ClassID:

171210

G01R1/04 - page 2 - CPC Classification

Classification description:

Details of instruments or arrangements of the types included in groups  -  and; General constructional details Housings; Supporting members; Arrangements of terminals

Recent Application in this class:
#301
20130021036
2013-01-24

TEST AND MEASUREMENT DEVICE WITH A PISTOL-GRIP HANDLE

#302
20130002235
2013-01-03

TEST BOX FOR ELECTROSTATIC GENERATORS

#303
20120318546
2012-12-20

Battery pack for use with a power tool and a non-motorized sensing tool

#304
20120312704
2012-12-13

Package having opening detection

#305
20120306526
2012-12-06

Shuttle plate having pockets for accomodating multiple semiconductor package sizes

#306
20120299613
2012-11-29

Jig for semiconductor test

#307
20120268104
2012-10-25

Signal detection apparatus for SAS devices

#308
20120267363
2012-10-25

Insulation Box Having Two Boards and a Spring Disposed Between the Boards

#309
20120262153
2012-10-18

Apparatus and method for measuring electrical parameters of circuit

#310
20120229160
2012-09-13

Wiring board for electronic parts inspecting device and its manufacturing method

#311
20120217987
2012-08-30

Non-destructive determination of the moisture content in an electronic circuit board using comparison of capacitance measurements acquired from test coupons, and design structure/process therefor

#312
20120200299
2012-08-09

Handheld Electrical Testing Device

#313
20120182006
2012-07-19

Advanced metering infrastructure (AMI) cartridge for an energy meter

#314
20120161804
2012-06-28

Apparatus and method for terminating probe apparatus of semiconductor wafer

#315
20120103765
2012-05-03

Digital multimeter having improved rotary switch assembly

#316
20120098563
2012-04-26

Inspection device with vertically moveable assembly

#317
20120091998
2012-04-19

Clamp meter with detachable clamp and clamp storage area

#318
20120074976
2012-03-29

Wafer testing systems and associated methods of use and manufacture

#319
20110316574
2011-12-29

Prober for testing devices in a repeat structure on a substrate

#320
20110316523
2011-12-29

AVOMETER

#321
20110275329
2011-11-10

Systems and methods for over-the-air testing of wireless systems

#322
20110193561
2011-08-11

Chucks for supporting solar cell in hot spot testing

#323
20110193548
2011-08-11

SEPARATION-TYPE AVOMETER

#324
20110169481
2011-07-14

Test and measurement device with a pistol-grip handle

#325
20110156696
2011-06-30

MULTIMETER

#326
20110140687
2011-06-16

Digital multimeter having a case and a separate panel structure

#327
20110074395
2011-03-31

Digital multimeters including a remote display

#328
20110026196
2011-02-03

Digital multimeters including a ruggedized jacket

#329
20100299091
2010-11-25

MULTI-FUNCTION PORTABLE ELECTRONIC DEVICE

#330
20100259288
2010-10-14

Apparatus and method for terminating probe apparatus of semiconductor wafer

#331
20100244868
2010-09-30

Wireless Clamp-on Current Probe

#332
20100216409
2010-08-26

Systems and methods for over-the-air testing of wireless systems

#333
20100118491
2010-05-13

Portable high-voltage test instrument with housing

#334
20100088050
2010-04-08

Portable heavy load battery testing system and method

#335
20100066395
2010-03-18

Wafer Prober Integrated With Full-Wafer Contacter

#336
20100040315
2010-02-18

Rotation detector,wheel bearing equipped therewith and process for manufacturing the same

#337
20100019915
2010-01-28

Industrial universal electrometer

#338
20090314607
2009-12-24

ELECTRONIC DEVICE CONVEYING METHOD AND ELECTRONIC DEVICE HANDLING APPARATUS

#339
20090295371
2009-12-03

Actuator/wedge improvements to embedded meter switch

#340
20090294260
2009-12-03

Meter with integrated high current switch

#341
20090237086
2009-09-24

Modular heavy load battery test system

#342
20090229842
2009-09-17

Battery pack for use with a power tool and a non-motorized sensing tool

#343
20090204403
2009-08-13

SPEECH GENERATING MEANS FOR USE WITH SIGNAL SENSORS

#344
20090195870
2009-08-06

SAMPLE STAGE FOR OPTICAL INSPECTION

#345
20090192927
2009-07-30

Enhanced power outlet system incorporating a smart receptacle

#346
20090189597
2009-07-30

INSTRUMENT FOR TESTING AN ELECTRICAL CIRCUIT

#347
20090179658
2009-07-16

Prober for testing devices in a repeat structure on a substrate

#348
20090160427
2009-06-25

Shore power cord ground wire current detector

#349
20090153166
2009-06-18

Apparatus and method for terminating probe apparatus of semiconductor wafer

#350
20090140758
2009-06-04

Test carrier

#351
20090102455
2009-04-23

Digital multimeter having hinged shield arrangement

#352
20090047841
2009-02-19

Digital multimeter having sealed input jack detection arrangement

#353
20090045806
2009-02-19

Digital multimeter having case panel structure

#354
20090045805
2009-02-19

Digital multimeter having housing sealing arrangement

#355
20090045038
2009-02-19

Digital multimeter having improved rotary switch assembly

#356
20090039870
2009-02-12

Electrical measuring instrument having a current clamp measures the current while detached from and attached to the housing

