171824 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of electronic circuits, e.g. by signal tracer; Testing of digital circuits Testing digital circuits including elements other than semiconductor transistors, e.g. biochips, nanofabrics, mems, chips with magnetic elements
3D INTEGRATED CIRCUIT WITH ENHANCED DEBUGGING CAPABILITY
#2Detecting a Function Section in a Representation of a Quantum Circuit
#3A METHOD OF PRECHARGING A SWITCHABLE FILTER
#4Detecting a function section in a representation of a quantum circuit
#53D INTEGRATED CIRCUIT WITH ENHANCED DEBUGGING CAPABILITY
#6SYSTEMS AND METHODS FOR ON-CHIP NOISE MEASUREMENTS
#7METHODS FOR DETERMINING THE CONVERSION FACTOR BETWEEN THE VOLTAGE APPLIED TO A SYSTEM AND A PARAMETER OF SAID SYSTEM, THE OSCILLATION PERIOD BETWEEN TWO SPIN STATES AND THE EXCHANGE INTERACTION BETWEEN TWO CHARGED PARTICLES AND SYSTEM THEREFOR
#8Method and system for creating dipole moment model
#9Injection device, semiconductor testing system and its testing method
#10Method and apparatus for crosstalk analysis of qubits, computer device, and storage medium
#11Test devices, test systems, and operating methods of test systems
#12Partitioned force-sense system for test equipment
#13Integrated circuit having state machine-driven flops in wrapper chains for device testing
#14In-field monitoring of on-chip thermal, power distribution network, and power grid reliability
#15Calibration method, calibration apparatus, and program
#16Current sensor and method for sensing a strength of an electric current
#17Systems for probing superconducting circuits including the use of a non-magnetic cryogenic heater
#18Injection device, semiconductor testing system and its testing method
#19External port measurement of qubit port responses
#20Symbolic backend for execution of quantum programs
#21External port measurement of qubit port responses
#22Microelectromechanical systems sensor testing device, system and method
#23Tester and method for testing a device under test and tester and method for determining a single decision function
#24Single pin test interface for pin limited systems
#25Method for determining characteristic parameters of an oscillator
#26Method for determining the quality factor of an oscillator
#27TEST DEVICE
#28Order O(1) algorithm for first-principles calculation of transient current through open quantum systems
#29DE-BUGGING ENVIRONMENT WITH SMART CARD
#30Detection of current change in an integrated circuit
#31Device and method for testing magnetic switches at wafer-level stage of manufacture
#32MEMS SENSOR WITH BUILT-IN SELF-TEST