FATTY ACID COMPOSITION

DETERMINATION OF PHYSICAL PROPERTIES OF CRYSTALS BY FOCUSED SCANNING ELECRON MICROSCOPE

Soft X-Ray Tools for Semiconductor Metrology Applications

SYSTEM AND METHOD FOR MEASURING A SAMPLE BY X-RAY REFLECTANCE SCATTEROMETRY

Tool for Analysing the Chemical Composition and Structure of Nanolayers

High Brightness X-Ray Source For Semiconductor Metrology

DIFFRACTION-BASED GLOBAL IN VITRO DIAGNOSTIC SYSTEM

DEVICE AND METHOD FOR HIGH-THROUGHPUT CHARACTERIZATION OF FLUIDS

METHOD, X-RAY DIFFRACTION SYSTEM, AND PROGRAM FOR CALCULATING MISCUT ANGLE OF SINGLE-CRYSTAL SOLID SAMPLE

Method for Capture of Small-Angle Scatter Over Wide Fields of View

EVALUATION METHOD, EVALUATION APPARATUS, AND STORAGE MEDIUM

DETERMINING TILT ANGLE OF SUBSTRATE STRUCTURES UTILIZING ANGULAR FOURIER DECOMPOSITION OF SCATTERING IMAGES

Forward Library Based Seeding For Efficient X-Ray Scatterometry Measurements

HYBRID X-RAY AND OPTICAL METROLOGY AND NAVIGATION

Small-Angle X-Ray Scatterometry

SYSTEM AND METHOD FOR MEASURING A SAMPLE BY X-RAY REFLECTANCE SCATTEROMETRY

ANALYSIS APPARATUS, ANALYSIS METHOD, AND ANALYSIS PROGRAM

Soft X-Ray Optics With Improved Filtering

DEVICE FOR ANALYSING SURFACES USING FAST ATOM DIFFRACTION IN A HIGH-PRESSURE ENVIRONMENT

POLYURETHANE-CONTAINING NON-FOAMED MOLDED BODY

X-RAY SCATTERING APPARATUS AND X-RAY SCATTERING METHOD

MEASUREMENT DEVICE, MEASUREMENT SYSTEM, AND MEASUREMENT METHOD

METHOD FOR DETERMINING PARAMETERS OF THREE DIMENSIONAL NANOSTRUCTURE AND APPARATUS APPLYING THE SAME

X-RAY PHASE IMAGING APPARATUS AND DISPLAY METHOD OF PREVIEW IMAGE IN X-RAY PHASE IMAGING APPARATUS

Small-angle X-ray scatterometry

X-ray based measurements in patterned structure

ENCODING AN ASSEMBLY OF THREE-DIMENSIONAL HIERARCHICALLY ORGANIZED NANOPARTICLE ARCHITECTURES THROUGH CHROMATIC BONDS

Transmissive small-angle scattering device

Transmissive small-angle scattering device

INSPECTION DEVICE AND INSPECTION METHOD

EVALUATION METHOD

TRANSMISSION X-RAY DIFFRACTION APPARATUS AND RELATED METHOD

QUANTUM DOT MATERIAL AND METHOD FOR PRODUCING QUANTUM DOT MATERIAL

Semiconductor Measurements With Robust In-Line Tool Matching

Characterization method of closed pores and connectivity of coal measure composite reservoirs

METROLOGY METHOD

Single piece droplet generation and injection device for serial crystallography

X-ray analysis system and method with multi-source design

Diffraction-based global in vitro diagnostic system

INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, NONTRANSITORY COMPUTER READABLE MEDIA STORING PROGRAM, AND X-RAY ANALYSIS APPARATUS

Small angle x-ray scattering methods for characterizing the iron core of iron carbohydrate colloid drug products

Semiconductor Profile Measurement Based On A Scanning Conditional Model

Spot-size control in reflection-based and scatterometry-based X-ray metrology systems

MEASUREMENT DEVICE AND MEASUREMENT METHOD

X-ray scattering apparatus

X-ray examination device

X-ray scattering apparatus

Detection scheme for x-ray small angle scattering

Methods and systems for compact, small spot size soft x-ray scatterometry

Particle beam experiment data analysis device

Transmissive small-angle scattering device

State change tracking device, X-ray imaging system, state change tracking method of inspection target, and life estimating method of inspection target

Detecting downhole fluid composition utilizing photon emission

X-ray based measurements in patterned structure

Small-angle x-ray scatterometry

Diffraction-based global in vitro diagnostic system

Diffractometer-based global in situ diagnostic system for animals

Soft x-ray optics with improved filtering

Method for correcting a spectral image

Method and apparatus for x-ray scattering material analysis

Transmission X-ray critical dimension (T-XCD) characterization of shift and tilt of stacks of high-aspect-ratio (HAR) structures

Soft x-ray optics with improved filtering

Small-angle x-ray scatterometry

Measurement and control of wafer tilt for x-ray based metrology

Semiconductor metrology and inspection based on an x-ray source with an electron emitter array

