ClassID:

177123

G03F7/423 - CPC Classification

Classification description:

Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor; Processing photosensitive materials; Apparatus therefor; Stripping or agents therefor using liquids only containing mineral acids or salts thereof, containing mineral oxidizing substances, e.g. peroxy compounds

Recent Application in this class:
#1
20250320437
2025-10-16

CLEANING COMPOSITION AND METHOD OF FORMING PHOTORESIST PATTERN USING THE SAME

#2
20250271768
2025-08-28

COMPOSITIONS FOR SELECTIVE REMOVAL OF POLYMERIC MATERIALS

#3
20240231237
2024-07-11

TREATMENT LIQUID, METHOD FOR WASHING SUBSTRATE, AND METHOD FOR REMOVING RESIST

#4
20240152056
2024-05-09

METHOD FOR TREATING A SUBSTRATE

#5
20240134284
2024-04-25

TREATMENT LIQUID, METHOD FOR WASHING SUBSTRATE, AND METHOD FOR REMOVING RESIST

#6
20240103377
2024-03-28

Etching Composition And Method For EUV Mask Protective Structure

#7
20220373888
2022-11-24

Silicon-containing resist underlayer film-forming composition including organic group having ammonium group

#8
20220317574
2022-10-06

Wafer processing device and method

#9
20220260919
2022-08-18

Treatment liquid, method for washing substrate, and method for removing resist

#10
20220082756
2022-03-17

Process flow with wet etching for smooth sidewalls in silicon nitride waveguides

#11
20210397093
2021-12-23

Silicon-containing underlayers

#12
20210181635
2021-06-17

Semiconductor device production method employing silicon-containing resist underlayer film-forming composition including organic group having ammonium group

#13
20210163850
2021-06-03

Method for producing ozone water

#14
20210130750
2021-05-06

Cleaning agent and preparation method and use thereof

#15
20210043440
2021-02-11

Method of producing heated ozone water, heated ozone water, and semiconductor wafer-cleaning liquid

#16
20200241423
2020-07-30

APPARATUS FOR REMOVING PHOTORESISTS AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME

#17
20200152443
2020-05-14

Substrate processing apparatus

#18
20200075358
2020-03-05

Photonically tuned etchant reactivity for wet etching

#19
20200071640
2020-03-05

Thinner composition

#20
20200066509
2020-02-27

UV-assisted stripping of hardened photoresist to create chemical templates for directed self-assembly

#21
20190265593
2019-08-29

SILICON-CONTAINING RESIST UNDERLAYER FILM-FORMING COMPOSITION CONTAINING ORGANIC GROUP HAVING DIHYDROXY GROUP

#22
20190256805
2019-08-22

Cleaning solution and method for cleaning substrate

#23
20190233771
2019-08-01

Stripping compositions for removing photoresists from semiconductor substrates

#24
20190146343
2019-05-16

SILICON-CONTAINING UNDERLAYERS

#25
20190079409
2019-03-14

Treatment liquid, method for washing substrate, and method for removing resist

#26
20190071623
2019-03-07

Treatment liquid, method for washing substrate, and method for removing resist

#27
20190043708
2019-02-07

Substrate processing method and substrate processing device

#28
20190041753
2019-02-07

Resist multilayer film-attached substrate and patterning process

#29
20180284616
2018-10-04

Substrate processing apparatus, substrate processing method and recording medium

#30
20180240680
2018-08-23

Use of non-oxidizing strong acids for the removal of ion-implanted resist

#31
20180229149
2018-08-16

Methods and systems for generating process gases

#32
20180204764
2018-07-19

Post-etch residue removal for advanced node beol processing

#33
20180201884
2018-07-19

Cleaning compositions and methods of use therefor

#34
20180173109
2018-06-21

Lithographic mask layer

#35
20180151351
2018-05-31

Photoresist with gradient composition for improved uniformity

#36
20180105774
2018-04-19

Cleaning formulations

#37
20180071772
2018-03-15

Substrate processing method and substrate processing device

#38
20180047580
2018-02-15

Photoresist removal

#39
20170343900
2017-11-30

Embossing lacquer and method for embossing, and substrate surface coated with the embossing lacquer

