ClassID:

171762

G01R31/2832 - CPC Classification

Classification description:

Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of electronic circuits, e.g. by signal tracer Specific tests of electronic circuits not provided for elsewhere

Sub-classes:
Recent Application in this class:
#1
20250347722
2025-11-13

ENERGY MANAGEMENT SYSTEMS WITH ELECTRICAL OVERSTRESS PROTECTION

#2
20250251439
2025-08-07

DISPLAY PANEL, TEST METHOD THEREOF, AND DISPLAY DEVICE

#3
20250244374
2025-07-31

VOLTAGE MONITORING USING HIERARCHICAL TECHNIQUES FOR SAFETY CRITICAL APPLICATIONS

#4
20250199056
2025-06-19

METHOD FOR DIAGNOSTIC ENERGY SHIFTING

#5
20250147098
2025-05-08

Method and system for dynamically changing power supply rail setting based on input values

#6
20250138081
2025-05-01

METHOD AND APPARATUS FOR MEASURING LINEARITY OF TESTED CIRCUIT

#7
20250102561
2025-03-27

METHOD AND APPARATUS FOR TESTING ELECTRONIC DEVICES

#8
20250085334
2025-03-13

MEASUREMENT SYSTEM AND METHOD OF DETERMINING A NOISE FIGURE OF A DEVICE UNDER TEST

#9
20250067796
2025-02-27

ELECTRICAL ISOLATION CIRCUITRY

#10
20250063664
2025-02-20

CIRCUIT BOARD HAVING AN EDGE CONTAINING CONDUCTIVE REGIONS

#11
20240418768
2024-12-19

MEASUREMENT APPARATUS AND MEASUREMENT METHOD

#12
20240258750
2024-08-01

Adapter device and method for measuring the signal power in a coaxial connection

#13
20240201247
2024-06-20

TEST ARRANGEMENT FOR EMULATING THE PHASE CURRENTS OF AN ELECTRIC MOTOR, AND METHOD FOR TESTING A POWER ELECTRONIC CONTROL UNIT

#14
20240192265
2024-06-13

TEST ARRANGEMENT FOR TESTING A POWER ELECTRONICS CONTROLLER

#15
20240159804
2024-05-16

WEARABLE DEVICE WITH ENERGY HARVESTING

#16
20240069612
2024-02-29

Calibrating processor system power consumption

#17
20240014169
2024-01-11

METHODS OF TESTING BONDED WIRES ON WIRE BONDING MACHINES

#18
20230375600
2023-11-23

Spark gap structures for detection and protection against electrical overstress events

#19
20230194586
2023-06-22

System and method for circuit testing using remote cooperative devices

#20
20230108149
2023-04-06

COMPUTING DEVICES FOR PREDICTING ELECTRICAL TESTS, ELECTRICAL TEST PREDICTION APPARATUSES HAVING THE SAME, AND OPERATING METHODS THEREOF

#21
20230084486
2023-03-16

METHOD AND APPARATUS FOR DELIVERING A THERMAL SHOCK

#22
20220308109
2022-09-29

System and method of testing single DUT through multiple cores in parallel

#23
20220252658
2022-08-11

METHOD FOR PREDICTING ELECTRICAL CHARACTERISTICS OF SEMICONDUCTOR ELEMENT

#24
20220075869
2022-03-10

Systems, methods, and apparatuses for intrusion detection and analytics using power characteristics such as side-channel information collection

#25
20220003814
2022-01-06

Method of generating self-test signals, corresponding circuit and apparatus

#26
20210396788
2021-12-23

Spark gap structures for detection and protection against electrical overstress events

#27
20210256218
2021-08-19

INTEGRATED REQUIREMENTS DEVELOPMENT AND AUTOMATED GAP ANALYSIS FOR HARDWARE TESTING USING NATURAL LANGUAGE PROCESSING

#28
20210239575
2021-08-05

Method and apparatus for delivering a thermal shock

#29
20210141008
2021-05-13

Frequency detection circuit and method

#30
20210102993
2021-04-08

System and method for monitoring activity over time-domain of electrical devices

#31
20210080502
2021-03-18

Configuring an analog gain for a load test

#32
20200400725
2020-12-24

Electrical overstress detection device

#33
20200363465
2020-11-19

Test system and method of operating the same

#34
20200249262
2020-08-06

System and method for circuit testing using remote cooperative devices

#35
20200112380
2020-04-09

Methods and systems for wireless power source identification by generating one or more service set identifier (SSID) communication signals

#36
20200096563
2020-03-26

Configuring an analog gain for a load test

#37
20200011926
2020-01-09

Apparatus and method for providing a supply voltage to a device under test using a compensation signal injection