Electron microscope and sample observation method using the same

Scattering measurement analysis method, scattering measurement analysis device, and non-transitory computer-readable storage medium storing scattering measurement analysis program

System and method for measuring a sample by x-ray reflectance scatterometry

Systems and methods for coherent scatter imaging using a segmented photon-counting detector for computed tomography

X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrate

Detection scheme for x-ray small angle scattering

Non-invasive and remote method to screen cancer

System and method to adjust a kinetics model of surface reactions during plasma processing

Optical metrology in machine learning to characterize features

Substance identification device and method for extracting statistical feature based on cluster analysis

Device for adjusting and exchanging beamstops

X-ray scattering method and system for non-destructively inspecting bond line and porosity

Single piece droplet generation and injection device for serial crystallography

Analysis method for fine structure, apparatus, and program

Analysis method for fine structure, and apparatus and program thereof

Sample cell arrays and hardware for high-throughput cryoSAXS

Fluidic carbon nanotube device

Methods and apparatus for metrology

Adjustable multifacet x-ray sensor array

X-ray analysis assistance device and x-ray analysis device

Loosely-coupled inspection and metrology system for high-volume production process monitoring

Transparent conductive film

Dual scan method for detecting a fibre misalignment in an elongated structure

Method for measuring viscosity of protein solution

Methods and systems for measuring periodic structures using multi-angle x-ray reflectance scatterometry (XRS)

Metrology method

Method and metrology apparatus for determining estimated scattered radiation intensity

Determining tilt angle in patterned arrays of high aspect-ratio structures by small-angle x-ray scattering

Test key design to enable X-ray scatterometry measurement

Graphene-based electro-microfluidic devices and methods for protein structural analysis

In vitro method for detecting active mycobacterium tuberculosis using hair small angle x-ray scattering profile

Method and apparatus for X-ray scatterometry

Dark field tensor tomography method, specimen holder and device

Wafer alignment for small-angle x-ray scatterometry

X-ray source optics for small-angle X-ray scatterometry

X-ray detection optics for small-angle X-ray scatterometry

Apparatus and method for X-ray analysis with hybrid control of beam divergence

X-ray analysis apparatus and method

X-ray analysis apparatus

X-ray tensor tomography system

Methods and systems for real time measurement control

X-ray generator and x-ray analysis device

Hybrid inspection system

X-ray metrology system with broadband laser produced plasma illuminator

X-ray scattering apparatus

Liquid metal rotating anode X-ray source for semiconductor metrology

Quantum dot material and method for producing quantum dot material

Temperature determination using radiation diffraction

Methods and systems for measuring periodic structures using multi-angle X-ray reflectance scatterometry (XRS)

X-ray imaging apparatus

Bright and clean x-ray source for x-ray based metrology

On-device metrology using target decomposition

X-ray based measurements in patterned structure

Methods and systems for semiconductor metrology based on polychromatic soft X-Ray diffraction

Methods for detecting a fibre misalignment in an elongated structure, related apparatuses

X-ray diffraction analysis method and X-ray diffraction analysis apparatus

Methods and systems for characterization of an x-ray beam with high spatial resolution

Rubber composition for tires, method for preparing rubber composition for tires, and tire

Omnidirectional scattering- and bidirectional phase-sensitivity with single shot grating interferometry

Detection of crystallographic properties in aerospace components

X-ray zoom lens for small angle x-ray scatterometry

In-situ x-ray scatter imaging of battery electrodes

Transparent conductive film

Calibration of a small angle X-ray scatterometry based metrology system

Hybrid metrology for patterned wafer characterization

Closed-loop control of X-ray knife edge

X-ray diffraction apparatus

Sample holder for X-ray analysis

FATTY ACID COMPOSITION

GOLD NANOPARTICLES AND METHODS OF MAKING AND USING GOLD NANOPARTICLES

POLYPROPYLENE FILM

X-ray diffractometer

METHOD FOR MEASURING VISCOSITY OF PROTEIN SOLUTION

Method of generating a fingerprint for a gemstone using x-ray imaging

Beam shaping slit for small spot size transmission small angle X-ray scatterometry

Method and apparatus for X-ray scatterometry

Methods and systems for measuring periodic structures using multi-angle X-ray reflectance scatterometry (XRS)

X-ray scatterometry metrology for high aspect ratio structures

Method and system for analyzing an object by diffractometry using a scattering spectrum and a transmission spectrum

Method of analyzing an object in two stages using a transmission spectrum then a scattering spectrum

Methods and apparatus for simulating interaction of radiation with structures, metrology methods and apparatus, device manufacturing method

X-ray small angle optical system

Beam generation unit and X-ray small-angle scattering apparatus

Method for evaluating crosslink concentration in crosslinked rubber

X-ray techniques using structured illumination

Apparatus and method for aligning two plates during transmission small angle X-ray scattering measurements

X-ray surface analysis and measurement apparatus

Multi-function x-ray metrology tool for production inspection/monitoring of thin films and multidimensional structures