#40
20170335252
2017-11-23

Stripping compositions for removing photoresists from semiconductor substrates

#41
20170335248
2017-11-23

Alkaline earth metal-containing cleaning solution for cleaning semiconductor element, and method for cleaning semiconductor element using same

#42
20170162400
2017-06-08

Substrate treatment apparatus and substrate treatment method

#43
20170087585
2017-03-30

Method for treating substrates with an aqueous liquid medium exposed to UV-radiation

#44
20170059996
2017-03-02

Substrate processing apparatus

#45
20170037499
2017-02-09

Substrate liquid processing apparatus, substrate liquid processing method, and storage medium

#46
20170025268
2017-01-26

Substrate liquid processing apparatus, substrate liquid processing method, and storage medium

#47
20160322232
2016-11-03

USE OF NON-OXIDIZING STRONG ACIDS FOR THE REMOVAL OF ION-IMPLANTED RESIST

#48
20160312162
2016-10-27

Removal composition for selectively removing hard mask and methods thereof

#49
20160284535
2016-09-29

METHOD FOR WET STRIPPING SILICON-CONTAINING ORGANIC LAYERS

#50
20160254182
2016-09-01

Removal composition for selectively removing hard mask and methods thereof

#51
20160208201
2016-07-21

Cleaning liquid for lithography and method for forming wiring

#52
20160186106
2016-06-30

Stripping compositions for removing photoresists from semiconductor substrates

#53
20160186105
2016-06-30

Stripping compositions having high WN/W etching selectivity

#54
20160179011
2016-06-23

Semi-aqueous photoresist or semiconductor manufacturing residue stripping and cleaning composition with improved silicon passivation

#55
20160130500
2016-05-12

Compositions and methods for selectively etching titanium nitride

#56
20160093486
2016-03-31

Substrate processing apparatus and substrate processing method

#57
20160032186
2016-02-04

Compositions and methods for selectively etching titanium nitride

#58
20150315037
2015-11-05

Pressure-less ozonated DI-water (DIO) recirculation reclaim system

#59
20150262835
2015-09-17

Method and apparatus of patterning a semiconductor device

#60
20150261087
2015-09-17

Photoresist system and method

#61
20150252311
2015-09-10

Cleaning composition, cleaning process, and process for producing semiconductor device

#62
20150168843
2015-06-18

Composition and process for stripping photoresist from a surface including titanium nitride

#63
20150104952
2015-04-16

METHOD AND COMPOSITION FOR SELECTIVELY REMOVING METAL HARDMASK AND OTHER RESIDUES FROM SEMICONDUCTOR DEVICE SUBSTRATES COMPRISING LOW-K DIELECTRIC MATERIAL AND COPPER

#64
20150094249
2015-04-02

Aqueous solution and process for removing substances from substrates

#65
20150094248
2015-04-02

Metal and dielectric compatible sacrificial anti-reflective coating cleaning and removal composition

#66
20150064928
2015-03-05

Photoresist removal

#67
20150064917
2015-03-05

UV-assisted stripping of hardened photoresist to create chemical templates for directed self-assembly

#68
20140256155
2014-09-11

Cleaning solution comprising an ether acetate for preventing pattern collapse

#69
20140213498
2014-07-31

Photoresist removal

#70
20140209129
2014-07-31

Method and apparatus for surface treatment using inorganic acid and ozone

#71
20140144463
2014-05-29

Controlling cleaning of a layer on a substrate using nozzles

#72
20140137892
2014-05-22

Method and system of process chemical temperature control using an injection nozzle

