Patents-Review.com
ClassID:

171170 ⎘

G01Q60/18 - CPC Classification

Classification description:

Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes

Sub-classes:
Recent Application in this class:
#1
20250172585
2025-05-29

SCANNING PROBE MICROSCOPE AND METHOD OF ALIGNMENT, FOCUSING, AND MEASUREMENT

 #2
20250067770
2025-02-27

METHOD AND APPARATUS FOR SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY (S-SNOM)

 #3
20220390485
2022-12-08

System and method for a non-tapping mode scattering-type scanning near-field optical microscopy

 #4
20210382086
2021-12-09

Quantum-dot-based measuring system and method

 #5
20210041477
2021-02-11

System and method for a non-tapping mode scattering-type scanning near-field optical microscopy

 #6
20190383854
2019-12-19

Calibrating tip-enhanced Raman microscopes

 #7
20190346480
2019-11-14

Near field scanning probe microscope, probe for scanning probe microscope, and sample observation method

 #8
20180372776
2018-12-27

Near field scanning probe microscope, probe for scanning probe microscope, and sample observation method

 #9
20180259553
2018-09-13

Method and apparatus for infrared scanning near-field optical microscopy based on photothermal effect

 #10
20180259552
2018-09-13

Scanning probe microscope

 #11
20180203039
2018-07-19

Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy

 #12
20180059137
2018-03-01

Method and apparatus for chemical and optical imaging with a broadband source

 #13
20180059136
2018-03-01

Chemical nano-identification of a sample using normalized near-field spectroscopy

 #14
20170343580
2017-11-30

Scanning probe microscope and its sample holder

 #15
20170219622
2017-08-03

Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy

 #16
20170108532
2017-04-20

Image processing method of two-photon structured illumination point scanning microscopy

 #17
20170082685
2017-03-23

Probe-based data collection system with adaptive mode of probing controlled by local sample properties

 #18
20170003316
2017-01-05

Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy

 #19
20160356809
2016-12-08

Chemical nano-identification of a sample using normalized near-field spectroscopy

 #20
20160146731
2016-05-26

Method and apparatus for manipulating near field using light scattering

 #21
20160018437
2016-01-21

Chemical nano-identification of a sample using normalized near-field spectroscopy

 #22
20160003868
2016-01-07

Method and apparatus for infrared scattering scanning near-field optical microscopy

 #23
20150338439
2015-11-26

Systems and methods for non-destructive surface chemical analysis of samples

 #24
20150177276
2015-06-25

Scanning Probe Miscroscope

 #25
20150169997
2015-06-18

Apparatus and method for correlating images of a photolithographic mask

 #26
20150168702
2015-06-18

Structured illumination microscopy apparatus and method

 #27
20150089694
2015-03-26

Method for measuring the near-field signal

 #28
20140184776
2014-07-03

MICRO OR NANO SCOPE

 #29
20140165237
2014-06-12

Scanning probe microscope and measurement method using same

 #30
20130145507
2013-06-06

Scanning probe microscope and sample observing method using the same

 #31
20120096601
2012-04-19

Method and system for near-field optical imaging

 #32
20100064396
2010-03-11

Scanning probe microscope and sample observing method using the same

 #33
20080284446
2008-11-20

Determination of field distribution

 #34
20060027543
2006-02-09

Precision machining method using a near-field scanning optical microscope