177138 ⎘
Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor; Exposure apparatus for microlithography; Mask illumination systems Non-homogeneous intensity distribution in the mask plane
METHOD FOR MANUFACTURING A MICRO-NANOMETRIC HIERARCHICAL STRUCTURE AND MICRO-NANOMETRIC HIERARCHICAL STRUCTURE OBTAINED BY SUCH A METHOD
#2OPTIMIZATION USING A NON-UNIFORM ILLUMINATION INTENSITY PROFILE
#3Lithographic apparatus and illumination uniformity correction system
#4Fast freeform source and mask co-optimization method
#5Method and apparatus for determining a radiation beam intensity profile
#6Method for determining an imaging aberration contribution of an imaging optical unit for measuring lithography masks
#7Light intensity modulation method
#8Lithographic apparatus and associated method
#9Illumination system for illuminating a mask in a microlithographic exposure apparatus
#10ILLUMINATION OPTICAL APPARATUS, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD
#11Fast freeform source and mask co-optimization method
#12Lithographic apparatus and method
#13PROJECTION EXPOSURE METHODS AND SYSTEMS
#14PROJECTION EXPOSURE METHOD AND PROJECTION EXPOSURE APPARATUS FOR MICROLITHOGRAPHY
#15Illumination system for illuminating a mask in a microlithographic exposure apparatus
#16METHOD AND APPARATUS FOR USING PATTERNING DEVICE TOPOGRAPHY INDUCED PHASE
#17Divisional exposure apparatus and method of manufacturing liquid crystal display using the same
#18Illumination system for microlithography
#19Projection exposure method and projection exposure apparatus for microlithography
#20Illumination system for illuminating a mask in a microlithographic exposure apparatus
#21Substrate processing apparatus and substrate processing method
#22Illumination system for microlithography
#23Illumination optical unit for EUV projection lithography
#24Maskless exposure device and method for compensating cumulative illumination using the same
#25Illumination system for a microlithographic projection exposure apparatus
#26Fast freeform source and mask co-optimization method
#27Method for compensating slit illumination uniformity
#28Illumination optical apparatus, exposure apparatus, and device manufacturing method
#29Method of operating a microlithographic apparatus
#30Projection exposure methods and systems
#31Mirror
#32Programmable imaging assembly for manufacturing biotest post arrays
#33Illumination optical unit
#34Assembly for a projection exposure apparatus for EUV projection lithography
#35Illumination optical unit for EUV projection lithography
#36Illumination system for microlithography
#37Illumination intensity correction device for predefining an illumination intensity over an illumination field of a lithographic projection exposure apparatus
#38Illumination optical unit for EUV projection lithography
#39Field facet mirror for an illumination optics of a projection exposure apparatus for EUV microlithography
#40Fast illumination simulator based on a calibrated flexible point-spread function
#41Microlithographic illumination system
#42Fly eye lens and proximity exposure machine optical system
#43Fast freeform source and mask co-optimization method
#44Illumination system of a microlithographic projection exposure apparatus
#45Illumination system for a microlithographic projection exposure apparatus
#46Microlithography illumination optical system and microlithography projection exposure apparatus including same
#47Catoptric illumination system for microlithography tool
#48FACET MIRROR FOR USE IN MICROLITHOGRAPHY
#49Double EUV illumination uniformity correction system and method
#50Method for adjusting an illumination system of a projection exposure apparatus for projection lithography
#51Fast Illumination Simulator Based on a Calibrated Flexible Point Spread Function
#52EUV microlithography illumination optical system and EUV attenuator for same
#53Illumination system for microlithography
#54Microlithography illumination systems, components and methods
#55Fast freeform source and mask co-optimization method
#56Illumination system for EUV microlithography
#57Field facet mirror for an illumination optics of a projection exposure apparatus for EUV microlithography
#58Computer readable storage medium including effective light source calculation program, and exposure method
#59Component for setting a scan-integrated illumination energy in an object plane of a microlithography projection exposure apparatus
#60Constrained optimization of lithographic source intensities under contingent requirements
#61FABRICATION OF MICROSCALE TOOLING
#62Illumination optics for EUV microlithography and related system and apparatus
#63Microlithographic projection exposure apparatus
#64Illumination system for illuminating a mask in a microlithographic exposure apparatus
#65Optical system for increasing illumination efficiency of a patterning device by producing a plurality of beams
