ClassID:

171354

G01R13/0218 - CPC Classification

Classification description:

Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form Circuits therefor

Sub-classes:
Recent Application in this class:
#1
20260147018
2026-05-28

MULTI-SENSOR PROBES WITH CONTINUOUS TIME PATH

#2
20260118382
2026-04-30

PROBE ADAPTER AND MEASUREMENT SYSTEM

#3
20260072067
2026-03-12

PHASE SEQUENCE INDICATOR CIRCUIT

#4
20260063673
2026-03-05

ASYMMETRIC ACQUISITIONS AND DISJOINT TIME TRIGGER IN A TEST AND MEASUREMENT INSTRUMENT

#5
20260063672
2026-03-05

METHOD FOR CONTROLLING A TEST AND/OR MEASUREMENT SYSTEM

#6
20260029451
2026-01-29

NOISE AND JITTER COMPENSATION AND SIGNAL PROCESSING OF EQUIVALENT-TIME WAVEFORMS

#7
20260009824
2026-01-08

Input Facility, Controller, and Measurement Apparatus

#8
20260002965
2026-01-01

AUTOSET FEATURE AS PART OF BUS CONFIGURATION TO AUTOMATICALLY DETECT AND SET SERIAL BUS PARAMETERS

#9
20250370030
2025-12-04

SYSTEMS AND METHODS FOR MEASURING WAVEFORMS AT DEVICES UNDER TEST

#10
20250355023
2025-11-20

ARTIFICIAL INTELLIGENCE WAVEFORM ASSISTANT

#11
20250273950
2025-08-28

VOLTAGE LIMITER CIRCUIT, DIRECTIVE CIRCUIT, AND MEASUREMENT INSTRUMENT

#12
20250231220
2025-07-17

ACCELERATION INSIGHTS, ENHANCING EFFICIENCY, AND ENABLING PREDICTIVE MAINTENANCE IN TEST AND MEASUREMENT SYSTEMS USING ARTIFICIAL INTELLIGENCE ASSISTANT

#13
20250138073
2025-05-01

METHODS OF REMOVING INTRINSIC NOISE FROM SIGNAL UNDER TEST (SUT)

#14
20250138053
2025-05-01

ANALOG FRONT-END CHIP AND OSCILLOSCOPE

#15
20240393369
2024-11-28

REAL-EQUIVALENT-TIME OSCILLOSCOPE CLOCK DATA RECOVERY WITH SOFTWARE EQUALIZER

#16
20240369665
2024-11-07

ISOLATED TEST AND MEASUREMENT PROBE

#17
20240353447
2024-10-24

TEST AND MEASUREMENT INSTRUMENT WITH INTEGRATED ANALOG FRONT END

#18
20240223200
2024-07-04

MULTIPLE ANALOG-TO-DIGITAL CONVERTER SYSTEM TO PROVIDE SIMULTANEOUS WIDE FREQUENCY RANGE, HIGH BANDWIDTH, AND HIGH RESOLUTION

#19
20240151753
2024-05-09

REAL-EQUIVALENT-TIME OSCILLOSCOPE

#20
20240103043
2024-03-28

MEASUREMENT APPLICATION DEVICE, POSTPROCESSING DEVICE, METHOD AND NON-TRANSITORY COMPUTER-READABLE MEDIUM

#21
20240069070
2024-02-29

DE-SKEW METHOD FOR DYNAMIC TESTING USING TRANSFER FUNCTION OF CURRENT SENSOR

#22
20240036075
2024-02-01

MEASUREMENT APPLICATION DEVICE AND METHOD

#23
20240027497
2024-01-25

HIGH SPEED WAVEFORM ACQUISITIONS AND HISTOGRAMS USING GRAPHICS PROCESSING UNIT IN A TEST AND MEASUREMENT INSTRUMENT

#24
20230280373
2023-09-07

SIGNAL PROCESSING METHOD AND SIGNAL PROCESSING SYSTEM

#25
20230140131
2023-05-04

DUAL-DETECTOR REAL-TIME SPECTRUM ANALYZER

#26
20230122803
2023-04-20

On-chip oscilloscope

#27
20230077447
2023-03-16

TEST AND MEASUREMENT INSTRUMENT WITH REMOVABLE BATTERY PACK

#28
20230070298
2023-03-09

REAL-EQUIVALENT-TIME CLOCK RECOVERY FOR A NEARLY-REAL-TIME REAL-EQUIVALENT-TIME OSCILLOSCOPE

#29
20230020628
2023-01-19

Multiple analog-to-digital converter system to provide simultaneous wide frequency range, high bandwidth, and high resolution

