171608 ⎘
Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom; Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant; Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables; Measuring dielectric properties, e.g. constants; Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells of plate type, i.e. with the sample sandwiched in the middle
DEVICE FOR MEASURING ELECTRICAL PROPERTIES USING WAVEGUIDE TIP ADAPTER
#2DIELECTRIC CHARACTERISTIC MEASUREMENT METHOD AND DIELECTRIC CHARACTERISTIC MEASUREMENT SYSTEM USING OPEN RESONATOR
#3Tuning of narrowband near-field probes
#4Near-field electrostatic communications system
#5Apparatus for measuring wideband dielectric measurements of objects using a bistatic antenna
#6Dielectric constant microscope and method of observing organic specimen
#7Aerospace transparency having moisture sensors
#8Aerospace transparency having moisture sensors
#9Methods for measuring dielectric properties of parts
#10Measurement of thickness of dielectric films on surfaces
#11Methods for measuring dielectric properties of parts
#12Method and apparatus for inspecting process performance for use in a plasma processing apparatus
#13Capacitive plate dielectrometer method and system for measuring dielectric properties
#14Wall detector
#15Method and device for characterizing ferroelectric materials