#73
20140124036
2014-05-08

Pressure-less ozonated Di-water (DIO) recirculation reclaim system

#74
20140103251
2014-04-17

Compositions for use in semiconductor devices

#75
20140076356
2014-03-20

COMPOSITION OF SOLUTIONS AND CONDITIONS FOR USE ENABLING THE STRIPPING AND COMPLETE DISSOLUTION OF PHOTORESISTS

#76
20130323931
2013-12-05

Device manufacturing and cleaning method

#77
20130319465
2013-12-05

METHOD AND SYSTEM FOR RAPID MIXING OF PROCESS CHEMICALS USING AN INJECTION NOZZLE

#78
20130303420
2013-11-14

Composition for and method of suppressing titanium nitride corrosion

#79
20130284212
2013-10-31

Method for processing a substrate and apparatus for performing the same

#80
20130233351
2013-09-12

Sequential stage mixing for a resist batch strip process

#81
20130233343
2013-09-12

Sequential stage mixing for single substrate strip processing

#82
20130167883
2013-07-04

METHOD AND DEVICE TO ENABLE SEMICONDUCTOR PROCESSING IN SOLUTION THAT GENERATES PARTICLES

#83
20130143406
2013-06-06

Techniques providing photoresist removal

#84
20130126470
2013-05-23

Stripping solution for photolithography and pattern formation method

#85
20130123159
2013-05-16

Aqueous cerium-containing solution having an extended bath lifetime for removing mask material

#86
20130115782
2013-05-09

Process for removing material from substrates

#87
20130048021
2013-02-28

Methods for cleaning a semiconductor substrate

#88
20130025636
2013-01-31

Substrate treatment device and substrate treatment method

#89
20130014784
2013-01-17

Liquid process apparatus and liquid process method

#90
20120302483
2012-11-29

Photoresist removal

#91
20120276724
2012-11-01

Spin-on formulation and method for stripping an ion implanted photoresist

#92
20120270763
2012-10-25

Spin-on formulation and method for stripping an ion implanted photoresist

#93
20120244690
2012-09-27

ION IMPLANTED RESIST STRIP WITH SUPERACID

#94
20120216828
2012-08-30

SUBSTRATE CLEANING DEVICE AND SUBSTRATE CLEANING METHOD

#95
20120172274
2012-07-05

Resist remover composition and method for removing resist using the composition

#96
20120157368
2012-06-21

Processing agent composition for semiconductor surface and method for processing semiconductor surface using same

#97
20120138097
2012-06-07

Method and apparatus for surface treatment using inorganic acid and ozone

#98
20120125368
2012-05-24

LIQUID PROCESSING METHOD, LIQUID PROCESSING APPARATUS AND STORAGE MEDIUM STORING PROGRAM FOR PERFORMING LIQUID PROCESSING METHOD

#99
20120108486
2012-05-03

Compositions and methods for removing organic substances

#100
20120108485
2012-05-03

Multi-agent type cleaning kit for semiconductor substrates, cleaning method using the same and method of producing semiconductor element

#101
20120094887
2012-04-19

Method for supplying hydroxyl radical-containing water and apparatus for supplying hydroxyl radical-containing water

#102
20120073610
2012-03-29

Cleaning agent for semiconductor substrate, cleaning method using the cleaning agent, and method for producing semiconductor element

#103
20120052687
2012-03-01

Enhanced stripping of implanted resists

#104
20120028871
2012-02-02

Stripping compositions for cleaning ion implanted photoresist from semiconductor device wafers

#105
20120012134
2012-01-19

METHOD FOR CLEANING ELECTRONIC MATERIAL AND DEVICE FOR CLEANING ELECTRONIC MATERIAL

#106
20110275221
2011-11-10

METHOD FOR TREATMENT SUBSTRATES AND TREATMENT COMPOSITION FOR SAID METHOD

#107
20110220286
2011-09-15

Solution supplying unit and substrate treating apparatus having the same

#108
20110217848
2011-09-08

PHOTORESIST REMOVING PROCESSOR AND METHODS

#109
20110187010
2011-08-04

SEMICONDUCTOR CLEANING USING SUPERACIDS

#110
20110159670
2011-06-30

Method and apparatus of patterning a semiconductor device

#111
20110151653
2011-06-23

Spin-on formulation and method for stripping an ion implanted photoresist

#112
20110146726
2011-06-23

PROCESS FOR CLEANING SEMICONDUCTOR ELEMENT

#113
20110143550
2011-06-16

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, APPARATUS FOR PROCESSING SUBSTRATE, AND COMPUTER READABLE MEDIUM

#114
20110143549
2011-06-16

ETCHING METHOD, METHOD FOR MANUFACTURING MICROSTRUCTURE, AND ETCHING APPARATUS

#115
20110140181
2011-06-16

Removal of masking material

#116
20110136717
2011-06-09

Formulations and method for post-CMP cleaning

#117
20110132400
2011-06-09

Method and system for uniformly applying a multi-phase cleaning solution to a substrate

