171268 ⎘
Details of instruments or arrangements of the types included in groups - and; Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments; Transmission-line, e.g. waveguide, measuring sections, e.g. slotted section with linear movement of probe
TEST APPARATUS AND BATTERY PRODUCTION LINE
#2Anisotropic constitutive parameters for launching a Zenneck surface wave
#3Broadband probes for impedance tuners
#4Broadband probes for impedance tuners
#5Multi-probes as single RF tuning element for RF slide-screw tuners
#6Load pull tuner on waveguide wafer-probe
#7Two probe low profile tuner