APPARATUS FOR MEASURING A GATE LEAKAGE CURRENT OF A TRANSISTOR

LEAKAGE CURRENT DETECTION CIRCUIT

METHOD, DEVICE, AND SYSTEM FOR PROCESSING TRANSMISSION LINE PULSE DATA

STRESS CALIBRATION METHOD, CORRESPONDING ELECTRONIC DEVICE

MEASURING ARRANGEMENT FOR EXAMINING A LIGHT-EMITTING DIODE ASSEMBLY AND METHOD

Leakage testing structure and leakage testing method

SYSTEM FOR DETERMINING LEAKAGE CURRENT OF A FIELD EFFECT TRANSISTOR OVER TEMPERATURE

METHOD FOR MEASURING QUIESCENT CURRENT IN A SWITCHING VOLTAGE REGULATOR

Leakage current detection circuit

Method for measuring quiescent current in a switching voltage regulator

LOW CURRENT LEAKAGE MEASUREMENT ON A HIGH CURRENT UNIFIED STATIC AND DYNAMIC CHARACTERIZATION PLATFORM

Method and apparatus for detecting defective logic devices

Diode test module for monitoring leakage current and its method thereof

Power leakage testing

Leakage screening based on use-case power prediction

Non-invasive on-chip power measurement technique

Method and apparatus for detecting defective logic devices

Image-capturing unit and image-capturing apparatus

System for determining leakage current of a field effect transistor over temperature

IC device authentication using energy characterization

Method of high speed and dynamic configuration of a transceiver system

Semiconductor device reliability evaluation apparatus and semiconductor device reliability evaluation method

Back-to-back power switch controller

Semiconductor integrated circuit for detecting leakage current and earth leakage circuit breaker having the same

Performance testing method and measurement system

Image-capturing unit and image-capturing apparatus

IC device authentication using energy characterization

Power transistor leakage current with gate voltage less than threshold

Memory devices configured to perform leak checks

Leakage power characterization at high temperatures for an integrated circuit

Leakage current measurement circuit, integrated circuit and system including same

Test methods for packaged integrated circuits

Leakage current determination

Apparatus and method for detecting leakage current of high-power line of inverter of 48V mild hybrid system

Scan circuitry with IDDQ verification

Field-effect transistor and associated fault detection device

System, method and test layout for detecting leakage current

Leakage power characterization at high temperatures for an integrated circuit

Image-capturing unit and image-capturing apparatus

Method, device and computer program product for circuit testing

Leakage testing of integrated circuits using a logarithmic transducer and a voltmeter

Integrated circuit authentication

Test circuit and method of semiconductor integrated circuit

Method and device for determining a maximum leakage current

Integrated circuit testing with power collapsed

System and method for compensating measured IDDQ values

Compact model for device/circuit/chip leakage current (IDDQ) calculation including process induced uplift factors

Selective voltage binning leakage screen

Adaptive power control using timing canonicals

Integrated circuit characterization based on measured and static apparent resistances

Current tests for I/O interface connectors

Apparatus and method for IDDQ tests

Defect detection on characteristically capacitive circuit nodes

INTELLIGENT ANALYSIS METHOD OF LEAKAGE CURRENT DATA FOR CHIP CLASSIFICATION

Oscillation circuit and test circuit

Non-invasive leakage power device characterization of integrated circuits using device grouping and compressive sensing

TEST CIRCUIT AND METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT

Integrated circuit testing with power collapsed

Method and device for determining a maximum leakage current

IDDQ TESTING OF CMOS DEVICES

System and method for packet communication

ELECTRONIC CIRCUIT AND METHOD FOR OPERATING A CIRCUIT IN A STANDBY MODE AND IN AN OPERATIONAL MODE

Detection and compensation of multiplexer leakage current

AUTOMATED VERIFICATION AND ESTIMATION OF QUIESCENT POWER SUPPLY CURRENT

Quiescent current (IDDQ) indication and testing apparatus and methods

Adaptive Device Aging Monitoring and Compensation

Method and device for multi-dimensional processing using a single-state decision feedback equalizer

