168311 ⎘
Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups – , or by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras
Sub-classes:Tool for Analysing the Chemical Composition and Structure of Nanolayers
#2X-Ray Scatterometry Based Measurements Of Memory Array Structures Stacked With Complex Logic Structures
#3Screening system
#4MEASUREMENT SYSTEM AND MEASUREMENT METHOD
#5SPIN-RESOLVED ULTRAFAST ELECTRON DIFFRACTION
#6Method for measuring residual stress
#7TRANSMISSION X-RAY DIFFRACTION APPARATUS AND RELATED METHOD
#8Sample inspection apparatus employing a diffraction detector
#9Device for hosting a probe solution of molecules in a plurality of independent cells
#10Sample inspection system comprising a beam former to project a polygonal shell beam
#11Controlling process parameters by means of radiographic online determination of material properties when producing metallic strips and sheets
#12Full beam metrology for x-ray scatterometry systems
#13Mass spectrometer
#14Method for improving an EBSD/TKD map
#15Quantum-limited extreme ultraviolet coherent diffraction imaging
#16Sample holder for single-crystal X-ray structure analysis apparatus, sample holder unit, and soaking method therefor
#17Sample holder unit for single-crystal X-ray structure analysis apparatus
#18X-ray mirror optics with multiple hyperboloidal/hyperbolic surface profiles
#19Sample inspection apparatus employing a diffraction detector
#20Methods and systems for semiconductor metrology based on wavelength resolved soft X-ray reflectometry
#21Method and system for determining molecular structure
#22Estimating wear for BHA components using borehole hardness
#23Full beam metrology for x-ray scatterometry systems
#24Method of detecting an anomaly in a single crystal structure
#25X-ray analysis assistance device and x-ray analysis device
#26Residual stress detection device and detection method thereof
#27Method of acquiring sample for evaluation of SiC single crystal
#28Method for identifying molecular structure
#29Apparatus and method for inducing high-speed variable-tilt wobble motions
#30Sample inspection apparatus employing a diffraction detector
#31Photoelectric detector, manufacturing method thereof, and detection device
#32Graphene-based electro-microfluidic devices and methods for protein structural analysis
#33Image contrast in X-ray topography imaging for defect inspection
#34Methods for detecting a fibre misalignment in an elongated structure, related apparatuses
#35Methods and systems for characterization of an x-ray beam with high spatial resolution
#36Aperture scanning Fourier ptychographic imaging
#37Ptychography system
#38Detection of crystallographic properties in aerospace components
#39Full beam metrology for X-ray scatterometry systems
#40Processing method, processing apparatus and processing program configured to determine conditions of pole figure measurement by X-ray diffraction
#41Method of generating a fingerprint for a gemstone using x-ray imaging
#42Method of analyzing diffraction data obtained from a single crystal of a porous compound and a compound for which a structure is to be determined
#43X-ray diffractometer with multilayer reflection-type monochromator
#44X-ray stress analysis apparatus, method, and program
#45Aperture scanning fourier ptychographic imaging
#46Curved grating structure manufacturing method, curved grating structure, grating unit, and x-ray imaging device
#47Empirical beam hardening correction for differential phase contrast CT
#48X-ray surface analysis and measurement apparatus
#49Aperture scanning fourier ptychographic imaging
#50Diffraction imaging
#51X-RAY diffraction apparatus, X-RAY diffraction measuring method, and control program
#52X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus
#53X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus
#54Calibration of a probe in ptychography
#55Apparatus and methods for controlling electron microscope stages
#56Method and apparatus for providing image data
#57X-ray analysis apparatus
#58X-ray crystal orientation measuring method and X-ray crystal orientation measuring apparatus