172194 ⎘
Testing or calibrating of apparatus covered by the other groups of this subclass of cathode ray oscilloscopes
TEST FIXTURE, CALIBRATION SETUP AND METHOD OF CALIBRATING A TEST AND/OR MEASUREMENT INSTRUMENT
#2MULTIPLE OUTPUT INSTRUMENT CALIBRATOR
#3Method of customized setting as well as measurement system
#4Test system and method for testing a device under test having several communication lanes
#5PROBE FOR A SIGNAL ANALYZING DEVICE
#6Measuring device and a method for measuring a high-frequency signal with deembedding
#7CALIBRATION APPARATUS FOR PROBES
#8Method of calibrating interleaved digitizer channels
#9Oscilloscope probe calibrating system
#10System and method for calibrating oscillograph channels
#11Self-calibration circuit with gyrated output impedance
#12Sequential timebase
#13Signal analysis system and calibration method
#14Calibration method and apparatus using a trigger signal synchronous with a signal under test
#15Apparatus and method for processing a signal under test using a trigger signal synchronous with the signal under test for arbitrary impedance loads
#16Scaling method and apparatus for displaying signals
#17Sequential timebase