#118
20110130009
2011-06-02

METHOD AND APPARATUS FOR SURFACE TREATMENT USING A MIXTURE OF ACID AND OXIDIZING GAS

#119
20110086499
2011-04-14

Method for removing photoresist

#120
20110076852
2011-03-31

Cleaning composition, cleaning process, and process for producing semiconductor device

#121
20110073490
2011-03-31

CLEANING METHOD, CLEANING SYSTEM, AND METHOD FOR MANUFACTURING MICROSTRUCTURE

#122
20110073489
2011-03-31

CLEANING LIQUID, CLEANING METHOD, CLEANING SYSTEM, AND METHOD FOR MANUFACTURING MICROSTRUCTURE

#123
20110046035
2011-02-24

METHOD FOR TREATING A LITHOGRAPHIC PRINTING PLATE

#124
20110039747
2011-02-17

COMPOSITION AND METHOD FOR REMOVING ION-IMPLANTED PHOTORESIST

#125
20110036776
2011-02-17

PROCESSING METHOD OF LIQUID

#126
20110017606
2011-01-27

Electrolysis method

#127
20100328809
2010-12-30

Method for removing resist and for producing a magnetic recording medium, and systems thereof

#128
20100326477
2010-12-30

Process for treatment of substrates with water vapor or steam

#129
20100326476
2010-12-30

METHOD FOR PROCESSING A SUBSTRATE AND APPARATUS FOR PERFORMING THE SAME

#130
20100317556
2010-12-16

Two-phase substrate cleaning material

#131
20100313918
2010-12-16

Apparatus for cleaning contaminants from substrate

#132
20100304554
2010-12-02

PRODUCTION METHOD FOR SEMICONDUCTOR DEVICE

#133
20100300482
2010-12-02

Method of removing resist and apparatus therefor

#134
20100275951
2010-11-04

Semiconductor processing method

#135
20100267225
2010-10-21

Method of manufacturing semiconductor device

#136
20100242998
2010-09-30

Compositions and methods for removing organic substances

#137
20100175715
2010-07-15

Combinatorial approach to the development of cleaning formulations for wet removal of high dose implant photoresist

#138
20100175714
2010-07-15

Substrate processing apparatus and substrate processing method

#139
20100173251
2010-07-08

Photoresist residue removal composition

#140
20100154836
2010-06-24

Processing system, processing method, and storage medium

#141
20100147334
2010-06-17

Coated-type silicon-containing film stripping process

#142
20100139708
2010-06-10

Method of removing resist and apparatus therefor

#143
20100137181
2010-06-03

Compositions for reducing metal etch rates using stripper solutions containing copper salts

#144
20100136794
2010-06-03

METHOD FOR REMOVING ETCHING RESIDUES FROM SEMICONDUCTOR COMPONENTS

#145
20100093128
2010-04-15

METHOD FOR MANUFACTURING IMAGE SENSOR

#146
20100059088
2010-03-11

Method and apparatus for removing contamination from substrate

#147
20100056411
2010-03-04

Treating liquid for photoresist removal and method for treating substrate

#148
20100051066
2010-03-04

COMPOSITION FOR REMOVING RESIDUE FROM WIRING BOARD AND CLEANING METHOD

#149
20100029085
2010-02-04

Cleaning composition and process for producing semiconductor device

#150
20100018951
2010-01-28

Apparatus for removing material from one or more substrates

#151
20090325390
2009-12-31

Cleaning method by electrolytic sulfuric acid and manufacturing method of semiconductor device

