171575 ⎘
Arrangements for measuring frequencies; Arrangements for analysing frequency spectra; Spectrum analysis; Fourier analysis with optical or acoustical auxiliary devices
DEVICE FOR ANALYZING RADIOFREQUENCY SIGNAL SPECTRA
#2OBJECT OR SURFACE NOISE-LEVEL DETECTION USING RADARS AND/OR LIDARS
#3Minimization of drill string rotation rate effect on acoustic signal of drill sound
#4Photonic device and a terahertz signal generator
#5Background suppression for MM-wave spectroscopy
#6System for analyzing electromagnetic radiation
#7Electro-optic waveform analysis process
#8Analysis of electro-optic waveforms
#9Frequency spectrum detection system
#10Device and method for frequency analysis of a signal
#11Method for evaluating a frequency spectrum
#12System and method for measuring time-frequency characteristic of high-frequency electromagnetic signal
#13Device and method for spectral analysis
#14Optical RF spectrum analyser
#15Apparatus and method for processing spectrum
#16Electret fiber sheet
#17Ultrahigh resolution dynamic IC chip activity detection for hardware security
#18Measurement result display device and measurement result display method
#19FAILURE LOCATION SPECIFYING DEVICE AND FAILURE LOCATION SPECIFYING METHOD
#20Device for detecting an electric arc based on its acoustic signature
#21System for analysis of a microwave frequency signal by imaging
#22Systems and methods for precision optical imaging of electrical currents and temperature in integrated circuits
#23Distributed spectrum analyzer and method of spectrum analysis applying same
#24Apparatus for frequency analyzing a measurement target and method of frequency analyzing a measurement target
#25Terahertz detection assembly and methods for use in detecting terahertz radiation
#26Frequency visualization apparatus and method
#27Adaptive RF signal filter using acousto-optic spectrum analyzer and re-writable XDM mask
#28DEVICE CHARACTERISTICS MEASUREMENT METHOD USING AN ALL-OPTOELECTRONIC TERAHERTZ PHOTOMIXING SYSTEM AND SPECTRAL CHARACTERISTICS MEASUREMENT METHOD OF TERAHERTZ MEASURING APPARATUS USING THE SAME
#29Sensor for detecting high frequency signals
#30RF measurement system incorporating a ream assembly and method of using the same
#31Sensor for detecting high frequency signals
#32Electro-optic delay line frequency discriminator