#30
20230019734
2023-01-19

Swept parameter oscilloscope

#31
20220416776
2022-12-29

Clock anomaly detection

#32
20220407479
2022-12-22

Differential noise cancellation

#33
20220196701
2022-06-23

Test and measurement devices, systems and methods associated with augmented reality

#34
20220163586
2022-05-26

SELF-DIAGNOSING MEASUREMENT SYSTEM AND SELF-DIAGNOSIS METHOD

#35
20220163566
2022-05-26

SYSTEM AND METHOD FOR HIGH PERFORMANCE DISTRIBUTION OF LARGE WAVEFORM CAPTURES TO MULTIPLE VIEWERS

#36
20220146554
2022-05-12

Measurement instrument

#37
20220082604
2022-03-17

Measuring error in signal under test (SUT) using multiple channel measurement device

#38
20220082603
2022-03-17

Measuring error in signal under test (SUT) using multiple channel measurement device

#39
20220011347
2022-01-13

INSTRUMENT FOR ANALYZING AN INPUT SIGNAL

#40
20210405090
2021-12-30

Oscilloscope noise floor de-embedding for high speed toggle signal measurement

#41
20210325431
2021-10-21

Signal analysis method and measurement system

#42
20210270871
2021-09-02

On-chip oscilloscope

#43
20210263085
2021-08-26

Real-equivalent-time oscilloscope

#44
20210215744
2021-07-15

System for data mapping and storing in digital three-dimensional oscilloscope

#45
20210199700
2021-07-01

DC power rail probes and measurement methods

#46
20200333378
2020-10-22

Method and apparatus for processing oscilloscope signal and oscilloscope

#47
20200321930
2020-10-08

Differential noise cancellation

#48
20200200794
2020-06-25

Test and measurement devices, systems, and methods associated with augmented reality

#49
20200064386
2020-02-27

Measuring error in signal under test (SUT) using multiple channel measurement device

#50
20200018785
2020-01-16

Noise source monitoring apparatus and noise source monitoring method

#51
20190107562
2019-04-11

On-chip oscilloscope

#52
20190064233
2019-02-28

Multi-domain measurement system as well as use of a multi-domain measurement system

#53
20190033364
2019-01-31

Monitoring waveforms from waveform generator at device under test

#54
20190025344
2019-01-24

Monitoring device under test waveform on signal generator

#55
20180335452
2018-11-22

Oscilloscope, test and measurement system as well as method

#56
20180278043
2018-09-27

Protection circuit for oscilloscope measurement channel

#57
20180203043
2018-07-19

Waveform display device

#58
20180180648
2018-06-28

Voltage measurement and wireless communication system

#59
20180136268
2018-05-17

Measurement device and method for measuring the impedance of a device under test

#60
20180113160
2018-04-26

Ratio-reference measurement of the arrival time and/or amplitude of a digitized electronic pulse

#61
20180107533
2018-04-19

Fixing system, server, terminal device, fixing method, and recording medium

#62
20180026816
2018-01-25

Multi-band noise reduction systems and methods

#63
20170328932
2017-11-16

Noise reduction in digitizing systems

#64
20170307678
2017-10-26

Measurement arrangement

#65
20170292977
2017-10-12

LINEAR NOISE REDUCTION FOR A TEST AND MEASUREMENT SYSTEM

#66
20170248635
2017-08-31

Correction for linear interpolation error

#67
20170212149
2017-07-27

Waveform display device that allows cycle time comparison to be made

#68
20170199228
2017-07-13

On-chip oscilloscope

#69
20170168092
2017-06-15

Group delay based averaging

#70
20170139000
2017-05-18

Method and apparatus for automated surge stress testing of a device under test using voltage and current waveforms