#152
20090288689
2009-11-26

ULTRASONIC CLEANING SYSTEM FOR REMOVING HIGH DOSE ION IMPLANTED PHOTORESIST IN SUPERCRITICAL CARBON DIOXIDE

#153
20090283114
2009-11-19

Substrate processing method and substrate processing apparatus

#154
20090281016
2009-11-12

Low pH mixtures for the removal of high density implanted resist

#155
20090270300
2009-10-29

Composition for removing protective layer in fabrication of mems and method for removing same

#156
20090270299
2009-10-29

Composition for removing protective layer in fabrication of MEMS and method for removing same

#157
20090241988
2009-10-01

PHOTORESIST AND ANTIREFLECTIVE LAYER REMOVAL SOLUTION AND METHOD THEREOF

#158
20090226847
2009-09-10

Method of reducing photoresist defects during fabrication of a semiconductor device

#159
20090224438
2009-09-10

Rapid prototyping method and radiation-curable composition for use therein

#160
20090211610
2009-08-27

METHOD FOR TREATING A SUBSTRATE

#161
20090176677
2009-07-09

Treating liquid for photoresist removal, and method for treating substrate

#162
20090152600
2009-06-18

PROCESS FOR REMOVING ION-IMPLANTED PHOTORESIST

#163
20090117500
2009-05-07

PHOTORESIST STRIP WITH OZONATED ACETIC ACID SOLUTION

#164
20090111277
2009-04-30

WET PHOTORESIST STRIP FOR WAFER BUMPING WITH OZONATED ACETIC ANHYDRIDE

#165
20090100764
2009-04-23

Composition for removing photoresist layer and method for using it

#166
20090099051
2009-04-16

Aqueous fluoride compositions for cleaning semiconductor devices

#167
20090095320
2009-04-16

Composition for Removing Photresist Layer and Method for Using it

#168
20090082240
2009-03-26

STRIPPING LIQUID FOR SEMICONDUCTOR DEVICE, AND STRIPPING METHOD

#169
20090044838
2009-02-19

OZONATION FOR ELIMINATION OF BACTERIA FOR WET PROCESSING SYSTEMS

#170
20090036344
2009-02-05

Reduced metal etch rates using stripper solutions containing a copper salt

#171
20090001314
2009-01-01

Compositions for use in semiconductor devices

#172
20080318424
2008-12-25

Photoresist residue remover composition and semiconductor circuit element production process employing the same

#173
20080296767
2008-12-04

Composition for cleaning semiconductor device

#174
20080293252
2008-11-27

Resist removing method and resist removing apparatus

#175
20080283796
2008-11-20

Compositions for Dissolution of Low-K Dielectric Films, and Methods of Use

#176
20080283090
2008-11-20

Process for treatment of substrates with water vapor or steam

#177
20080280803
2008-11-13

Composition for the removal of sidewall residues

#178
20080261846
2008-10-23

Compositions for the removal of post-etch and ashed photoresist residues and bulk photoresist

#179
20080242575
2008-10-02

Treating liquid for photoresist removal, and method for treating substrate

#180
20080242574
2008-10-02

Metal and dielectric compatible sacrificial anti-reflective coating cleaning and removal composition

#181
20080171682
2008-07-17

Compositions for cleaning ion implanted photoresist in front end of line applications

#182
20080153040
2008-06-26

Method for processing semiconductor wafer

#183
20080149135
2008-06-26

WET PHOTORESIST STRIPPING PROCESS AND APPARATUS

#184
20080142478
2008-06-19

Epoxy removal process for microformed electroplated devices

#185
20080110766
2008-05-15

Cleaning system and cleaning method

#186
20080108223
2008-05-08

Integrated etch and supercritical COprocess and chamber design

#187
20080092925
2008-04-24

REMOVING PHOTORESIST FROM SUBSTRATES BY MEANS OF TREATMENT LIQUID, AND PROCESSING TREATEMENT LIQUID WITH OZONE

#188
20080083427
2008-04-10

POST ETCH RESIDUE REMOVAL FROM SUBSTRATES

#189
20080078424
2008-04-03

METHODS TO ACCELERATE PHOTOIMAGEABLE MATERIAL STRIPPING FROM A SUBSTRATE

#190
20080076689
2008-03-27

System using ozonated acetic anhydride to remove photoresist materials

#191
20080076260
2008-03-27

Separation-material composition for photo-resist and manufacturing method of semiconductor device

