171175 ⎘
Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof; AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes Adhesion force microscopy
Method for characterizing interaction force between lignin and cellulase
#2In situ mechanical characterization of a single cell-cell adhesion interface under large strain
#3Modified method to fit cell elastic modulus based on Sneddon model
#4Determining interfacial tension for fluid-fluid-solid environments
#5Testing device and method for measuring adhesion force between gas hydrate and mineral particles
#6Passive semiconductor device assembly technology
#7Method of controlling a probe using constant command signals
#8A METHOD TO MEASURE NANOSCALE MECHANICAL PROPERTIES USING ATOMIC FORCE MICROSCOPY WITHOUT INITIALLY CHARACTERIZING CANTILEVER TIP GEOMETRY
#9Method for determining antifouling ability of a material surface and determining device for determining antifouling ability of material surface
#10Cantilever set for atomic force microscopes, substrate surface inspection apparatus including the same, method of analyzing surface of semiconductor substrate by using the same, and method of forming micropattern by using the same
#11Scanning probe microscope
#12Processes for surface measurement and modification by scanning probe microscopy functioning in continuous curvilinear mode, scanning probe microscope and device permitting their implementation of said methods
#13Characterization tools for toner adhesion and adhesion distribution
#14Apparatus and method for the detection of forces in the sub-micronewton range
#15Scanning probe microscope
#16Apparatus and method using a disk drive slider and/or a peltier plate in an atomic force microscope
#17Method and device for determining material properties
#18Scanning probe microscope
#19Method for determining tribological properties of a sample surface using a scanning microscope (sem) and associated scanning microscope