#71
20170089954
2017-03-30

Offset stacked compressor amplifiers in a discrete digitizer system for noise reduction and increased resolution

#72
20170059617
2017-03-02

Method and a measuring device for investigating signal parameters

#73
20160291056
2016-10-06

Band overlay separator

#74
20160124022
2016-05-05

SIGNAL PROCESSING SYSTEM, SIGNAL PROCESSING METHOD, AND SIGNAL PROCESSING PROGRAM

#75
20150369898
2015-12-24

Phase noise correction system for discrete time signal processing

#76
20150242034
2015-08-27

Measuring method and a measuring device with fingertip zoom

#77
20150241197
2015-08-27

Signal processing circuit and sensor system

#78
20150137825
2015-05-21

Ephemeral electric potential and electric field sensor

#79
20150057978
2015-02-26

Serial bit stream regular expression with states

#80
20140368184
2014-12-18

Electromagnetic wave signal processor and electromagnetic wave detector

#81
20140067300
2014-03-06

Time stretch enhanced recording scope

#82
20130237170
2013-09-12

Arbitrary multiband overlay mixer apparatus and method for bandwidth multiplication

#83
20130197865
2013-08-01

Measuring device and a method for the decimation of a datastream

#84
20130093493
2013-04-18

Arbitrary multiband overlay mixer apparatus and method for bandwidth multiplication

#85
20130027022
2013-01-31

System for measuring current and method of making same

#86
20120274309
2012-11-01

Method for automatically setting frequency span in a spectrum analyzer

#87
20120268101
2012-10-25

Oscilloscope with integrated generator and internal trigger

#88
20120191418
2012-07-26

Structure and method of data synchronization for Multi measuring apparatus

#89
20120039374
2012-02-16

Time-domain searching in a test and measurement instrument

#90
20120038369
2012-02-16

Time-domain measurements in a test and measurement instrument

#91
20110311009
2011-12-22

Pattern agnostic on-die scope

#92
20110199285
2011-08-18

METHOD AND APPARATUS FOR WAVEFORM COMPRESSION AND DISPLAY

#93
20110169480
2011-07-14

Low voltage differential signaling test system and method

#94
20110130999
2011-06-02

Test system for connectors with multi-input

#95
20110002370
2011-01-06

Sampling point detection circuit, transmission system, pre-emphasis intensity adjustment method, logic analyzer, and evaluation method for evaluating transmission path

#96
20100201345
2010-08-12

Time stretch enhanced recording scope

#97
20100188406
2010-07-29

Systems and methods for focus plus context viewing of dense, ordered line graphs

#98
20100057388
2010-03-04

Digital oscilloscope module

#99
20100052653
2010-03-04

Digital oscilloscope module with glitch detection

#100
20100036630
2010-02-11

SYSTEM AND METHOD FOR SIGNAL MEASUREMENT

#101
20100026277
2010-02-04

Waveform observing apparatus

#102
20100002906
2010-01-07

Device and method for analysis of signal characteristics with the use of masks

#103
20090281747
2009-11-12

Signal measurement apparatus, signal measurement method, recording media and test apparatus

#104
20090237072
2009-09-24

Sequential equivalent—time sampling with an asynchronous reference clock

#105
20090122852
2009-05-14

Eye violation and excess jitter trigger

#106
20090105976
2009-04-23

AUTOMATIC JITTER MEASUREMENT METHOD

#107
20080012861
2008-01-17

Apparatus and method for improved measurement speed in test and measurement instruments

#108
20060190200
2006-08-24

Method for normalization of an eye diagram and selection of sampling parameters for a receiver

#109
17334136
2023-07-11

System and method for performing lossless compressed serial decoding

#110
15582173
2018-08-14

Logic signal analyzer, logic probe as well as oscilloscope