Detection of an object within a volume of interest

X-ray scatterometry apparatus

Gold nanoparticles and methods of making and using gold nanoparticles

Nanoconfinement platform for nanostructure quantification via grazing-transmission X-ray scattering

DETERMINING A MATERIAL PROPERTY BASED ON SCATTERED RADIATION

NEGATIVE ELECTRODE MATERIAL FOR LITHIUM ION SECONDARY BATTERIES, AND METHOD FOR EVALUATING SAME

Scatterometry-based imaging and critical dimension metrology

Compact X-Ray Source for CD-SAXS

X-ray method for the measurement, characterization, and analysis of periodic structures

Radiation imaging device capable of matter-element information acquisition and image based selection

High performance Kratky assembly

X-ray imaging system and image processing method

Apparatus and methods for low temperature small angle X-ray scattering

Methods and systems for measuring periodic structures using multi-angle X-ray reflectance scatterometry (XRS)

X-ray apparatus

Metrology device and metrology method thereof

Dark field computed tomography imaging

Methods and apparatus for measuring semiconductor device overlay using X-ray metrology

Small-angle scattering X-ray metrology systems and methods

Angle-dependent X-ray diffraction imaging system and method of operating the same

Metrology tool with combined XRF and SAXS capabilities

Apparatus for amplifying intensity during transmission small angle—X-ray scattering measurements

Method of evaluating neutron scattering length density

Electrochemical Test Cell For Enabling In-Situ X-Ray Diffraction and Scattering Studies of Scale Formation and Microstructural Changes in Materials with Flow Through Solution

X-ray analyzing system for x-ray scattering analysis

One-dimensional x-ray detector with curved readout strips

Apparatus for coded aperture X-ray scatter imaging and method therefor

Compton coincident volumetric imaging

Method for evaluating modulus of repulsion elasticity, hardness and energy loss of polymer material

Method and apparatus for surface mapping using in-plane grazing incidence diffraction

Scanning systems

Method and apparatus for analysis of samples

Method for evaluating energy loss, chipping resistance and abrasion resistance of polymeric material

MEASURING APPARATUS, DETECTOR DEVIATION MONITORING METHOD AND MEASURING METHOD

Downhole x-ray source fluid identification system and method

Multiple image collection and synthesis for personnel screening

X-ray beam system offering 1D and 2D beams

Dual mode small angle scattering camera

X-ray analysis apparatus with single crystal X-ray aperture and method for manufacturing a single crystal X-ray aperture

Metrology tool with combined X-ray and optical scatterometers

Robust statistical reconstruction for charged particle tomography

Sample analysis

Determining a material property based on scattered radiation

Convertible scan panel for x-ray inspection

DEVICE ANALYSIS

Sealed Detector Array for the Collection of Both Wide Angle and Small Angle X-Ray Scattering

System for analyzing a granulate for producing a pharmaceutical product

Compact X-ray analysis system

X-ray scattering measurement device and X-ray scattering measurement method

Method and apparatus of precisely measuring intensity profile of X-ray nanobeam

PATTERN MEASURING METHOD AND PATTERN MEASURING APPARATUS

DEVICE AND METHOD FOR ANALYZING NANOPARTICLES BY COMBINATION OF FIELD-FLOW FRACTIONATION AND X-RAY SMALL ANGLE SCATTERING

Scanning systems

Two dimensional small angle X-Ray scattering camera

Downhole X-ray source fluid identification system and method

Device and method for characterizing surfaces

Vertical/horizontal small angle X-ray scattering apparatus and method for measuring small angle X-ray scattering

FAN-BEAM COHERENT-SCATTER COMPUTER TOMOGRAPH

Automated selection of X-ray reflectometry measurement locations

Collimator fabrication

CD-GISAXS system and method

Tool associated with compton scattered X-ray visualization, imaging, or information provider

Compton scattered X-ray visualization, imaging, or information provider with scattering event locating

Scintillator aspects of compton scattered X-ray visualization, imaging, or information providing

X-ray diffraction equipment for X-ray scattering

Two-dimensional small angle x-ray scattering camera

Ultra-small angle x-ray scattering measuring apparatus

Method and apparatus for void content measurement and method and apparatus for particle content measurement

Target alignment for X-ray scattering measurements

Automated selection of X-ray reflectometry measurement locations

Systems and methods for determining a packing fraction of a substance

Collimator fabrication

Method for operating a primary beam stop

Two-dimensional small angle x-ray scattering camera

X-ray apparatus with dual monochromators

Calibration of X-ray reflectometry system

Collimator fabrication

Method and apparatus for X-ray reflectance measurement

Method and apparatus for void content measurement and method and apparatus for particle content measurement

Method for analyzing film structure and apparatus therefor

X-ray scattering with a polychromatic source

Collimator fabrication

High brightness liquid droplet X-ray source for semiconductor metrology

Method and device for producing and using localized periodic intensity-modulated patterns with x-radiation and other wavelengths