171169 ⎘
Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof; STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes Probes, their manufacture, or their related instrumentation, e.g. holders
SCANNING PROBE SYSTEMS AND FEEDBACK CONTROL METHODS BASED ON DERIVATIVE TUNNELING SIGNAL REGULATION
#2PROBES, APPARATUSES AND METHODS FOR USE IN SCANNING PROBE MICROSCOPY
#3RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MICROSCOPY/LITHOGRAPHY TIPS
#4MEMS Nanopositioner and Method of Fabrication
#5DEVICE FOR MEASURING AND/OR MODIFYING A SURFACE
#6SYSTEMS AND METHODS FOR AUTOMATED TIP CONDITIONING FOR SCANNING TUNNELING SPECTROSCOPY
#7DAMPING BASE FOR MODULAR SCANNING PROBE MICROSCOPE HEAD
#8MEMS nanopositioner and method of fabrication
#9Scanning Probe and Electron Microscope Probes and Their Manufacture
#10Quantum dot microscope apparatus comprising a nanoscale semiconductor on the tip of a fiber, a tunneling electrical lead and a capacitive electrical lead on the fiber
#11FREQUENCY COMB FEEDBACK CONTROL FOR SCANNING PROBE MICROSCOPY
#12Rugged, single crystal wide-band-gap-material scanning-tunneling-microscopy/lithography tips
#13Nano-indent process for creating single photon emitters in a two-dimensional materials platform
#14Sharpening method for probe tip of atomic force microscope (AFM)
#15Active noise isolation for tunneling applications (ANITA)
#16Method and device for superimposing at least two images of a photolithographic mask
#17Handling device for handling a measuring probe
#18Device integrated with scanning probe for optical nanofocusing and near-field optical imaging
#19Scanning probe and electron microscope probes and their manufacture
#20Miniature device for ultra high sensitivity and stability probing in vacuum
#21Scanning probe inspector
#22Rugged, single crystal wide-band-gap-material scanning-tunneling-microscopy/lithography tips
#23Tunnel current control apparatus and tunnel current control method
#24Tunnel current control apparatus and tunnel current control method
#25High magnetic field scanning probe microscope employing liquid helium-free room-temperature bore superconducting magnet
#26NANOTUBE BASED TRANSISTOR STRUCTURE, METHOD OF FABRICATION AND USES THEREOF
#27Frequency comb feedback control for scanning probe microscopy
#28Scanning probe and electron microscope probes and their manufacture
#29Method and Apparatus for carrier profiling of semiconductors utilizing simultaneous techniques utilizing a simulator and a Field-Programmable Gate Array
#30Scanning probe and electron microscope probes and their manufacture
#31Iridium tip, gas field ion source, focused ion beam apparatus, electron source, electron microscope, electron beam applied analysis apparatus, ion-electron multi-beam apparatus, scanning probe microscope, and mask repair apparatus
#32Nanoantenna scanning probe tip, and fabrication methods
#33Variable Temperature Scanning Tunneling Microscope
#34Cantilever attachment fitting and scanning probe microscope provided therewith
#35Microscope having a multimode local probe, tip-enhanced raman microscope, and method for controlling the distance between the local probe and the sample
#36Method and means for coupling high-frequency energy to and/or from the nanoscale junction of an electrically-conductive tip with a semiconductor
#37Radio-frequency reflectometry scanning tunneling microscope
#38Simultaneous topographic and elemental chemical and magnetic contrast in scanning tunneling microscopy
#39Scanning tunneling microscope assembly, reactor, and system
#40Method for measuring the force interaction that is caused by a sample
#41High-speed scanning probe microscope
#42Method of aligning a first article relative to a second article
#43Device for Positioning a Moveable Object of Submicron Scale
#44Method for analyzing nucleobases on a single molecular basis
#45Ionization method and apparatus using electrospray
#46Atomically sharp iridium tip
#47Electronic device containing carbon nanotubes
#48Scanning probe microscopy inspection and modification system
#49Scanning microscopy using resonant quantum tunneling
#50Scanning probe microscopy inspection and modification system
#51Spin-polarized electron source and spin-polarized scanning tunneling microscope
#52Microcoaxial probes made from strained semiconductor bilayers
#53Apparatus for detecting magnetic signals and signals of electric tunneling
#54Apparatus for aligning a first article relative to a second article
#55Electronic device containing a carbon nanotube
#56Coherent electron junction scanning probe interference microscope, nanomanipulator and spectrometer with assembler and DNA sequencing applications
#57Probe module with integrated actuator for a probe microscope
#58Integrated electron beam tip and sample heating device for a scanning tunneling microscope
#59Scanning probe microscopy inspection and modification system
#60Method of preparing silver nano-structure by means of scanning turnneling microscopy
#61Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements
#62Probe for a scanning microscope
#63Synthesis of nanocodes, and imaging using scanning probe microscopy
#64Electronic device containing a carbon nanotube
#65Method and apparatus for removing and/or preventing surface contamination of a probe
#66Scanning probe microscopy inspection and modification system
#67Surface plasmon scanning-tunneling chemical mapping (SPSTM) system
#68Radio-frequency reflectometry scanning tunneling microscope