171192 ⎘
Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof SThM [Scanning Thermal Microscopy] or apparatus therefor, e.g. SThM probes
Measuring method for measuring heat distribution of specific space using SThM probe, method and device for detecting beam spot of light source
#2Quantum-dot-based measuring system and method
#3Measuring method for measuring heat distribution of specific space using SThM probe, method and device for detecting beam spot of light source
#4Probe and manufacturing method of probe for scanning probe microscope
#5Thermal analysis for source rocks
#6Scanning tunneling thermometer
#7Method of operating scanning thermal microscopy probe for quantitative mapping of thermal conductivity
#8Surface sensitive atomic force microscope based infrared spectroscopy
#9Scanning tunneling thermometer
#10Thermal probe for a near-field thermal microscope and method for generating a thermal map
#11Compact probe for atomic-force microscopy and atomic-force microscope including such a probe
#12Thermal probe
#13Superconducting scanning sensor for nanometer scale temperature imaging
#14SCANNING THERMO-IONIC MICROSCOPY
#15Computer-aided simulation method for atomic-resolution scanning seebeck microscope (SSM) images
#16Vertical embedded sensor and process of manufacturing thereof
#17High spatial resolution non-contact temperature measurement
#18Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy
#19Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy
#20Thermal probe
#21Thermal probe
#22TEMPERATURE MEASURING PROBE, TEMPERATURE MEASURING APPARATUS, AND TEMPERATURE MEASURING METHOD
#23Scanning thermal twisting atomic force microscopy
#24SPM Probe and Inspection Device for Light Emission Unit
#25DETECTION AND CHARACTERIZATION OF LASER-INDUCED HEAT AFFECTED ZONES ON POLYMER BASED DEVICES
#26Spatially resolved quantitative mapping of thermomechanical properties and phase transition temperatures using scanning probe microscopy
#27Softening point measuring apparatus and thermal conductivity measuring apparatus
#28CANTILEVER PROBE AND APPLICATIONS OF THE SAME
#29Infrared imaging using thermal radiation from a scanning probe tip
#30Transition temperature microscopy
#31Nanoindentation surface analysis method
#32Cantilever probe and applications of the same
#33Scanning probe microscopy inspection and modification system
#34Quantitative calorimetry signal for sub-micron scale thermal analysis
#35Nanoindentation surface analysis tool and method
#36Probe for scanning thermal microscope
#37Scanning probe microscopy inspection and modification system
#38Probe with embedded heater for nanoscale analysis
#39Method and apparatus for localized infrared spectrocopy and micro-tomography using a combination of thermal expansion and temperature change measurements
#40Systems and methods for thin film thermal diagnostics with scanning thermal microstructures
#41Thermal movement sensor
#42Scanning probe microscopy inspection and modification system
#43Contact probe storage sensor pod