171255 ⎘
Details of instruments or arrangements of the types included in groups - and; General constructional details; Measuring leads; Measuring probes; Measuring probes; Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using switching of signals between probe tips and test bed, i.e. the standard contact matrix which in its turn connects to the tester
CHIP TESTING DEVICE AND CHIP TESTING METHOD
#2WAFER INSPECTION APPARATUS
#3WAFER INSPECTION METHOD AND INSPECTION APPARATUS
#4Wafer inspection method and inspection apparatus
#5Safety system for needle probe card for high-voltage and high-current test on power semiconductor devices, related test machine and corresponding testing method
#6MULTIPLEXER-ENABLED CABLES AND TEST FIXTURES
#7Probe card and signal path switching module assembly
#8Current leakage and charge injection mitigating solid state switch
#9Testing system and method
#10Testing system and method
#11Probe module supporting loopback test
#12Interposer to regulate current for wafer test tooling
#13Test schemes and apparatus for passive interposers
#14Wafer inspection system
#15Muxing interface platform for multiplexed handlers to reduce index time system and method
#16Universal multiplexing interface system and method
#17Probe card and inspection apparatus
#18Testing of electronic circuits using an active probe integrated circuit
#19Method and apparatus for providing a tester integrated circuit for testing a semiconductor device under test
#20Probe card cooling assembly with direct cooling of active electronic components
#21Probe apparatus, a process of forming a probe head, and a process of forming an electronic device
#22Node Extender for In-Circuit Test Systems
#23Automatic multiplexing system for automated wafer testing
#24Device and method for electrical contacting semiconductor devices for testing
#25Configurable interface device
#26Probe card for test of semiconductor chips and method for test of semiconductor chips using the same
#27Intelligent probe card architecture
#28Method and apparatus for switching tester resources
#29PROGRAMMABLE DEVICES TO ROUTE SIGNALS ON PROBE CARDS
#30Method for testing electronic modules using board with test contactors having beam contacts
#31Semi-automatic multiplexing system for automated semiconductor wafer testing
#32Efficient switching architecture with reduced stub lengths
#33Test apparatus with tester channel availability identification
#34Probe card assembly including a programmable device to selectively route signals from channels of a test system controller to probes
#35Universal test fixture
#36Test method for electronic modules using movable test contactors
#37Switching matrix and method for distinction of a connecting line
#38Intelligent probe card architecture
#39Probe card cooling assembly with direct cooling of active electronic components
#40Efficient switching architecture with reduced stub lengths
#41Test method for electronic modules
#42High speed electromechanically driven test ahead