#192
20080076076
2008-03-27

REWORK METHODOLOGY THAT PRESERVES GATE PERFORMANCE

#193
20080060682
2008-03-13

HIGH TEMPERATURE SPM TREATMENT FOR PHOTORESIST STRIPPING

#194
20080053478
2008-03-06

SUBSTRATE-PROCESSING METHOD AND METHOD OF MANUFACTURING ELECTRONIC DEVICE

#195
20080011714
2008-01-17

Photoresist stripping solution and a method of stripping photoresists using the same

#196
20080006305
2008-01-10

Resist, barc and gap fill material stripping chemical and method

#197
20080006295
2008-01-10

Semiconductor manufacturing apparatus for use in process of cleaning semiconductor substrate and method of manufacturing semiconductor device using the same

#198
20070298596
2007-12-27

Method of removing a photoresist pattern, method of forming a dual polysilicon layer using the removing method and method of manufacturing a semiconductor device using the removing

#199
20070269990
2007-11-22

Method of removing ion implanted photoresist

#200
20070240740
2007-10-18

Cleaning of contaminated articles by aqueous supercritical oxidation

#201
20070232513
2007-10-04

Microelectronic cleaning compositions containing ammonia-free fluoride salts for selective photoresist stripping and plasma ash residue cleaning

#202
20070227556
2007-10-04

METHODS FOR REMOVING PHOTORESIST

#203
20070221252
2007-09-27

HIGH-PRESSURE PROCESSING METHOD

#204
20070207938
2007-09-06

Cleaning compositions and methods of use thereof

#205
20070204885
2007-09-06

Substrate processing apparatus for resist film removal

#206
20070181165
2007-08-09

Stripping and removal of organic-containing materials from electronic device substrate surfaces

#207
20070161248
2007-07-12

Process for removing material from substrates

#208
20070161243
2007-07-12

Aqueous solution for removing post-etch residue

#209
20070158302
2007-07-12

Systems and methods for gas assisted resist removal

#210
20070154636
2007-07-05

SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS

#211
20070131254
2007-06-14

Washing apparatus with bubbling reaction and a washing method of using bubbling reaction

#212
20070123052
2007-05-31

Process sequence for photoresist stripping and cleaning of photomasks for integrated circuit manufacturing

#213
20070114208
2007-05-24

SUBSTRATE TREATING METHOD AND APPARATUS

#214
20070105035
2007-05-10

Photoresist stripping solution and method of treating substrate with the same

#215
20070102117
2007-05-10

Substrate processing system and substrate processing method

#216
20070095366
2007-05-03

Stripping and cleaning of organic-containing materials from electronic device substrate surfaces

#217
20070093068
2007-04-26

Manufacturing method of semiconductor device

#218
20070087950
2007-04-19

Method and system for using a two-phases substrate cleaning compound

#219
20070084485
2007-04-19

Method and apparatus for cleaning a semiconductor substrate

#220
20070084483
2007-04-19

Method and apparatus for cleaning a semiconductor substrate

#221
20070082496
2007-04-12

Resist film removing method

#222
20070079848
2007-04-12

Method and apparatus for removing contamination from substrate

#223
20070077769
2007-04-05

Method of removing organic contaminants from a semiconductor surface

#224
20070068552
2007-03-29

Ozonation for elimination of bacteria for wet processing systems

#225
20070066502
2007-03-22

Stripper for electronics

#226
20070045231
2007-03-01

Resist removing method and resist removing apparatus

#227
20070037396
2007-02-15

Semiconductor processing using energized hydrogen gas and in combination with wet cleaning

#228
20070037087
2007-02-15

Photoresist stripping solution and a method of stripping photoresists using the same

#229
20060292491
2006-12-28

Method of treating and removing a photoresist pattern and method of manufacturing a semiconductor device using the same

#230
20060263730
2006-11-23

Surface treatment of a dry-developed hard mask and surface treatment compositions used therefor