Compact model for device/circuit/chip leakage current (IDDQ) calculation including process induced uplift factors

Semiconductor device and its testing method

Multi-pair gigabit ethernet transceiver

Detection and compensation of multiplexer leakage current

Measurement of partially depleted silicon-on-insulator CMOS circuit leakage current under different steady state switching conditions

Non-invasive leakage power device characterization of integrated circuits using device grouping and compressive sensing

Semiconductor integrated circuit and method of testing circuit

PHY control module for a multi-pair gigabit transceiver

Apparatus for NBTI prediction

Method and circuit for measuring quiescent current

Multi-pair gigabit ethernet transceiver having adaptive disabling of circuit elements

DEVICE FOR MEASURING TEMPERATURE AND LEAKAGE CURRENT IN A CHIP

System and method for high-speed decoding and ISI compensation in a multi-pair transceiver system

Leakage current detection circuit and leakage current comparison circuit

SEMICONDUCTOR DEVICE AND SEMICONDUCTOR TESTING METHOD

Demodulator for a multi-pair gigabit transceiver

DYNAMIC REGULATION OF POWER CONSUMPTION OF A HIGH-SPEED COMMUNICATION SYSTEM

Test apparatus, test method, program, and recording medium reducing the influence of variations

Methods And Apparatus For Testing Electronic Circuits

High-speed decoder for a multi-pair gigabit transceiver

Detection control circuit for anti-leakage

Semiconductor device to detect abnormal leakage current caused by a defect

Measurement apparatus, test system, and measurement method for measuring a characteristic of a device

Test apparatus, test vector generate unit, test method, program, and recording medium

Physical coding sublayer for a multi-pair gigabit transceiver

Leak current detection circuit, body bias control circuit, semiconductor device, and semiconductor device testing method

Measurement apparatus, test apparatus and measurement method

Integrated circuit and a method for measuring a quiescent current of a module

Testable integrated circuit and IC test method

IDDQ testing

Method and apparatus for allocating inputs in microcontrollers, and corresponding microcontroller

Multi-pair gigabit Ethernet transceiver

Semiconductor integrated circuit and method for inspecting same

METHOD TO REDUCE TEST PROBE DAMAGE FROM EXCESSIVE DEVICE LEAKAGE CURRENTS

IDDQ test apparatus and test method

System and method to optimize semiconductor power by integration of physical design timing and product performance measurements

Supply current based testing of CMOS output stages

System and method to predict chip IDDQ and control leakage components

Methodologies and tool set for Iverification, debugging and failure diagnosis

Multi-pair gigabit ethernet transceiver

Current measuring apparatus

Characterizing across-die process variation

Method and apparatus for remotely buffering test channels

System and method for high-speed decoding and ISI compensation in a multi-pair transceiver system

PHY control module for a multi-pair gigabit transceiver

System and method for trellis decoding in a multi-pair transceiver system

Current measuring apparatus, test apparatus, current measuring method and test method

Method and apparatus for inspection and fault analysis

Integrated circuit testing methods using well bias modification

Integrated circuit testing methods using well bias modification

Method and circuit for measuring operating and leakage current of individual blocks within an array of test circuit blocks

Dynamic regulation of power consumption of a high-speed communication system

Semiconductor device and electronics device

Multi-pair gigabit ethernet transceiver

Unified model for process variations in integrated circuits

Hot Switchable Voltage Bus for Iddq Current Measurements

Compensation for leakage current from dynamic storage node variation by the utilization of an automatic self-adaptive keeper

Measurement apparatus and measurement method

Leakage power estimation

Determining leakage in matrix-structured electronic devices

Load generating apparatus and load testing method

Multi-pair gigabit ethernet transceiver

Integrated circuit testing method using well bias modification

Exhaustive diagnosis of bridging defects in an integrated circuit including multiple nodes using test vectors and IDDQ measurements

