171229 ⎘
Details of instruments or arrangements of the types included in groups - and; General constructional details; Measuring leads; Measuring probes; Measuring probes; Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins Geometry aspects
Semiconductor interconnect having dome shaped conductive spring contacts
#302Metal structure and method for production thereof
#303Hollow microprobe using a MEMS technique and a method of manufacturing the same
#304Method for making a planar suspended microstructure, using a sacrificial layer of polymer material and resulting component
#305Test system for semiconductor components having conductive spring contacts
#306Method for fabricating semiconductor components with conductive spring contacts
#307Contactor having conductive particles in a hole as a contact electrode
#308Electrochemically fabricated microprobes
#309Probe card and contactor of the same
#310Helical microelectronic contact and method for fabricating same
#311Method for forming microelectronic spring structures on a substrate
#312Electrochemically fabricated microprobes
#313Cantilever probe with dual plane fixture and probe apparatus therewith
#314Test probe for semiconductor package
#315Freely deflecting knee probe with controlled scrub motion
#316Compliant electrical contact assembly
#317Sheet-form connector and production method and application therefor
#318Cantilever microprobes for contacting electronic components and methods for making such probes
#319Probe device for electrical testing an integrated circuit device and probe card using the same
#320Test head assembly having paired contact structures
#321Test pin back surface in probe apparatus for low wear multiple contacting with conductive elastomer
#322Multi-signal single beam probe
#323Sputtered spring films with low stress anisotropy
#324POGO probe card for low current measurements
#325Low-current pogo probe card
#326Method for fabricating a semiconductor interconnect having conductive spring contacts
#327Membrane probing system
#328Membrane probe with anchored elements
#329Semiconductor interconnect having conductive spring contacts
#330Contactor having conductive particles in a hole as a contact electrode
#331Contact probe for a testing head having vertical probes for semiconductor integrated devices
#332Spring contact probe device for electrical testing
#333Microprobe tips and methods for making
#334Probe card
#335Probe card and contactor of the same
#336Low-current pogo probe card
#337Micro-cantilever type probe card
#338Forming tool for forming a contoured microelectronic spring mold
#339Probe card assembly
#340Semiconductor interconnect having compliant conductive contacts
#341Current sensor having microwave chip resistors in parallel radial arrangement
#342Method and device to aid in the inspection and certification of harvested food for human consumption