171700 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation of components or parts made of semiconducting materials; of LV components or parts
SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
#2POWER DEVICE THRESHOLD VOLTAGE MEASUREMENT CIRCUIT AND OPERATION METHOD THEREOF
#3METHOD FOR ESTIMATING PARTIAL DISCHARGE FACTOR OF POWER SEMICONDUCTOR MODULE, AND DEVICE FOR ESTIMATING PARTIAL DISCHARGE FACTOR OF POWER SEMICONDUCTOR MODULE
#4ELECTROMAGNETIC WAVE DETECTOR AND ELECTROMAGNETIC WAVE DETECTOR ARRAY
#5Semiconductor device, and method for manufacturing semiconductor device
#6APPARATUS AND METHOD ESTIMATING BREAKDOWN VOLTAGE OF SILICON DIOXIDE FILM USING NEURAL NETWORK MODEL
#7Semiconductor device, and method for manufacturing semiconductor device
#8Laminate sheet and method of use thereof
#9Breakdown voltage detection
#10Time dependent dielectric breakdown test structure and test method thereof
#11Integrated circuit having insulation breakdown detection
#12Stationary bath for testing electronic components
#13Semiconductor device, and method for manufacturing semiconductor device
#14Parallel test structure
#15Testing of semiconductor devices and devices, and designs thereof
#16Dielectric breakdown monitor
#17Diagnostic apparatus for switchgear
#18Methods, apparatus and system for screening process splits for technology development
#19High-voltage dry apparatus provided with a continuous monitoring device
#20Semiconductor device, and method for manufacturing semiconductor device
#21On-chip test circuit for magnetic random access memory (MRAM)
#22Testing of semiconductor devices and devices, and designs thereof
#23Methods of manufacturing wide band gap semiconductor device and semiconductor module, and wide band gap semiconductor device and semiconductor module
#24Smart junction box for photovoltaic systems
#25Measuring apparatus
#26Methods, apparatus and system for screening process splits for technology development
#27Circuit and method for internally assessing dielectric reliability of a semiconductor technology
#28Testing of semiconductor devices and devices, and designs thereof
#29Semiconductor device, and method for manufacturing semiconductor device
#30Testing of integrated circuits with external clearance requirements
#31Method of testing semiconductor device
#32Partial SOI on power device for breakdown voltage improvement
#33Detection of electrical arcs in photovoltaic equipment
#34Method for measuring potential induced degradation of at least one solar cell or of a photovoltaic panel as well as the use of same method in the production of solar cells and photovoltaic panels
#35Device for high voltage testing of semiconductor components
#36Dielectric strength voltage testing method for electronics device
#37Overvoltage testing apparatus
#38Electronic test system and associated method
#39Jig for use in semiconductor test and method of measuring breakdown voltage by using the jig
#40Jig for semiconductor test
#41Detection of pre-catastrophic, stress induced leakage current conditions for dielectric layers
#42SYSTEM AND METHOD FOR DETECTING ISOLATION BARRIER BREAKDOWN
#43Transistor power switch device and method of measuring its characteristics
#44POWER MODULE AND METHOD FOR DETECTING INSULATION DEGRADATION THEREOF
#45Method of measuring electrical characteristics of semiconductor wafer
#46Testing device and testing method
#47Time dependent dielectric breakdown (TDDB) test structure of semiconductor device and method of performing TDDB test using the same
#48INSULATION TEST METHOD FOR LARGE-SCALE PHOTOVOLTAIC SYSTEMS
#49Electrostatic discharge withstand voltage evaluating device and electrostatic discharge withstand voltage evaluating method
#50System and method for measuring negative bias thermal instability with a ring oscillator
#51Evaluation method of insulating film and measurement circuit thereof
#52System and method for measuring negative bias thermal instability with a ring oscillator
#53Method for determining time dependent dielectric breakdown
#54System and method for measuring negative bias thermal instability with a ring oscillator
#55Method of evaluating semiconductor device and method of manufacturing semiconductor device
#56TDDB test pattern and method for testing TDDB of MOS capacitor dielectric
#57Method and apparatus for evaluating semiconductor device
#58Apparatus and method for detecting soft breakdown of a dielectric layer of a semiconductor wafer
#59Device for detecting interferences or interruptions of the inner fields smoothing layer of medium or high voltage cables
#60Method of determining localized electron tunneling in a capacitive structure
#61Probing apparatus and test method including electrical shielding
#62Electrostatic discharge testers for undistorted human-body-model and machine-model characteristics
#63Conductance-voltage (GV) based method for determining leakage current in dielectrics