171248 ⎘
Details of instruments or arrangements of the types included in groups - and; General constructional details; Measuring leads; Measuring probes; Measuring probes; Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
KIT FOR CONTROLLING SOLDERED JOINTS ON A BOARD
#2ELECTRICAL CONNECTION DEVICE
#3TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES
#4FLEXIBLE SUBSTRATE AND TESTING JIG
#5ADJUSTABLE SUPPORTING DEVICE
#6PROBE ASSEMBLY WITH DOWNWARD-PROTRUDING PROBE SHIELD AND METHODS OF OPERATING THE SAME
#7CIRCUIT STRUCTURE, ELECTRONIC DEVICE, AND MANUFACTURING METHOD OF ELECTRONIC DEVICE
#8Testing head having improved frequency properties
#9CONDUCTION INSPECTION JIG AND METHOD FOR MANUFACTURING PRINTED WIRING BOARD
#10AUTOMATIC TEST EQUIPMENT
#11AUTOMATIC TEST EQUIPMENT
#12AUTOMATIC TEST EQUIPMENT
#13AUTOMATIC TEST EQUIPMENT
#14Testing head having improved frequency properties
#15PROBE CARD
#16Inspection jig and circuit board inspection apparatus including the same
#17Probe assembly with two spaced probes for high frequency circuit board test apparatus
#18PROBE INSTALLATION CIRCUIT BOARD AND PROBE DEVICE FOR PROBE CARD
#19Circuit board for semiconductor test
#20Force deflection and resistance testing system and method of use
#21Fixture
#22Printed circuit board
#23Probe card testing device
#24Probe card device and fence-like probe thereof
#25Test adapter
#26Testing head having improved frequency properties
#27PROBE CARD DEVICE
#28Contact probe and inspecting socket including the same
#29Probing apparatus
#30Force deflection and resistance testing system and method of use
#31Inspection device
#32ELECTRICAL TEST APPARATUS HAVING ADJUSTABLE CONTACT PRESSURE
#33Automatic test equipment (ATE) contactor adaptor
#34Testing device and method for testing a printed circuit board
#35System and device for automatic signal measurement
#36Contact terminal, inspection jig, and inspection device
#37Circuit test system and method
#38Testing head having improved frequency properties
#39Coaxial electrical interconnect
#40Force deflection and resistance testing system and method of use
#41Probe card device and rectangular probe thereof
#42Wide range compensation of low frequency response passive probe
#43Probe card and contact inspection device
#44Kelvin connection with positional accuracy
#45Probe socket
#46Probing apparatus for tapping electric signals generated by a device-under-test
#47Quick change small footprint testing system and method of use
#48Test device for printed circuit board assembly
#49Package testing system and method with contact alignment
#50Calibration kits for RF passive devices
#51TEST DEVICE
#52Force deflection and resistance testing system and method of use
#53Testing device
#54Using computer-aided design layout in scanning system
#55Calibration kits for RF passive devices
#56Known good die testing for high frequency applications
#57Quick change small footprint testing system and method of use
#58FORMED WIRE PROBE INTERCONNECT FOR TEST DIE CONTACTOR
#59High accuracy electrical test interconnection device and method for electrical circuit board testing
#60Testing apparatus and testing method of electronic device
#61Calibration kits for RF passive devices
#62Inspection contact element and inspecting jig
#63Inspection jig and contact
#64Contact-connection unit for a test apparatus for testing printed circuit boards
#65Loaded printed circuit board test fixture and method for manufacturing the same
#66MULTI-CONTACT PROBE ASSEMBLY
#67DEVICE, METHOD AND PROBE FOR INSPECTING SUBSTRATE
#68Module for test device for testing circuit boards
#69Testing device
#70JIG FOR PRINTED SUBSTRATE INSPECTION AND PRINTED SUBSTRATE INSPECTION APPARATUS
#71Electric connector and electrical connecting apparatus using the same
#72Probe array wafer
#73Probe having a frame to align spring pins perpendicularly to a printed circuit board, and method of making same
#74PROBE, TESTING HEAD HAVING A PLURALITY OF PROBES, AND CIRCUIT BOARD TESTER HAVING THE TESTING HEAD
#75Low profile electronic assembly test fixtures
#76Testing device
#77Incorporation of Isolation Resistor(s) into Probes using Probe Tip Spring Pins
#78Circuit board test device comprising contact needles which are driven in diagonally protruding manner
#79Universal test fixture
#80Probe, printed circuit board testing device and printed circuit board testing method
#81Incorporation of isolation resistor(s) into probes using probe tip spring pins
#82Socket connection test modules and methods of using the same
#83Socket connection test modules and methods of using the same
#84Probes with perpendicularly disposed spring pins, and methods of making and using same
#85Method and apparatus for implementing very high density probing (VHDP) of printed circuit board signals
#86Method and probe structure for implementing a single probe location for multiple signals
#87Socket connection test modules and methods of using the same
#88Test fixture utilizing a docking station and interchangeable cassettes and method of use