G01Q60/14 - CPC Classification Index

ClassID:

171168 ⎘

G01Q60/14 - CPC Classification

Classification description:

Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof; STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes STP [Scanning Tunnelling Potentiometry]

Recent Application in this class:

20210302466

2021-09-30

FREQUENCY COMB FEEDBACK CONTROL FOR SCANNING PROBE MICROSCOPY

20210072282

2021-03-11

Scanning tunneling thermometer

20210066183

2021-03-04

Integrated circuit with optical tunnel

20190285664

2019-09-19

Scanning tunneling thermometer

20180364278

2018-12-20

Frequency comb feedback control for scanning probe microscopy

20150309072

2015-10-29

Computer-aided simulation method for atomic-resolution scanning seebeck microscope (SSM) images

20150247809

2015-09-03

Scanning frequency comb microscopy (SFCM) for carrier profiling in semiconductors

20140366229

2014-12-11

Computer-aided simulation method for atomic-resolution scanning seebeck microscope (SSM) images

20140345007

2014-11-20

Measurement of depth and energy of buried trap states in dielectric films by single electron tunneling force spectroscopy

#10

20100058846

2010-03-11

Signal coupling system for scanning microwave microscope

#11

20050241175

2005-11-03

Method and apparatus for removing and/or preventing surface contamination of a probe