171762 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of electronic circuits, e.g. by signal tracer Specific tests of electronic circuits not provided for elsewhere
Sub-classes:ENERGY MANAGEMENT SYSTEMS WITH ELECTRICAL OVERSTRESS PROTECTION
#2DISPLAY PANEL, TEST METHOD THEREOF, AND DISPLAY DEVICE
#3VOLTAGE MONITORING USING HIERARCHICAL TECHNIQUES FOR SAFETY CRITICAL APPLICATIONS
#4METHOD FOR DIAGNOSTIC ENERGY SHIFTING
#5Method and system for dynamically changing power supply rail setting based on input values
#6METHOD AND APPARATUS FOR MEASURING LINEARITY OF TESTED CIRCUIT
#7METHOD AND APPARATUS FOR TESTING ELECTRONIC DEVICES
#8MEASUREMENT SYSTEM AND METHOD OF DETERMINING A NOISE FIGURE OF A DEVICE UNDER TEST
#9ELECTRICAL ISOLATION CIRCUITRY
#10CIRCUIT BOARD HAVING AN EDGE CONTAINING CONDUCTIVE REGIONS
#11MEASUREMENT APPARATUS AND MEASUREMENT METHOD
#12Adapter device and method for measuring the signal power in a coaxial connection
#13TEST ARRANGEMENT FOR EMULATING THE PHASE CURRENTS OF AN ELECTRIC MOTOR, AND METHOD FOR TESTING A POWER ELECTRONIC CONTROL UNIT
#14TEST ARRANGEMENT FOR TESTING A POWER ELECTRONICS CONTROLLER
#15WEARABLE DEVICE WITH ENERGY HARVESTING
#16Calibrating processor system power consumption
#17METHODS OF TESTING BONDED WIRES ON WIRE BONDING MACHINES
#18Spark gap structures for detection and protection against electrical overstress events
#19System and method for circuit testing using remote cooperative devices
#20COMPUTING DEVICES FOR PREDICTING ELECTRICAL TESTS, ELECTRICAL TEST PREDICTION APPARATUSES HAVING THE SAME, AND OPERATING METHODS THEREOF
#21METHOD AND APPARATUS FOR DELIVERING A THERMAL SHOCK
#22System and method of testing single DUT through multiple cores in parallel
#23METHOD FOR PREDICTING ELECTRICAL CHARACTERISTICS OF SEMICONDUCTOR ELEMENT
#24Systems, methods, and apparatuses for intrusion detection and analytics using power characteristics such as side-channel information collection
#25Method of generating self-test signals, corresponding circuit and apparatus
#26Spark gap structures for detection and protection against electrical overstress events
#27INTEGRATED REQUIREMENTS DEVELOPMENT AND AUTOMATED GAP ANALYSIS FOR HARDWARE TESTING USING NATURAL LANGUAGE PROCESSING
#28Method and apparatus for delivering a thermal shock
#29Frequency detection circuit and method
#30System and method for monitoring activity over time-domain of electrical devices
#31Configuring an analog gain for a load test
#32Electrical overstress detection device
#33Test system and method of operating the same
#34System and method for circuit testing using remote cooperative devices
#35Methods and systems for wireless power source identification by generating one or more service set identifier (SSID) communication signals
#36Configuring an analog gain for a load test
#37Apparatus and method for providing a supply voltage to a device under test using a compensation signal injection
#38Spark gap structures for detection and protection against electrical overstress events
#39Electrostatic discharge shielding semiconductor device and electrostatic discharge testing method thereof
#40Systems and methods for high precision cable length measurement in a communication system
#41Systems, methods, and apparatuses for intrusion detection and analytics using power characteristics such as side-channel information collection
#42Squib circuit for fire protection system
#43Aging-sensitive recycling sensors for chip authentication
#44Circuit comparing method and electronic device
#45Autonomic supply voltage compensation for degradation of circuits over circuit lifetime
#46Method of generating self-test signals, corresponding circuit and apparatus
#47Electrical overstress detection device
#48Spike safe floating current and voltage source
#49Systems and methods for high precision cable length measurement in a communication system
#50CONTROL CIRCUIT AND CONTROL METHOD
#51Semiconductor device and semiconductor system
#52Systems, methods, and apparatuses for intrusion detection and analytics using power characteristics such as side-channel information collection
#53Battery simulator
#54Efficient method of retesting integrated circuits
#55Dual RF test connection in portable device
#56Ultra-sensitive, ultra-low power RF field sensor
#57Method and apparatus for electric arc detection
#58Semiconductor device
#59Radiometric test and configuration of an infrared focal plane array at wafer probe
#60Efficient method of retesting integrated circuits
#61Measuring apparatus
#62Continuous capacitor health monitoring and power supply system
#63System and method for converging current with target current in device under test
#64Detonator ignition protection and detection circuit
#65Counterfeit microelectronics detection based on capacitive and inductive signatures
#66Test device for testing plurality of samples and operating method thereof
#67Solid state wideband high impedance voltage converter
#68Non-contact probe measurement test bed for millimeter wave and terahertz circuits, integrated devices/components, systems for spectroscopy using sub-wavelength-size-samples
#69Electric circuit evaluation method
#70Detecting apparatus, wafer and electronic device
#71Input device transmitter path error diagnosis
#72USB peripheral device detection on an unpowered bus
#73System and method of determining an oscillator gain
#74Detecting operating conditions
#75Test apparatus
#76Method for diagnosing an electrical contact connection of an exhaust gas sensor
#77Frequency extension methods and apparatus for low-frequency electronic instrumentation
#78Input device transmitter path error diagnosis
#79DISCHARGE DEVICE AND TEST SYSTEM HAVING THE SAME
#80Automatic Stein Hall Viscosity Cup
#81Frequency extension methods and apparatus for low-frequency electronic instrumentation
#82Semiconductor test device
#83Field adaptable in-system test mechanisms
#84Aging-sensitive recycling sensors for chip authentication
#85Apparatus and method for security in an integrated circuit
#86Internal voltage monitoring for integrated circuit devices
#87Aging-sensitive recycling sensors for chip authentication
#88Systems, methods, and apparatuses for intrusion detection and analytics using power characteristics such as side-channel information collection