171804 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of electronic circuits, e.g. by signal tracer; Marginal testing, e.g. by varying supply voltage; Current or voltage test Built-In-Current test [BIC]
CONTINUOUSLY VARIABLE ELECTRONIC LOAD TESTER FOR USE WITH NUCLEAR INSTRUMENTATION SYSTEM HIGH VOLTAGE POWER SUPPLIES
#2SIGNAL TESTING
#3CONTINUOUSLY VARIABLE ELECTRONIC LOAD TESTER FOR USE WITH NUCLEAR INSTRUMENTATION SYSTEM HIGH VOLTAGE POWER SUPPLIES
#4Sensor integrated circuit load current monitoring circuitry and associated methods
#5Sensor integrated circuit load current monitoring circuitry and associated methods
#6Scan circuitry with IDDQ verification
#7Apparatus and method using programmable reliability aging timer
#8Fault detection device, electrical instrument and fault detection method
#9Measuring power consumption in an integrated circuit
#10Semiconductor device and method of testing the same
#11Leak current detection circuit, body bias control circuit, semiconductor device, and semiconductor device testing method
#12Systems and Methods for Determining Variations in Voltages Applied to an Integrated Circuit Chip
#13Semiconductor device and method for inspecting the same
#14System and method for IDDQ measurement in system on a chip (SOC) design
#15Semiconductor device with test circuit disconnected from power supply connection
#16AC testing of leakage current in integrated circuits using RC time constant
#17Dynamic register with IDDQ testing capability
#18Current mirror multi-channel leakage current monitor circuit and method
#19IDDQ testing of CMOS mixed-signal integrated circuits
#20Dynamic register with IDDQ testing capability