Monitoring system for detecting and characterizing classes of leakage in CMOS devices

Multi-pair gigabit ethernet transceiver having a single-state decision feedback equalizer

Method of NBTI prediction

Method of inspecting quiescent power supply current in semiconductor integrated circuit and device for executing the method

Semiconductor device and electronics device

Multi-pair gigabit ethernet transceiver having decision feedback equalizer

Multi-pair gigabit Ethernet transceiver having adaptive disabling of circuit elements

Timing recovery system for a multi-pair gigabit transceiver

Method for generating minimal leakage current input vector using heuristics

Dynamic logic with adaptive keeper

Semiconductor leakage current detector and leakage current measurement method, semiconductor leakage current detector with voltage trimming function and reference voltage trimming method, and semiconductor integrated circuit thereof

Testing radio frequency and analogue circuits

Method of using automated test equipment to screen for leakage inducing defects after calibration to intrinsic leakage

Method for testing transistors having an active region that is common with other transistors and a testing circuit for accomplishing the same

Direct current test apparatus

Methods and apparatus for testing electronic circuits

Leakage current detection circuit and leakage current comparison circuit

Apparatus for analyzing fault of semiconductor integrated circuit, method for the same, and computer readable medium for the same

Semiconductor integrated circuit device

Testing apparatus, and testing method

Method and apparatus for determining IDDQ

Methods and apparatus for incorporating IDDQ testing into logic BIST

High-speed decoder for a multi-pair gigabit transceiver

LSI testing apparatus for testing an electronic device

Systems and methods for testing packaged dies

Method for testing standby current of semiconductor package

Semiconductor device with mechanism for leak defect detection

System and method for IDDQ measurement in system on a chip (SOC) design

Leakage current reduction system and method

Methods of screening ASIC defects using independent component analysis of quiescent current measurements

Test apparatus, test method, electronic device, and electronic device manufacturing method

Method of predicting quiescent current variation of an integrated circuit die from a process monitor derating factor

Integrated circuit testing methods using well bias modification

LSI testing apparatus

System and method using locally heated island for integrated circuit testing

Method and apparatus for remotely buffering test channels

System and method for high-speed decoding and ISI compensation in a multi-pair transceiver system

AC testing of leakage current in integrated circuits using RC time constant

Dynamic register with IDDQ testing capability

Leakage testing for differential signal transceiver

Method and apparatus for iddq measuring

Smart capture for ATPG (automatic test pattern generation) and fault simulation of scan-based integrated circuits

Determining leakage in matrix-structured electronic devices

PHY control module for a multi-pair gigabit transceiver

Systems and methods for testing packaged dies

System and method for predicting burn-in conditions

System and method for measuring time dependent dielectric breakdown with a ring oscillator

System and method for measuring negative bias thermal instability with a ring oscillator

Device for monitoring quiescent current of an electronic device

Integrated circuit with leakage control and method for leakage control

Method and system for defect evaluation using quiescent power plane current (IDDQ) voltage linearity

Test system, test method and test program for an integrated circuit by IDDQ testing

Physical coding sublayer for a multi-pair gigabit transceiver

Predictive applications for devices with thin dielectric regions

LSI testing apparatus for testing an electronic device

Method and system for analyzing quiescent power plane current (IDDQ) test data in very-large scale integrated (VLSI) circuits

Pair-swap independent trellis decoder for a multi-pair gigabit transceiver

PHY control module for a multi-pair gigabit transceiver

Ethernet transceiver with single-state decision feedback equalizer

IDDQ testing of CMOS mixed-signal integrated circuits

Dynamic regulation of power consumption of a high-speed communication system

Dynamic register with IDDQ testing capability

IC device authentication using energy characterization

IC device authentication using energy characterization