ClassID:

168315

G01N23/2073 - CPC Classification

Classification description:

Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups – , or by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials; Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions using neutron detectors

Recent Application in this class: