ClassID:

177138

G03F7/70083 - CPC Classification

Classification description:

Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor; Exposure apparatus for microlithography; Mask illumination systems Non-homogeneous intensity distribution in the mask plane

Recent Application in this class:
#1
20250321493
2025-10-16

METHOD FOR MANUFACTURING A MICRO-NANOMETRIC HIERARCHICAL STRUCTURE AND MICRO-NANOMETRIC HIERARCHICAL STRUCTURE OBTAINED BY SUCH A METHOD

#2
20220390832
2022-12-08

OPTIMIZATION USING A NON-UNIFORM ILLUMINATION INTENSITY PROFILE

#3
20220214622
2022-07-07

Lithographic apparatus and illumination uniformity correction system

#4
20200218850
2020-07-09

Fast freeform source and mask co-optimization method

#5
20200098486
2020-03-26

Method and apparatus for determining a radiation beam intensity profile

#6
20190258170
2019-08-22

Method for determining an imaging aberration contribution of an imaging optical unit for measuring lithography masks

#7
20190113850
2019-04-18

Light intensity modulation method

#8
20190056669
2019-02-21

Lithographic apparatus and associated method

#9
20180335702
2018-11-22

Illumination system for illuminating a mask in a microlithographic exposure apparatus

#10
20180314162
2018-11-01

ILLUMINATION OPTICAL APPARATUS, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD

#11
20180239861
2018-08-23

Fast freeform source and mask co-optimization method

#12
20180196351
2018-07-12

Lithographic apparatus and method

#13
20180164691
2018-06-14

PROJECTION EXPOSURE METHODS AND SYSTEMS

#14
20180136565
2018-05-17

PROJECTION EXPOSURE METHOD AND PROJECTION EXPOSURE APPARATUS FOR MICROLITHOGRAPHY

#15
20170351183
2017-12-07

Illumination system for illuminating a mask in a microlithographic exposure apparatus

#16
20170329231
2017-11-16

METHOD AND APPARATUS FOR USING PATTERNING DEVICE TOPOGRAPHY INDUCED PHASE

#17
20170315451
2017-11-02

Divisional exposure apparatus and method of manufacturing liquid crystal display using the same

#18
20170192361
2017-07-06

Illumination system for microlithography

#19
20160209754
2016-07-21

Projection exposure method and projection exposure apparatus for microlithography

#20
20160187789
2016-06-30

Illumination system for illuminating a mask in a microlithographic exposure apparatus

#21
20160181133
2016-06-23

Substrate processing apparatus and substrate processing method

#22
20160161858
2016-06-09

Illumination system for microlithography

#23
20160154316
2016-06-02

Illumination optical unit for EUV projection lithography

#24
20160109809
2016-04-21

Maskless exposure device and method for compensating cumulative illumination using the same

#25
20160077446
2016-03-17

Illumination system for a microlithographic projection exposure apparatus

#26
20150356234
2015-12-10

Fast freeform source and mask co-optimization method

#27
20150331328
2015-11-19

Method for compensating slit illumination uniformity

#28
20150261096
2015-09-17

Illumination optical apparatus, exposure apparatus, and device manufacturing method

#29
20150168849
2015-06-18

Method of operating a microlithographic apparatus

#30
20150160565
2015-06-11

Projection exposure methods and systems

#31
20150160561
2015-06-11

Mirror

#32
20150116682
2015-04-30

Programmable imaging assembly for manufacturing biotest post arrays

#33
20150092174
2015-04-02

Illumination optical unit

#34
20150062549
2015-03-05

Assembly for a projection exposure apparatus for EUV projection lithography

#35
20150036115
2015-02-05

Illumination optical unit for EUV projection lithography

#36
20150022798
2015-01-22

Illumination system for microlithography

#37
20150015865
2015-01-15

Illumination intensity correction device for predefining an illumination intensity over an illumination field of a lithographic projection exposure apparatus

#38
20140362361
2014-12-11

Illumination optical unit for EUV projection lithography

#39
20140218709
2014-08-07

Field facet mirror for an illumination optics of a projection exposure apparatus for EUV microlithography

#40
20140211186
2014-07-31

Fast illumination simulator based on a calibrated flexible point-spread function

#41
20140176930
2014-06-26

Microlithographic illumination system

#42
20140168621
2014-06-19

Fly eye lens and proximity exposure machine optical system

#43
20140068530
2014-03-06

Fast freeform source and mask co-optimization method

#44
20130293861
2013-11-07

Illumination system of a microlithographic projection exposure apparatus

#45
20130148092
2013-06-13

Illumination system for a microlithographic projection exposure apparatus

#46
20130077076
2013-03-28

Microlithography illumination optical system and microlithography projection exposure apparatus including same

#47
20120300185
2012-11-29

Catoptric illumination system for microlithography tool

#48
20120287414
2012-11-15

FACET MIRROR FOR USE IN MICROLITHOGRAPHY

#49
20120262685
2012-10-18

Double EUV illumination uniformity correction system and method

#50
20120242968
2012-09-27

Method for adjusting an illumination system of a projection exposure apparatus for projection lithography

#51
20120212722
2012-08-23

Fast Illumination Simulator Based on a Calibrated Flexible Point Spread Function

#52
20120069313
2012-03-22

EUV microlithography illumination optical system and EUV attenuator for same

#53
20120019796
2012-01-26

Illumination system for microlithography

#54
20110255067
2011-10-20

Microlithography illumination systems, components and methods

#55
20110230999
2011-09-22

Fast freeform source and mask co-optimization method

#56
20110177463
2011-07-21

Illumination system for EUV microlithography

#57
20110164233
2011-07-07

Field facet mirror for an illumination optics of a projection exposure apparatus for EUV microlithography

#58
20110122394
2011-05-26

Computer readable storage medium including effective light source calculation program, and exposure method

#59
20110096317
2011-04-28

Component for setting a scan-integrated illumination energy in an object plane of a microlithography projection exposure apparatus

#60
20110096313
2011-04-28

Constrained optimization of lithographic source intensities under contingent requirements

#61
20110068494
2011-03-24

FABRICATION OF MICROSCALE TOOLING

#62
20110063598
2011-03-17

Illumination optics for EUV microlithography and related system and apparatus

#63
20110007293
2011-01-13

Microlithographic projection exposure apparatus

#64
20100265482
2010-10-21

Illumination system for illuminating a mask in a microlithographic exposure apparatus

#65
20100259743
2010-10-14

Optical system for increasing illumination efficiency of a patterning device by producing a plurality of beams

#66
20100253926
2010-10-07

Illumination optics for microlithography

#67
20100231882
2010-09-16

Bundle-guiding optical collector for collecting the emission of a radiation source

#68
20100231880
2010-09-16

Optical integrator, illumination optical system, exposure apparatus, and device manufacturing method

#69
20100073651
2010-03-25

Lithography apparatus

#70
20100033699
2010-02-11

Illumination optical system, exposure apparatus, and exposure method

#71
20090323044
2009-12-31

Catoptric illumination system for microlithography tool

#72
20090316128
2009-12-24

Illumination system particularly for microlithography

#73
20090310116
2009-12-17

Recording medium storing program for determining exposure parameter, exposure method, and method of manufacturing device

#74
20090280437
2009-11-12

Projection exposure methods and systems

#75
20090257043
2009-10-15

ILLUMINATION OPTICAL SYSTEM, EXPOSURE APPARATUS, DEVICE MANUFACTURING METHOD, AND EXPOSURE OPTICAL SYSTEM

#76
20090257041
2009-10-15

Illuminator for a photolithography device

#77
20090233189
2009-09-17

DEVICE AND METHOD FOR OBTAINING EXPOSURE CORRECTION INFORMATION, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE

#78
20090201481
2009-08-13

Optical element and illumination optics for microlithography

#79
20090170042
2009-07-02

EXPOSURE APPARATUS AND DEVICE MANUFACTURING METHOD

#80
20090161224
2009-06-25

Device for illuminating an area and device for applying light to a work area

#81
20090135394
2009-05-28

Lithographic apparatus and method

#82
20090128886
2009-05-21

Illumination optical apparatus, exposure apparatus, and device manufacturing method

#83
20090101850
2009-04-23

Arrangement for generating EUV radiation

#84
20090091731
2009-04-09

Illumination optical system for microlithography

#85
20090073410
2009-03-19

Illumination system particularly for microlithography

#86
20090027647
2009-01-29

EXPOSURE APPARATUS AND DEVICE FABRICATION METHOD

#87
20090021719
2009-01-22

Microlithographic projection exposure apparatus

#88
20090021716
2009-01-22

Illumination system for a microlithographic projection exposure apparatus

#89
20090021715
2009-01-22

Microlithographic illumination system

#90
20090015812
2009-01-15

ILLUMINATION SYSTEM PARTICULARLY FOR MICROLITHOGRAPHY

#91
20080259304
2008-10-23

Lithographic apparatus and method

#92
20080227299
2008-09-18

Tapered edge exposure for removal of material from a semiconductor wafer

#93
20080225259
2008-09-18

ILLUMINATION SYSTEM WITH VARIABLE ADJUSTMENT OF THE ILLUMINATION

#94
20080225258
2008-09-18

EUV illumination system having a folding geometry

#95
20080212059
2008-09-04

Microlithography illumination systems, components and methods

#96
20080204692
2008-08-28

MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS AND METHOD FOR PRODUCING MICROSTRUCTURED COMPONENTS

#97
20080165925
2008-07-10

DOUBLE-FACETTED ILLUMINATION SYSTEM WITH ATTENUATOR ELEMENTS ON THE PUPIL FACET MIRROR

#98
20080151206
2008-06-26

Lithographic apparatus and method

#99
20080143993
2008-06-19

Illumination optical system and exposure apparatus

#100
20080143992
2008-06-19

Polarized radiation in lithographic apparatus and device manufacturing method

#101
20080137217
2008-06-12

Uniformity correction system having light leak and shadow compensation

#102
20080130076
2008-06-05

Illumination system particularly for microlithography

#103
20080123068
2008-05-29

Exposure apparatus, exposure method, and device fabrication method

#104
20080111983
2008-05-15

Illumination System for a Microlithographic Projection Exposure Apparatus

#105
20070284547
2007-12-13

Method for enabling transmission of substantially equal amounts of energy

#106
20070268473
2007-11-22

Light blocking device and exposure apparatus

#107
20070242799
2007-10-18

Illumination system

#108
20070241292
2007-10-18

Optical system for increasing illumination efficiency of a patterning device

#109
20070206168
2007-09-06

Systems and methods for determination of focus and telecentricity, amelioration of metrology induced effects and application to determination of precision bossung curves

#110
20070170376
2007-07-26

Lithographic apparatus and device manufacturing method

#111
20070120072
2007-05-31

Illumination system particularly for microlithography

#112
20070059614
2007-03-15

Method of determining an illumination profile and device manufacturing method

#113
20070058150
2007-03-15

Lithographic apparatus and device manufacturing method

#114
20070057201
2007-03-15

Lithographic apparatus and device manufacturing method

#115
20070041004
2007-02-22

Optical systems that correct optical irregularities, and projection-exposure systems and methods comprising same

#116
20070030948
2007-02-08

Illumination system with field mirrors for producing uniform scanning energy

#117
20060262426
2006-11-23

Uniformity correction system having light leak and shadow compensation

#118
20060245540
2006-11-02

Illumination system particularly for microlithography

#119
20060233300
2006-10-19

Illumination system particularly for microlithography

#120
20060208206
2006-09-21

Illumination system particularly for microlithography

#121
20060192947
2006-08-31

Optimizing light path uniformity in inspection systems

#122
20060181692
2006-08-17

Method and apparatus for controlling radiation beam intensity directed to microlithographic substrates

#123
20060152810
2006-07-13

Variable illuminator and speckle buster apparatus

#124
20060139769
2006-06-29

Uniformity correction system having light leak and shadow compensation

#125
20060139612
2006-06-29

Polarized radiation in lithographic apparatus and device manufacturing method

#126
20060126036
2006-06-15

Uniformity correction for lithographic apparatus

#127
20060119949
2006-06-08

Laser irradiation apparatus, laser irradiation method, and method for manufacturing semiconductor device

#128
20060119947
2006-06-08

Efficiently illuminating a modulating device

#129
20060119812
2006-06-08

Lithographic apparatus, device manufacturing method and device manufactured therewith

#130
20060012770
2006-01-19

Diffuser unit, lithographic apparatus, method for homogenizing a beam of radiation, a device manufacturing method and device manufactured thereby

#131
20050270608
2005-12-08

Illumination optical system and exposure apparatus

#132
20050162628
2005-07-28

Scanning exposure apparatus, and device manufacturing method

#133
20050088760
2005-04-28

Illumination system particularly for microlithography

#134
20050083503
2005-04-21

Multi mirror system for an illumination system

#135
20050002090
2005-01-06

EUV illumination system having a folding geometry

#136
14493073
2017-06-13

Horizontal development bias in negative tone development of photoresist