#357
20080305754
2008-12-11

Systems and methods for over-the-air testing of wireless systems

#358
20080303540
2008-12-11

Probe card assembly

#359
20080272764
2008-11-06

Test tray for test handler

#360
20080258667
2008-10-23

Test module for motor control center subunit

#361
20080224426
2008-09-18

Chuck with triaxial construction

#362
20080174331
2008-07-24

Structure of test area for a semiconductor tester

#363
20080164901
2008-07-10

Multilayer type test board assembly for high-precision inspection

#364
20080082275
2008-04-03

System for power sub-metering

#365
20080079437
2008-04-03

Current sensing module and assembly method thereof

#366
20080058503
2008-03-06

Methods of manipulating electrical wall fixtures

#367
20080048693
2008-02-28

Probe station having multiple enclosures

#368
20080023310
2008-01-31

Single-Hand Operated and Held Electronic Instrument

#369
20080012720
2008-01-17

Current monitoring device for high voltage electric power lines

#370
20080007286
2008-01-10

Printed circuit board with an opening to access components attached to the printed circuit board

#371
20070256511
2007-11-08

Probe holder for various thickness substrates

#372
20070252579
2007-11-01

Electrical measuring instrument having detachable current clamp probe

#373
20070252578
2007-11-01

Electrical measuring instrument having detachable current clamp

#374
20070247180
2007-10-25

Probe station having multiple enclosures

#375
20070241740
2007-10-18

Hand-Held Probe

#376
20070217170
2007-09-20

Multiple configuration stackable instrument modules

#377
20070216430
2007-09-20

Probe card having a leaf spring

#378
20070205752
2007-09-06

Portable Electronics Testing Device

#379
20070176895
2007-08-02

Measuring apparatus

#380
20070176611
2007-08-02

Method and apparatus for probing at arbitrary locations within an inaccessible array of leads the solder balls or pins actually connecting a VLSI IC package to a substrate or socket

#381
20070087597
2007-04-19

Apparatus and Method for Terminating Probe Apparatus of Semiconductor Wafer

#382
20070046280
2007-03-01

Auxiliary element for fixing a current sensor to an electrical conductor

#383
20070029992
2007-02-08

Current sensor for electric machine control

#384
20060279291
2006-12-14

Mobile testing device

#385
20060274482
2006-12-07

Sensor module, system, and method for sensors in proximity to circuit breakers

#386
20060267610
2006-11-30

Probe station having multiple enclosures

#387
20060216800
2006-09-28

Mounting structure of current sensor

#388
20060197519
2006-09-07

Test tray for handler

#389
20060192583
2006-08-31

Test tray for handler for testing semiconductor devices

#390
20060186903
2006-08-24

Apparatus and method for terminating probe apparatus of semiconductor wafer

#391
20060170442
2006-08-03

Protection devices for integrated circuit boards

#392
20060091891
2006-05-04

Member for measurement of cell voltage and temperature in battery pack

#393
20060090333
2006-05-04

Electrical wall switch gripping testing and installation device

#394
20060043959
2006-03-02

Combined test instrument probe and voltage detector

#395
20050283325
2005-12-22

Current sense resistor circuit with averaging Kelvin sense features

#396
20050272172
2005-12-08

Method of temporarily securing a die to a burn-in carrier

#397
20050211381
2005-09-29

RF sensor clamp assembly

#398
20050205728
2005-09-22

Meter stand

#399
20050184722
2005-08-25

Clamp meter with dual display

#400
20050167899
2005-08-04

Wafer scale thermal stress fixture and method

#401
20050162147
2005-07-28

High bandwidth oscilloscope probe with replaceable cable

#402
20050159049
2005-07-21

Wireless CASS interface device

#403
20050110481
2005-05-26

Modular housing for electrical instrument and mounting member therefor

#404
20050104576
2005-05-19

Meter with concealed probe receiving deck

#405
20050101193
2005-05-12

Remote display ammeter for power plug or power strip

#406
20050062489
2005-03-24

Probe station having multiple enclosures

#407
20050056451
2005-03-17

Electrical gripping testing and installation device

#408
20050041408
2005-02-24

Receiver with sliding hanger structure

#409
18594257
2024-12-31

Probe head and substrate inspection device including the same

#410
16017226
2019-05-21

Electronic watch with obscured sensor for detecting an applied force

#411
16012581
2020-06-09

Dual circuit current loading analysis apparatus

#412
15989625
2019-02-19

Fire alarm testing device and method

#413
15801084
2019-04-09

Floating apparatus for alerting people of the presence of voltage in water

#414
14695106
2016-11-08

Multi-standard instrumentation chassis

#415
14686437
2016-11-29

Floating apparatus for alerting people of the presence of voltage in water

#416
13950145
2015-10-20

Wrist meter-mount system

#417
13545062
2015-08-18

Electric testing tool for railroad relays

#418
13468801
2015-11-10

Steered-electron electric-field (SEEF) sensor program