171216 ⎘
Details of instruments or arrangements of the types included in groups - and; General constructional details; Housings; Supporting members; Arrangements of terminals; Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets; Sockets for IC's or transistors; Details Sockets or component fixtures for RF or HF testing
SOCKET ASSEMBLY AND ELECTRONIC COMPONENT TEST APPARATUS
#2SOCKET APPARATUS FOR SECURE PLACEMENT OF CHIP PACKAGE
#3TEST ARRANGEMENT FOR OVER-THE-AIR TESTING AN ANGLED DEVICE UNDER TEST USING A CARRIER STRUCTURE WITH AN OPENING
#4TEST ARRANGEMENT FOR OVER-THE-AIR TESTING AN ANGLED DEVICE UNDER TEST IN A DEVICE-UNDER-TEST SOCKET
#5SOCKET AND INSPECTION SOCKET
#6TEST SOCKET FOR PREVENTING SIGNAL LOSS
#7PROBE CARD AND SEMICONDUCTOR DEVICE INSPECTION SYSTEM INCLUDING THE SAME
#8TEST SOCKET AND METHOD FOR FABRICATING THE SAME
#9SOCKET DEVICE FOR TESTING ICs
#10Method for fabricating test socket
#11PROBE HOLDER AND PROBE UNIT
#12INSPECTION DEVICE
#13SYSTEM AND METHOD FOR ATTENUATING AND/OR TERMINATING RF CIRCUIT
#14Testing device for integrated circuit package
#15Testing device and method for integrated circuit package
#16TEST SOCKET AND METHOD FOR FABRICATING THE SAME
#17Method for fabricating test socket
#18Test equipment for testing a device under test having an antenna
#19Radio frequency ejector pin for production testing and radio frequency test system
#20Test device
#21Test device
#22Modular automated test system
#23Test socket assembly with antenna and related methods
#24Antenna in package production test
#25Test socket
#26Test kit for testing a device under test
#27System and method for attenuating and/or terminating RF circuit
#28Electrical connection socket
#29Antenna-in-package production test
#30Integrated circuit with antenna in package testing apparatus
#31Method of manufacturing electrical connection socket, and electrical connection socket
#32Test fixture for observing current flow through a set of resistors
#33Test device
#34Conductive contactor unit
#35Impedance controlled test socket
#36HIGH FREQUENCY CIRCUIT WITH RADAR ABSORBING MATERIAL TERMINATION COMPONENT AND RELATED METHODS
#37SHORT CONTACT WITH MULTIFUNCTIONAL ELASTOMER
#38Over-the-air test fixture using antenna array
#39Over-the-air testing of millimeter wave integrated circuits with integrated antennas
#40Wireless test system for testing microelectronic devices integrated with antenna
#41Test socket
#42Method and apparatus used for testing a device under test
#43Semiconductor test system with flexible and robust form factor
#44Contactors with signal pins, ground pins, and short ground pins
#45Test fixture for observing current flow through a set of resistors
#46Testing device, testing system, and testing method
#47Testing device, testing system, and testing method
#48Semiconductor inspection jig
#49Pusher pin having a non-electrically conductive portion
#50Over the air wireless test system for testing microelectronic devices integrated with antenna
#51Test socket assembly
#52Short contact with multifunctional elastomer
#53Shielded interconnect array
#54ATE testing system and method for millimetre wave packaged integrated circuits
#55Probe socket
#56Semiconductor inspection jig
#57Waveguides for capturing close-proximity electromagnetic radiation transmitted by wireless chips during testing on automated test equipment (ATE)
#58Device, system and method for automatic test of integrated antennas
#59Wave interface assembly for automatic test equipment for semiconductor testing
#60Multiple waveguide structure with single flange for automatic test equipment for semiconductor testing
#61Waveguides for capturing close-proximity electromagnetic radiation transmitted by wireless chips during testing on automated test equipment (ATE)
#62Module test socket for over the air testing of radio frequency integrated circuits
#63Radio frequency test socket and radio frequency test cable
#64High bandwidth differential lead with device connection
#65On-center electrically conductive pins for integrated testing
#66Known good die testing for high frequency applications
#67Inspection unit
#68Test board support platform for supporting a test board
#69Waveguides for capturing close-proximity electromagnetic radiation transmitted by wireless chips during testing on automated test equipment (ATE)
#70Radio frequency characteristics measurement jig device
#71Methods for modeling tunable radio-frequency elements
#72Contact holder
#73SCALABLE WIDEBAND PROBES, FIXTURES, AND SOCKETS FOR HIGH SPEED IC TESTING AND INTERCONNECTS
#74High frequency characteristic measuring device
#75Transmission device and method of testing transmission characteristic of DUT
#76Socket for a semiconductor device
#77TEST SOCKET AND TEST DEVICE HAVING THE SAME
#78SPRING WIRE ROD, CONTACT PROBE, AND PROBE UNIT
#79Electronic device socket
#80Universal test fixture for high-power packaged transistors and diodes
#81MEDICAL CONSULTATION MANAGEMENT SYSTEM
#82Testing system and testing method
#83INSPECTION SOCKET AND METHOD OF PRODUCING THE SAME
#84INSPECTION SOCKET
#85Radiofrequency contactor
#86Conductive contact holder and conductive contact unit
#87Calibration technique
#88Socket for an electronic device
#89Impedance measuring method
#90TEST CIRCUIT BOARD
#91Electronic component connecting apparatus, electronic unit and electronic apparatus
#92Scalable wideband probes, fixtures, and sockets for high speed IC testing and interconnects
#93Socket for test
#94Socket for an electronic device
#95Wastewater treatment system
#96Inspection unit for high frequency/high speed device connections
#97Inspection unit
#98Ground-signal-ground (gsg) test structure
#99Apparatus and method for aligning devices on carriers
#100Connector for testing a semiconductor package
#101Method of manufacturing inspection unit
#102Interface comprising a thin PCB with protrusions for testing an integrated circuit
#103Testing method and tester for semiconductor integrated circuit device comprising high-speed input/output element
#104Integrated printed circuit board and test contactor for high speed semiconductor testing
#105Over the air (OTA) chip testing system
#106Waveguide integrated circuit testing
#107Waveguide integrated circuit testing
#108Waveguide integrated testing
#109Waveguide integrated testing