON ROD
#52Method of determining the deflection of an electron beam resulting from an electric field and/or a magnetic field
#53Devices and systems for spatial aggregation of spectral analysis from electron microscopes
#54Detector for X-rays with high spatial and high spectral resolution
#55Method of performing electron diffraction pattern analysis upon a sample
#56Method for determining 3D primitive reciprocal basis of unknown crystal based on single EBSD pattern
#57Devices and systems for spatial averaging of electron backscatter diffraction patterns
#58Electron microscope
#59Strain mapping in TEM using precession electron diffraction
#60Method and system for electron microscope with multiple cathodes
#61Apparatus and method of applying small-angle electron scattering to characterize nanostructures on opaque substrate
#62Phase retrieval from ptychography
#63Apparatus and method for determining molecular structure
#64System and process for measuring strain in materials at high spatial resolution
#65Transmission electron diffraction measurement apparatus and method for measuring transmission electron diffraction pattern
#66Dynamic focus adjustment with optical height detection apparatus in electron beam system
#67Method and system of evaluating distribution of lattice strain on crystal material
#68Diffraction microscopy
#69Ultrafast electron diffraction device
#70Method and system of evaluating distribution of lattice strain on crystal material
#71Precession diffraction charged particle beam system
#72Method of electron diffraction tomography
#73Dynamic focus adjustment with optical height detection apparatus in electron beam system
#74Methods and devices for high throughput crystal structure analysis by electron diffraction
#75REPRODUCIBLE LATTICE STRAIN MEASUREMENT METHOD
#76Method and device for measuring electron diffraction of a sample
#77Device and method for characterizing surfaces
#78Database supported nanocrystal structure identification by lattice-fringe fingerprinting with structure factor extraction
#79Method, computer program and apparatus for the characterization of molecules
#80Testing method for semiconductor device, testing apparatus therefor, and semiconductor device suitable for the test
#81Method for measuring diffraction patterns from a transmission electron microscopy to determine crystal structures and a device therefor
#82Method and apparatus for measuring the physical properties of micro region
#83Transmission electron microscope sample alignment system and method
#84Sample structure analyzing method, transmission electron microscope, and computer-readable non-transitory recording medium