ClassID:

174548

G02B17/0626 - CPC Classification

Classification description:

Systems with reflecting surfaces, with or without refracting elements; Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using three curved mirrors

Sub-classes:
Recent Application in this class:
#1
20240011920
2024-01-11

PANEL INSPECTION DEVICE AND METHOD FOR INSPECTING A PANEL

#2
20220137162
2022-05-05

System and method for femtotesla direct magnetic gradiometer using a multipass cell

#3
20200057373
2020-02-20

Illumination system with flat 1D-patterned mask for use in EUV-exposure tool

#4
20190221599
2019-07-18

Freeform surface off-axial three-mirror imaging system

#5
20180210166
2018-07-26

Mounting optical elements in optical systems

#6
20180157017
2018-06-07

Method for designing off-axis aspheric optical system

#7
20180157016
2018-06-07

Off-axis aspheric three-mirror optical system

#8
20170285313
2017-10-05

Off-axis three-mirror optical system with freeform surfaces

#9
20160341948
2016-11-24

Korsch-type compact three-mirror anastigmat telescope

#10
20160170190
2016-06-16

Off-axis three-mirror optical system with freeform surfaces

#11
20150253552
2015-09-10

Off-axial three-mirror optical system with freeform surfaces

#12
20130063716
2013-03-14

Illumination optics for a metrology system for examining an object using EUV illumination light and metrology system comprising an illumination optics of this type

#13
20120257275
2012-10-11

Thermal wake control

#14
20120236400
2012-09-20

Method for producing an optical assembly having at least two optical functional surfaces, an optical device and unit for carrying out the method

#15
20090237784
2009-09-24

Pointable optical system with coude optics having a short on-gimbal path length

#16
20080123205
2008-05-29

Imaging optical system

#17
20070229994
2007-10-04

Pointable optical system with coude optics having a short on-gimbal path length

#18
20070109539
2007-05-17

Method and apparatus for detecting defects using focus compensation