171174 ⎘
Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof; AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes Friction force microscopy
FRICTION REGULATION METHOD, APPARATUS AND SYSTEM FOR MOLYBDENUM DISULFIDE
#2In situ mechanical characterization of a single cell-cell adhesion interface under large strain
#3Methods for designing and processing a microcantilever-based probe with an irregular cross section applied in an ultra-low friction coefficient measurement at a nanoscale single-point contact
#4Method of controlling a probe using constant command signals
#5Systems and methods for nano-tribological manufacturing of nanostructures
#6In situ tribometer and methods of use
#7Friction coefficient measuring method of surface of specimen
#8Method and apparatus for inspecting process solution, and sample preparation apparatus in inspection
#9Microscope having a multimode local probe, tip-enhanced raman microscope, and method for controlling the distance between the local probe and the sample
#10Targeted sequencing of biomolecules by pulling through a liquid-liquid interface with an atomic force microscope
#11Processes for surface measurement and modification by scanning probe microscopy functioning in continuous curvilinear mode, scanning probe microscope and device permitting their implementation of said methods
#12Friction force microscope
#13Apparatus and method for investigating surface properties of different materials
#14Apparatus and method using a disk drive slider and/or a peltier plate in an atomic force microscope
#15Measuring probe, sample surface measuring apparatus and sample surface measuring method
#16Method and device for determining material properties
#17Method and apparatus for measuring electrical properties in torsional resonance mode
#18Method and apparatus of driving torsional resonance mode of a probe-based instrument
#19Atomic force microscope and method of energy dissipation imaging using the same
#20Method for determining tribological properties of a sample surface using a scanning microscope (sem) and associated scanning microscope
#21Lateral calibration device and method
#22Method and apparatus for measuring electrical properties in torsional resonance mode
#23Method and apparatus of driving torsional resonance mode of a probe-based instrument