#38
20190293692
2019-09-26

Spark gap structures for detection and protection against electrical overstress events

#39
20190273077
2019-09-05

Electrostatic discharge shielding semiconductor device and electrostatic discharge testing method thereof

#40
20190257636
2019-08-22

Systems and methods for high precision cable length measurement in a communication system

#41
20190197237
2019-06-27

Systems, methods, and apparatuses for intrusion detection and analytics using power characteristics such as side-channel information collection

#42
20190083834
2019-03-21

Squib circuit for fire protection system

#43
20190018058
2019-01-17

Aging-sensitive recycling sensors for chip authentication

#44
20190005179
2019-01-03

Circuit comparing method and electronic device

#45
20180292879
2018-10-11

Autonomic supply voltage compensation for degradation of circuits over circuit lifetime

#46
20180188317
2018-07-05

Method of generating self-test signals, corresponding circuit and apparatus

#47
20180088155
2018-03-29

Electrical overstress detection device

#48
20170276724
2017-09-28

Spike safe floating current and voltage source

#49
20170276469
2017-09-28

Systems and methods for high precision cable length measurement in a communication system

#50
20170256341
2017-09-07

CONTROL CIRCUIT AND CONTROL METHOD

#51
20170067954
2017-03-09

Semiconductor device and semiconductor system

#52
20160342791
2016-11-24

Systems, methods, and apparatuses for intrusion detection and analytics using power characteristics such as side-channel information collection

#53
20160341787
2016-11-24

Battery simulator

#54
20160320444
2016-11-03

Efficient method of retesting integrated circuits

#55
20160223589
2016-08-04

Dual RF test connection in portable device

#56
20160124041
2016-05-05

Ultra-sensitive, ultra-low power RF field sensor

#57
20160116524
2016-04-28

Method and apparatus for electric arc detection

#58
20160087612
2016-03-24

Semiconductor device

#59
20160061883
2016-03-03

Radiometric test and configuration of an infrared focal plane array at wafer probe

#60
20150369862
2015-12-24

Efficient method of retesting integrated circuits

#61
20150362549
2015-12-17

Measuring apparatus

#62
20150318027
2015-11-05

Continuous capacitor health monitoring and power supply system

#63
20150316607
2015-11-05

System and method for converging current with target current in device under test

#64
20150233690
2015-08-20

Detonator ignition protection and detection circuit

#65
20150219714
2015-08-06

Counterfeit microelectronics detection based on capacitive and inductive signatures

#66
20150177309
2015-06-25

Test device for testing plurality of samples and operating method thereof

#67
20150137840
2015-05-21

Solid state wideband high impedance voltage converter

#68
20150102225
2015-04-16

Non-contact probe measurement test bed for millimeter wave and terahertz circuits, integrated devices/components, systems for spectroscopy using sub-wavelength-size-samples

#69
20140368212
2014-12-18

Electric circuit evaluation method

#70
20140197846
2014-07-17

Detecting apparatus, wafer and electronic device

#71
20140159742
2014-06-12

Input device transmitter path error diagnosis

#72
20140132083
2014-05-15

USB peripheral device detection on an unpowered bus

#73
20140031076
2014-01-30

System and method of determining an oscillator gain

#74
20140009168
2014-01-09

Detecting operating conditions

#75
20130229197
2013-09-05

Test apparatus

#76
20130219984
2013-08-29

Method for diagnosing an electrical contact connection of an exhaust gas sensor

#77
20130147500
2013-06-13

Frequency extension methods and apparatus for low-frequency electronic instrumentation

#78
20120188195
2012-07-26

Input device transmitter path error diagnosis

#79
20120161779
2012-06-28

DISCHARGE DEVICE AND TEST SYSTEM HAVING THE SAME

#80
20120158322
2012-06-21

Automatic Stein Hall Viscosity Cup

#81
20110084703
2011-04-14

Frequency extension methods and apparatus for low-frequency electronic instrumentation

#82
20050030069
2005-02-10

Semiconductor test device

#83
16428790
2020-08-18

Field adaptable in-system test mechanisms

#84
16014195
2019-05-28

Aging-sensitive recycling sensors for chip authentication

#85
15277494
2019-03-12

Apparatus and method for security in an integrated circuit

#86
15058014
2017-10-31

Internal voltage monitoring for integrated circuit devices

#87
14966224
2018-07-31

Aging-sensitive recycling sensors for chip authentication

#88
14881862
2016-08-09

Systems, methods, and apparatuses for intrusion detection and analytics using power characteristics such as side-channel information collection