ClassID:

171174

G01Q60/26 - CPC Classification

Classification description:

Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof; AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes Friction force microscopy

Recent Application in this class:
#1
20240410916
2024-12-12

FRICTION REGULATION METHOD, APPARATUS AND SYSTEM FOR MOLYBDENUM DISULFIDE

#2
20220082483
2022-03-17

In situ mechanical characterization of a single cell-cell adhesion interface under large strain

#3
20190204353
2019-07-04

Methods for designing and processing a microcantilever-based probe with an irregular cross section applied in an ultra-low friction coefficient measurement at a nanoscale single-point contact

#4
20190094267
2019-03-28

Method of controlling a probe using constant command signals

#5
20180210007
2018-07-26

Systems and methods for nano-tribological manufacturing of nanostructures

#6
20170254740
2017-09-07

In situ tribometer and methods of use

#7
20160161396
2016-06-09

Friction coefficient measuring method of surface of specimen

#8
20160061695
2016-03-03

Method and apparatus for inspecting process solution, and sample preparation apparatus in inspection

#9
20160003866
2016-01-07

Microscope having a multimode local probe, tip-enhanced raman microscope, and method for controlling the distance between the local probe and the sample

#10
20140352006
2014-11-27

Targeted sequencing of biomolecules by pulling through a liquid-liquid interface with an atomic force microscope

#11
20130047302
2013-02-21

Processes for surface measurement and modification by scanning probe microscopy functioning in continuous curvilinear mode, scanning probe microscope and device permitting their implementation of said methods

#12
20120227139
2012-09-06

Friction force microscope

#13
20110047662
2011-02-24

Apparatus and method for investigating surface properties of different materials

#14
20090151434
2009-06-18

Apparatus and method using a disk drive slider and/or a peltier plate in an atomic force microscope

#15
20090027690
2009-01-29

Measuring probe, sample surface measuring apparatus and sample surface measuring method

#16
20080134771
2008-06-12

Method and device for determining material properties

#17
20070163335
2007-07-19

Method and apparatus for measuring electrical properties in torsional resonance mode

#18
20070119241
2007-05-31

Method and apparatus of driving torsional resonance mode of a probe-based instrument

#19
20060213260
2006-09-28

Atomic force microscope and method of energy dissipation imaging using the same

#20
20060150719
2006-07-13

Method for determining tribological properties of a sample surface using a scanning microscope (sem) and associated scanning microscope

#21
20060101895
2006-05-18

Lateral calibration device and method

#22
20050212529
2005-09-29

Method and apparatus for measuring electrical properties in torsional resonance mode

#23
20050028583
2005-02-10

Method and apparatus of driving torsional resonance mode of a probe-based instrument