171614 ⎘
Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom; Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant; Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables; Measuring dielectric properties, e.g. constants; Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells Probes
TWO-BODY SEPARATED EXTRATERRESTRIAL BODY DIELECTRIC CONSTANT PROBE AND ITS PROBING METHOD
#2Sensor
#3In-situ evaluation method and system for loess collapsibility based on non-destructive time-domain reflection technology
#4Anisotropic constitutive parameters for launching a Zenneck surface wave
#5Tuning of narrowband near-field probes
#6TDR measuring apparatus for determining the dielectric constant
#7Anisotropic constitutive parameters for launching a Zenneck surface wave
#8Electrical probe structure
#9DETERMINING SOLIDS CONTENT USING DIELECTRIC PROPERTIES
#10Guided wave radar level gauge system with dual transmission line probes for dielectric constant compensation
#11PROBE CARD FOR MEASURING MICRO-CAPACITANCE
#12Metamaterial Particles for Near-Field Sensing Applications
#13MEASURING DEVICE AND A METHOD FOR DETERMINING TISSUE PARAMETERS
#14Device and method for resonant high-speed microscopic impedance probe
#15Method and system for measurement of dielectric constant of thin films using a near field microwave probe
#16Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuits
#17High speed calibration method for impedance tuner
#18Dielectric measurement probe for curved surfaces