#66Illumination optics for microlithography
#67Bundle-guiding optical collector for collecting the emission of a radiation source
#68Optical integrator, illumination optical system, exposure apparatus, and device manufacturing method
#69Lithography apparatus
#70Illumination optical system, exposure apparatus, and exposure method
#71Catoptric illumination system for microlithography tool
#72Illumination system particularly for microlithography
#73Recording medium storing program for determining exposure parameter, exposure method, and method of manufacturing device
#74Projection exposure methods and systems
#75ILLUMINATION OPTICAL SYSTEM, EXPOSURE APPARATUS, DEVICE MANUFACTURING METHOD, AND EXPOSURE OPTICAL SYSTEM
#76Illuminator for a photolithography device
#77DEVICE AND METHOD FOR OBTAINING EXPOSURE CORRECTION INFORMATION, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
#78Optical element and illumination optics for microlithography
#79EXPOSURE APPARATUS AND DEVICE MANUFACTURING METHOD
#80Device for illuminating an area and device for applying light to a work area
#81Lithographic apparatus and method
#82Illumination optical apparatus, exposure apparatus, and device manufacturing method
#83Arrangement for generating EUV radiation
#84Illumination optical system for microlithography
#85Illumination system particularly for microlithography
#86EXPOSURE APPARATUS AND DEVICE FABRICATION METHOD
#87Microlithographic projection exposure apparatus
#88Illumination system for a microlithographic projection exposure apparatus
#89Microlithographic illumination system
#90ILLUMINATION SYSTEM PARTICULARLY FOR MICROLITHOGRAPHY
#91Lithographic apparatus and method
#92Tapered edge exposure for removal of material from a semiconductor wafer
#93ILLUMINATION SYSTEM WITH VARIABLE ADJUSTMENT OF THE ILLUMINATION
#94EUV illumination system having a folding geometry
#95Microlithography illumination systems, components and methods
#96MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS AND METHOD FOR PRODUCING MICROSTRUCTURED COMPONENTS
#97DOUBLE-FACETTED ILLUMINATION SYSTEM WITH ATTENUATOR ELEMENTS ON THE PUPIL FACET MIRROR
#98Lithographic apparatus and method
#99Illumination optical system and exposure apparatus
#100Polarized radiation in lithographic apparatus and device manufacturing method
#101Uniformity correction system having light leak and shadow compensation
#102Illumination system particularly for microlithography
#103Exposure apparatus, exposure method, and device fabrication method
#104Illumination System for a Microlithographic Projection Exposure Apparatus
#105Method for enabling transmission of substantially equal amounts of energy
#106Light blocking device and exposure apparatus
#107Illumination system
#108Optical system for increasing illumination efficiency of a patterning device
#109Systems and methods for determination of focus and telecentricity, amelioration of metrology induced effects and application to determination of precision bossung curves
#110Lithographic apparatus and device manufacturing method
#111Illumination system particularly for microlithography
#112Method of determining an illumination profile and device manufacturing method
#113Lithographic apparatus and device manufacturing method
#114Lithographic apparatus and device manufacturing method
#115Optical systems that correct optical irregularities, and projection-exposure systems and methods comprising same
#116Illumination system with field mirrors for producing uniform scanning energy
#117Uniformity correction system having light leak and shadow compensation
#118Illumination system particularly for microlithography
#119Illumination system particularly for microlithography
#120Illumination system particularly for microlithography
#121Optimizing light path uniformity in inspection systems
#122Method and apparatus for controlling radiation beam intensity directed to microlithographic substrates
#123Variable illuminator and speckle buster apparatus
#124Uniformity correction system having light leak and shadow compensation
#125Polarized radiation in lithographic apparatus and device manufacturing method
#126Uniformity correction for lithographic apparatus
#127Laser irradiation apparatus, laser irradiation method, and method for manufacturing semiconductor device
#128Efficiently illuminating a modulating device
#129Lithographic apparatus, device manufacturing method and device manufactured therewith
#130Diffuser unit, lithographic apparatus, method for homogenizing a beam of radiation, a device manufacturing method and device manufactured thereby
#131Illumination optical system and exposure apparatus
#132Scanning exposure apparatus, and device manufacturing method
#133Illumination system particularly for microlithography
#134Multi mirror system for an illumination system
#135EUV illumination system having a folding geometry
#136Horizontal development bias in negative tone development of photoresist