SEMICONDUCTOR TEST APPARATUS

ACTIVE THERMAL INTERPOSER DEVICE WITH THERMAL ISOLATION STRUCTURES

PACKAGE RETENTION IN A TEST SOCKET BY A PRESSURIZED FLUID

SIGNAL TRSANSMISSION CONNECTOR

TEST SOCKET ASSEMBLIES COOLED WITH GASEOUS FLUID FOR SEMICONDUCTOR INTEGRATED CIRCUITS

SEMICONDUCTOR PACKAGE HEAT GENERATION SIMULATION UNIT FOR CHECKING HEAT DISTRIBUTION OF BURN-IN BOARD AND METHOD FOR ACQUIRING HEAT DISTRIBUTION OF BURN-IN BOARD USING THE SAME

TEST INTERCONNECT TEMPERATURE CONTROL WITH GAS FLOW

AUTOMATED SOCKET ACTUATION OF A SEMICONDUCTOR DEVICE PROGRAMMER

TEST SOCKET

ELECTRICAL SOCKET WITH AN IMPROVED ELEVATING MECHANISM FOR A HEATING-DISSIPATION ASSEMBLY

HEAT DISSIPATION STRUCTURE

Semiconductor Module Inspection Device

ACTIVE THERMAL INTERPOSER DEVICE

INSPECTION SOCKET

PHASE-CHANGE TEMPERATURE REGULATING SYSTEM AND ELECTRONIC COMPONENT TESTING APPARATUS AND METHOD

INSPECTION SYSTEM WITH THERMAL INTERFACE, AND ELECTRONIC COMPONENT INSPECTION DEVICE AND METHOD

ACTIVE THERMAL INTERPOSER DEVICE WITH THERMAL ISOLATION STRUCTURES

SOCKET DEVICE FOR TESTING ICs

TEST SYSTEM FOR TESTING SEMICONDUCTOR DEVICES

TEST SOCKET FOR AND A METHOD OF TESTING ELECTRONIC COMPONENTS, IN PARTICULAR HIGH-POWER SEMICONDUCTOR COMPONENTS

IC INSPECTION SOCKET

POGO PIN COOLING SYSTEM AND METHOD AND ELECTRONIC DEVICE TESTING APPARATUS HAVING THE SYSTEM

TEST BOARD, AND DIAGNOSTIC SYSTEM, DIAGNOSTIC METHOD, AND NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIUM STORING DIAGNOSTIC PROGRAM OF THE TEST BOARD

Plasma reactor having array of coaxial multiple pins and processing low temperature plasma at high efficiency

Active thermal interposer device

Heat exchanger for thermal control of heat producing devices

Liquid cooling system, liquid cooling method and electronic device-testing apparatus having the system

Probe apparatus for testing semiconductor devices

Testing devices and method for testing semiconductor devices

Multi-beam cantilever style contact pin for IC testing

Electronic component handling apparatus and electronic component testing apparatus

Apparatus for the Temperature Control of a Substrate and Corresponding Production Method

Test carrier

Active thermal interposer device

Chip testing apparatus

Test socket assemblies with liquid cooled frame for semiconductor integrated circuits

Multistory electronic device testing apparatus

Test socket having an automated lid

Thermal sensor

Test system including active thermal interposer device

DUT placement and handling for active thermal interposer device

Low-thermal resistance pressing device for a socket

Testing system including active thermal interposer device

Active thermal interposer device

Electronic device characterization systems and methods

Chuck unit and method for controlling temperature of the chuck unit

Thermal control system for an automated test system

Modular automated test system

Test site configuration in an automated test system

Test and burn-in apparatus that provides variable thermal resistance

Frame for contact unit and socket

IC socket for semiconductor

Method and apparatus for conducting burn-in testing of semiconductor devices

Test apparatus which tests semiconductor chips

Latch assembly, heat sink assembly, and computer product incorporating the same

Heating device for carrying out temperature-dependent tests on electronic components arranged in a socket

Socket side thermal system

Apparatus for the Temperature Control of a Substrate and Corresponding Production Method

Testing apparatus

Electronic component handling device and electronic component testing apparatus

Electronic component handling device and electronic component testing apparatus

History management pad of semiconductor test socket, manufacturing method thereof, and semiconductor test device including history management pad

Contact and socket device for testing semiconductor

Apparatus for testing an optoelectronic device and method of operating the same

System for testing devices inside of carriers

Semiconductor test system with flexible and robust form factor

Socket for electrical component

Burn-in test apparatus for semiconductor devices

Electrical connector assembly having fan support thereon

Kelvin contact finger for high current testing

Testing system for semiconductor package components and its thermal barrier layer element

DUT testing with configurable cooling control using DUT internal temperature data

Method for continuous tester operation during multiple stage temperature testing

Device testing using dual-fan cooling with ambient air

Electrical contact terminal and electronic component socket

Socket side thermal system

Dew resistant module for test socket and electronic component testing device having the same

Method for protecting an electronic circuit board

Test apparatus which tests semiconductor chips

Temperature-controlled module for electronic devices and testing apparatus provided with the same

