G01N23/20083 - CPC Classification Index

ClassID:

168305 ⎘

G01N23/20083 - CPC Classification

Classification description:

Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups – , or by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement

Recent Application in this class:

20250258116

2025-08-14

Method and System for Detecting a Material

20250244262

2025-07-31

IN-SITU ANALYSIS OF DRILLING FLUID SOLIDS DURING WELLBORE DRILLING

20250180494

2025-06-05

Combined Scatter and Transmission Multi-View Imaging System

20250003895

2025-01-02

IMAGE PROCESSING APPARATUS, RADIATION IMAGING SYSTEM, IMAGE PROCESSING METHOD, AND STORAGE MEDIUM

20240418658

2024-12-19

X-ray system

20240044813

2024-02-08

Screening system

20240044812

2024-02-08

Rotational X-ray inspection system and method

20230343619

2023-10-26

Parameterizing x-ray scattering measurement using slice-and-image tomographic imaging of semiconductor structures

20230184700

2023-06-15

Handheld inspection device and method of inspecting an infrastructure having a structure wall supported into material

#10

20230003675

2023-01-05

Method and system for determining sample composition from spectral data

#11

20220381710

2022-12-01

Sample inspection system comprising a beam former to project a polygonal shell beam

#12

20220357289

2022-11-10

BACKSCATTER IMAGING SYSTEM

#13

20220334069

2022-10-20

Combined scatter and transmission multi-view imaging system

#14

20220221412

2022-07-14

Method for improving an EBSD/TKD map

#15

20220074876

2022-03-10

System and method for identifying nuclear threats

#16

20210407864

2021-12-30

Process monitoring of deep structures with X-ray scatterometry

#17

20210302335

2021-09-30

Combined scanning x-ray generator, composite inspection apparatus, and inspection method for hybrid

#18

20210239628

2021-08-05

Backscatter X-ray system

#19

20210026266

2021-01-28

Toner

#20

20200400594

2020-12-24

Method and system for determining molecular structure

#21

20200378907

2020-12-03

Stationary tomographic X-ray imaging systems for automatically sorting objects based on generated tomographic images

#22

20200378906

2020-12-03

Stationary Tomographic X-Ray Imaging Systems for Identifying Threats Based on Generated Tomographic Images

#23

20200355632

2020-11-12

Multi-view imaging system

#24

20200303265

2020-09-24

Process monitoring of deep structures with X-ray scatterometry

#25

20200182806

2020-06-11

X-ray imaging system and method of x-ray imaging

#26

20200103357

2020-04-02

Data Collection, Processing and Storage Systems for X-Ray Tomographic Images

#27

20190383764

2019-12-19

Graphene-based electro-microfluidic devices and methods for protein structural analysis

#28

20190265383

2019-08-29

GENERATION OF DIFFRACTION SIGNATURE OF ITEM WITHIN OBJECT

#29

20190145914

2019-05-16

X-ray inspection device

#30

20190079031

2019-03-14

X-ray inspection system for pipes

#31

20190011381

2019-01-10

Methods for aligning a spectrometer

#32

20180350699

2018-12-06

Process monitoring of deep structures with X-ray scatterometry

#33

20180313770

2018-11-01

Combined scatter and transmission multi-view imaging system

#34

20180231478

2018-08-16

Detection of crystallographic properties in aerospace components

#35

20180113084

2018-04-26

Calibration of a small angle X-ray scatterometry based metrology system

#36

20170176353

2017-06-22

Multi-modality detection system and method

#37

20170176352

2017-06-22

Detection system and method

#38

20170176351

2017-06-22

Method and system for liquid detection

#39

20170153189

2017-06-01

Method and system for analyzing an object by diffractometry using a scattering spectrum and a transmission spectrum

#40

20170131224

2017-05-11

Method of analyzing an object in two stages using a transmission spectrum then a scattering spectrum

#41

20160329119

2016-11-10

X-ray laser microscopy system and method

#42

20160258890

2016-09-08

Quantitative X-ray analysis—matrix thickness correction

#43

20160170075

2016-06-16

Generation of diffraction signature of item within object

#44

20160113611

2016-04-28

Quantitative X-ray radiology using the absorption and scattering information

#45

20160055390

2016-02-25

X-ray diffraction imaging system with signal aggregation across voxels containing objects and method of operating the same

#46

20160041297

2016-02-11

Material discrimination using scattering and stopping of muons and electrons

#47

20160025890

2016-01-28

Combined scatter and transmission multi-view imaging system

#48

20160025888

2016-01-28

Inspection systems with two X-ray scanners in a first stage inspection system

#49

20160005566

2016-01-07

Method and system for electron microscope with multiple cathodes

#50

20150362443

2015-12-17

X-ray diffraction imaging system using debye ring envelopes

#51

20150355117

2015-12-10

Data collection, processing and storage systems for X-ray tomographic images

#52

20150219775

2015-08-06

Adaptive scanning in an imaging system

#53

20150124927

2015-05-07

Dark field computed tomography imaging

#54

20150103970

2015-04-16

Systems and methods for generating x-ray phase contrast images using a conventional x-ray imaging system

#55

20150078519

2015-03-19

High energy X-ray inspection system using a fan-shaped beam and collimated backscatter detectors

#56

20140341341

2014-11-20

High-energy X-ray-spectroscopy-based inspection system and methods to determine the atomic number of materials

#57

20140044238

2014-02-13

Multiple image collection and synthesis for personnel screening

#58

20130208859

2013-08-15

Sample analysis

#59

20130003929

2013-01-03

Adaptive scanning in an imaging system

#60

20120230463

2012-09-13

Data collection, processing and storage systems for X-ray tomographic images

#61

20120183125

2012-07-19

Methods and systems for determining the average atomic number and mass of materials

#62

20120133516

2012-05-31

Method and system for deriving molecular interference functions from XRD profiles

#63

20120069964

2012-03-22

System and method for x-ray inspection

#64

20110305318

2011-12-15

Apparatus and method for characterisation of materials

#65

20110261929

2011-10-27

Adaptive scanning in an imaging system

#66

20110249798

2011-10-13

Scatter attenuation tomography using a monochromatic radiation source

#67

20110235777

2011-09-29

High-energy X-ray-spectroscopy-based inspection system and methods to determine the atomic number of materials

#68

20110228896

2011-09-22

Methods and systems for rapid detection of concealed objects

#69

20110164726

2011-07-07

Multiple image collection and synthesis for personnel screening

#70

20110135060

2011-06-09

High energy X-ray inspection system using a fan-shaped beam and collimated backscatter detectors

#71

20110017917

2011-01-27

Multiple Image Collection and Synthesis for Personnel Screening

#72

20100316191

2010-12-16

Estimating strengths of wooden supports by detecting backscattered gamma rays

#73

20100303201

2010-12-02

Method and device for the online determination of the ash content of a substance conveyed on a conveyor, and device for carrying out such an online determination

#74