174623 ⎘
Microscopes specially adapted for specific applications; Scanning microscopes; Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders; Optical details of the image generation focusing arrangements; selection of the plane to be imaged
ARRANGEMENT AND METHOD FOR IMAGE ACQUISITION ON A PROBER
#302Microscope having an adjustment device for the focus range
#303STAGE CONTROL DEVICE, STAGE CONTROL METHOD, STAGE CONTROL PROGRAM, AND MICROSCOPE
#304Microscope system and method of controlling a microscope system
#305Fluorescence image producing method, fluorescence image producing apparatus, and fluorescence image producing program
#306Speckle reduction method and apparatus
#307Arrangement for analyzing microscopic and macroscopic preparations
#308Systems for and methods of facilitating focusing an optical scanner
#309Microscope having internal focusing
#310MICROSCOPY SYSTEM WITH REVOLVABLE STAGE
#311Automated scanning cytometry using chromatic aberration for multiplanar image acquisition
#312Optical System for a Confocal Microscope
#313APPARATUS FOR REAL-TIME THREE-DIMENSIONAL LASER SCANNING MICROSCOPY, WITH DETECTION OF SINGLE- AND MULTI-PHOTON FLUORESCENCE AND OF HIGHER ORDER HARMONICS
#314Focusing apparatus and method
#315Analyzer and use thereof
#316Objective-coupled selective plane illumination microscopy
#317MICROSCOPY SYSTEM WITH REVOLVABLE STAGE
#318Confocal microscope
#319System and methods for thick specimen imaging using a microscope based tissue sectioning device
#320Microscope having an inclined optical axis and three-dimensional information acquisition method
#321Confocal optical system aperture detector that measures a light quantity balance of light received to detect a position displacement, and a confocal optical system aperture position controller, an optical head and a position detecting method performing the same
#322Apparatus and methods relating to spatially light modulated microscopy
#323Method and apparatus for screening chemical compounds
#324Light measuring apparatus
#325Device and method for generating an image of an object
#326Device and Method for Generating an Image of an Object
#327ARRANGEMENT AND METHOD FOR IMAGE ACQUISITION ON A PROBER
#328System and method for utilizing an autofocus feature in an automated microscope
#329Arrangement for microscopic observation and/or detection in a light scanning microscope with line scanning and use
#330MICROSCOPE
#331Laser-scanning microscope and microscope observation method
#332Computer-Tomography Microscope and Computer-Tomography Image Reconstruction Methods
#333Method for high speed microscopy with three-dimensional laser beam scanning
#334High-speed measuring device and method based on a confocal microscopy principle
#335Apparatus and methods relating to spatially light modulated microscopy
#336Speckle reduction method and apparatus
#337Systems and methods for force-fluorescence microscopy
#338System and method for utilizing an autofocus feature in an automated microscope
#339Microscope objective
#340Method for characterizing defects on semiconductor wafers
#341Raster microscope
#342Laser scanning microscope and image acquiring method of laser scanning microscope
#343Microscope objectives
#344Scanning examination apparatus, lens unit, and objective-lens adaptor
#345Systems for and methods of facilitating focusing an optical scanner
#346Method for generating high-contrast images of semiconductor sites via one-photon optical beam-induced current imaging and confocal reflectance microscopy
#347Image projector with a two-dimensional array of light-emitting units
#348Speckle reduction method and apparatus
#349High speed microscope with three-dimensional laser beam scanning including acousto-optic deflector for controlling the lateral position and collimation of the light beam
#350Method and apparatus for determining a vertical intensity profile through a plane of focus in a confocal microscope
#351Three-dimensional confocal microscope
#352Arrangement for microscopic observation and/or detection in a light scanning microscope with line scanning and use
#353Scanning optical microscope
#354Apparatus for optical measurement of an object
#355Confocal observation system
#356Confocal laser scanning microscopy apparatus
#357Method for improving the depth of field and resolution of microscopy
#358Sample information measuring method and scanning confocal microscope
#359Leaky guided wave modes used in interferometric confocal microscopy to measure properties of trenches
#360Confocal scanning microscope
#361Confocal microscope and measuring method by this confocal microscope
#362Microscope having a reference specimen
#363Confocal wafer-inspection system
#364Speckle reduction method and apparatus
#365Microscope system
#366Dark-field confocal microscopy measurement apparatus and method based on time-varying fractional-order vortex demodulation
#367Apparatus and methods for slide imaging
#368Virtual object display interface between a wearable device and a mobile device
#369Scanning microscope using a probe beam deflection technique (PBDT)
#370Variable focal length lens system including a focus state reference subsystem
#371Optical fiber connector inspector with two-dimensional scanning function
#372Systems and methods for performing quantitative phase-contrast confocal microscopy