Shield box, shield box assembly and apparatus for testing a semiconductor device

Low cost apparatus for insitu testing of packaged integrated circuits during stressing

Thermal clutch for thermal control unit and methods related thereto

Interface structure

High-temperature test fixture

Systems and methods for conforming device testers to integrated circuit device with pressure relief valve

ENVIRONMENTAL SENSOR

Failure estimation apparatus and failure estimation method

SEMICONDUCTOR DEVICE MANUFACTURING METHOD

Systems and methods for conforming test tooling to integrated circuit device with whirlwind cold plate

Integrated circuit test temperature control mechanism

METHOD OF CONTACTING INTEGRATED CIRCUIT COMPONENTS IN A TEST SYSTEM

Customizable tester having testing modules for automated testing of devices

Method and system for transient voltage suppression devices with active control

Systems and methods for conforming test tooling to integrated circuit device with heater socket

Test board with local thermal conditioning elements

Test platform

Systems and methods for conforming device testers to integrated circuit device with pressure relief valve

Burn-in socket with a heat sink

Test system with localized heating and method of manufacture thereof

Testing electronic components on electronic assemblies with large thermal mass

Integrated circuit test temperature control mechanism

Systems and methods for conforming test tooling to integrated circuit device profiles with ejection mechanisms

Systems and methods for conforming test tooling to integrated circuit device profiles with sockets having secured and replaceable bushings

Systems and methods for conforming test tooling to integrated circuit device profiles with compliant pedestals

Burn-in socket with improved terminals

Systems and methods for conforming device testers to integrated circuit device profiles with feedback temperature control

Shock test device

Systems and methods for conforming device testers to integrated circuit device profiles

Thermal chamber for IC chip testing

Pneumatically actuated IC socket with integrated heat sink

Device retention for test socket

Burn-in socket and testing fixture using the same

Spray cooling thermal management system and method for semiconductor probing, diagnostics, and failure analysis

Burn-in socket having actuating mechanism driven alternatively for driving sliding plate

Burn-in-test socket incorporating with actuating mechanism perfecting leveling of driving plate

BURN-IN SOCKET

Burn-in socket assembly with loading member having positioning clumps

Electric connecting apparatus

Burn-in socket connector

BURN-IN SOCKET WITH INTENSIFIED SOCKET BODY

Socket assembly with heat sink module

Probe for a socket, socket for a semiconductor integrated circuit and electronic device

TEST SOCKET ASSEMBLY HAVING HEAT DISSIPATION MODULE

Pin electronics liquid cooled multi-module for high performance, low cost automated test equipment

Burn-in socket with sliding member movable in dual directions

Integrated unit for electrical/reliability testing with improved thermal control

Conductive contact holder and conductive contact unit

Test socket, and test apparatus with test socket to control a temperature of an object to be tested

Method of manufacturing a heat sink pedestal device with interface medium chamber

IC SOCKET HAVING HEAT DISSIPATION FUNCTION

Electrical connector having heat sink with large dissipation area

Socket for testing main board having water-cooled cooler fixing structure

Ducted test socket

Burn-in socket

Method for manufacturing conductive contact holder, and conductive contact holder

Spray cooling thermal management system and method for semiconductor probing, diagnostics, and failure analysis

ATTACHMENT FOR SOCKET AND SEMICONDUCTOR DEVICE-TESTING UNIT HAVING THE SAME

Apparatus for securing heat sinks to a device under test

Electronic device testing apparatus and temperature control method in an electronic device testing apparatus

Test socket

Method and Device for Tempering a Substrate

Active thermal control unit for maintaining the set point temperature of a DUT

TEMPERATURE SENSING AND PREDICTION IN IC SOCKETS

BGA-type test and burn-in socket for integrated circuits (ICs)

Multilayer substrate and probe card

COOLING APPARATUS FOR SEMICONDUCTOR DEVICE

Test sockets having peltier elements, test equipment including the same and methods of testing semiconductor packages using the same

Securing heat sinks to a device under test

Burn-in testing apparatus and method

Burn-in socket with organizer arranging cable

Thermal optical chuck

Burn-in testing apparatus and method

TEMPERATURE CONTROL IN IC SOCKETS

Cooling fin connected to a cooling unit and a pusher of the testing apparatus

INTEGRATED CIRCUIT TEMPERATURE SENSING DEVICE AND METHOD

Temperature sensing and prediction in IC sockets

Heat sink pedestal with interface medium chamber

Burn-in testing apparatus and method

Spray cooling thermal management system and method for semiconductor probing, diagnostics, and failure analysis

Thermal optical chuck

Semiconductor device socket

Burn-in socket assembly

Cooling fin connected to a cooling unit and a pusher of the testing apparatus

Device and method of testing an electronic component

Burn-in testing apparatus and method

Integrated circuit temperature sensing device and method

Semiconductor device socket and semiconductor device connecting method using anisotropic conductive sheet

Burn-in socket adapt to assembly sensor thereon

Electronic device aging test apparatus