Patents-Review.com
ClassID:

171261 ⎘

G01R1/16 - CPC Classification

Classification description:

Details of instruments or arrangements of the types included in groups  -  and; General constructional details Magnets

Recent Application in this class:
#1
20250093407
2025-03-20

METHOD OF HAVING GOOD THERMAL ISOLATION IN WAFER TEST CASSETTE

 #2
20250093387
2025-03-20

WAFER TEST SYSTEM

 #3
20250093386
2025-03-20

WAFER TESTING CASSETTE

 #4
20240367700
2024-11-07

FAULT DETECTION DEVICE AND METHOD FOR SUPERCONDUCTING ELECTRODYNAMIC MAGNETIC LEVITATION (MAGLEV) TRACK

 #5
20230333157
2023-10-19

Semiconductor wafer testing system and related method for improving external magnetic field wafer testing

 #6
20230333140
2023-10-19

PROBE UNIT AND HOLDER FOR A PROBE UNIT

 #7
20220373594
2022-11-24

Semiconductor wafer testing system and related method for improving external magnetic field wafer testing

 #8
20220057434
2022-02-24

Conductive particle and testing socket comprising the same

 #9
20210109152
2021-04-15

Semiconductor wafer testing system and related method for improving external magnetic field wafer testing

 #10
20200408633
2020-12-31

SYSTEMS AND METHODS FOR MEASURING STRUCTURAL ELEMENT DEFLECTIONS

 #11
20200348339
2020-11-05

SUPPLEMENTARY BUSHING, TEST PROBE, AND SUPPLEMENTARY TESTING DEVICE

 #12
20200166544
2020-05-28

Magnetic field transducer mounting methods for MTJ device testers

 #13
20200096559
2020-03-26

Semiconductor wafer testing system and related method for improving external magnetic field wafer testing

 #14
20200025803
2020-01-23

Current sensor

 #15
20200025800
2020-01-23

Jig

 #16
20190195914
2019-06-27

Magnetic field transducer mounting apparatus for MTJ device testers

 #17
20190137543
2019-05-09

TESTING APPARATUS FOR TESTING A SEMICONDUCTOR DEVICE

 #18
20180172733
2018-06-21

MAGNETIC ASSEMBLY AND MAGNETIC CORE SET THEREOF

 #19
20170045554
2017-02-16

CIRCUIT PROBING SYSTEM AND ITS CIRCUIT PROBING DEVICE

 #20
20140297084
2014-10-02

System and method to determine the state of charge of a battery using magnetostriction to detect magnetic response of battery material

 #21
20100079145
2010-04-01

System and method to determine the state of charge of a battery using magnetostriction to detect magnetic response of battery material