171624 ⎘
Arrangements for measuring or indicating electric quantities not covered by groups - ; Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values
Sub-classes:HIGH VOLTAGE/FREQUENCY TAMPER DETECTION CIRCUIT IN UTILITY METERS
#2Broadband lossless partial discharge detection and noise removal device
#3ELECTRICAL PARAMETER MONITORING
#4LIDAR SYSTEM WITH PULSE-ENERGY MEASUREMENT
#5Clock anomaly detection
#6Joint denoising and delay estimation for the extraction of pulse-width of signals in RF interference
#7Apparatus for analysing currents in an electrical load, and load having such an apparatus
#8Power supply glitch detector
#9Semiconductor device, light source control device, and light source control system
#10Flashlamp degradation monitoring system and method
#11Ground quality check systems and methods
#12Packet energy transfer in-line communications
#13Distortion measurement for limiting jitter in PAM transmitters
#14Waveform shape discriminator
#15Pulse processing device and radiation measuring device
#16METHODS AND STRUCTURE FOR ON-CHIP CLOCK JITTER TESTING AND ANALYSIS
#17Digital sensing apparatus and digital readout module thereof
#18Apparatus and method for determining variation in a predetermined physical property of a circuit
#19Methods and structure for on-chip clock jitter testing and analysis
#20Test apparatus and test method
#21Pulse measurement apparatus and method
#22SIGNAL DETECTING APPARATUS AND SIGNAL DETECTING SYSTEM
#23Clock error detection circuits, methods, and systems
#24Signal detecting apparatus and signal detecting system
#25Method and apparatus for creating performance limits from parametric measurements