#231
20060263729
2006-11-23

Surface treatment of a dry-developed hard mask and surface treatment compositions used therefor

#232
20060255315
2006-11-16

Selective removal chemistries for semiconductor applications, methods of production and uses thereof

#233
20060199749
2006-09-07

Method to remove resist, etch residue, and copper oxide from substrates having copper and low-k dielectric material

#234
20060196527
2006-09-07

Method of surface processing substrate, method of cleaning substrate, and programs for implementing the methods

#235
20060183248
2006-08-17

Semiconductor cleaning using superacids

#236
20060138399
2006-06-29

Removing solution

#237
20060130966
2006-06-22

Method and system for flowing a supercritical fluid in a high pressure processing system

#238
20060127818
2006-06-15

Method for manufacturing high-transmittance optical filter for image display devices

#239
20060124588
2006-06-15

System and method for reducing metal oxides with hydrogen radicals

#240
20060118522
2006-06-08

Etching composition and use thereof with feedback control of HF in BEOL clean

#241
20060110690
2006-05-25

Treating liquid for photoresist removal, and method for treating substrate

#242
20060088784
2006-04-27

Effective photoresist stripping process for high dosage and high energy ion implantation

#243
20060086372
2006-04-27

Composition for the removing of sidewall residues

#244
20060084260
2006-04-20

Copper processing using an ozone-solvent solution

#245
20060079096
2006-04-13

Computer readable storage medium for controlling substrate processing apparatus

#246
20060070979
2006-04-06

Using ozone to process wafer like objects

#247
20060063688
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Photoresist stripping solution and method of treating substrate with the same

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2006-03-02

Semiconductor processing using energized hydrogen gas and in combination with wet cleaning

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2006-03-02

Stripping composition for removing a photoresist and method of manufacturing TFT substrate for a liquid crystal display device using the same

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2006-02-23

Supercritical carbon dioxide/chemical formulation for removal of photoresists

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2006-02-23

Cleaning composition and method

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2006-02-23

Semiconductor fabrication methods and apparatus

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20060024972
2006-02-02

Silicon recess improvement through improved post implant resist removal and cleans

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2006-01-05

Method and apparatus for stripping photo-resist

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Composition for removing photoresist residue and polymer residue

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Photoresist stripper composition

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2005-12-08

Wet cleaning apparatus and methods

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Remover compositions for dual damascene system

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Compositions and processes for photoresist stripping and residue removal in wafer level packaging

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Process for removing organic materials during formation of a metal interconnect

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2005-11-03

Resist removing apparatus and method of removing resist

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Microelectronic cleaning compositions containing oxidizers and organic solvents

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2005-09-22

Photoresist residue remover composition and semiconductor circuit element production process employing the same

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Resist stripping method and resist stripping apparatus

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Compositions for cleaning organic and plasma etched residues for semiconductor devices

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Composition and process for post-etch removal of photoresist and/or sacrificial anti-reflective material deposited on a substrate

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Surface treatment of a dry-developed hard mask and surface treatment compositions used therefor

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Semiconductor processing methods

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Cleaning solution, method for cleaning semiconductor substrate using the same, and method for forming metal wiring

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Method and apparatus for treating a substrate with an ozone-solvent solution III

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Microelectronic cleaning composition containing halogen oxygen acids, salts and derivatives thereof

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Electrolytic method for photoresist stripping

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Method for manufacturing a semiconductor device and a cleaning device for stripping resist

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2005-07-21

Method of integrating post-etching cleaning process with deposition for semiconductor device

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Composition for cleaning semiconductor device

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2005-06-02

Gas assisted method for applying resist stripper and gas-resist stripper combinations

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2005-04-21

Photoresist stripping solution and a method of stripping photoresists using the same

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2005-03-10

Detergent composition

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2005-03-03

FRAM capacitor stack clean

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2005-02-03

Process sequence for photoresist stripping and/or cleaning of photomasks for integrated circuit manufacturing

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2005-01-20

Aqueous fluoride compositions for cleaning semiconductor devices

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2005-01-20

Substrate processing apparatus for resist film removal

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2005-01-06

Composition for cleaning