180099 ⎘
Programme-control systems electric; Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM] characterised by quality surveillance of production
System and method for monitoring wafer handling and a wafer handling machine
#1202Method and apparatus for autonomous identification of particle contamination due to isolated process events and systematic trends
#1203Method and apparatus for detecting defects on tyres in a tyre production process
#1204Dynamic repair system
#1205Systems and methods integrating multiple pieces of industrial equipment
#1206Systems and methods for virtually tagging and securing industrial equipment
#1207Systems and methods for a multi-purpose sensing device for industrial automation equipment
#1208SYSTEMS AND METHODS FOR MAINTAINING EQUIPMENT IN AN INDUSTRIAL AUTOMATION ENVIRONMENT
#1209Systems and methods for assessing a quality of an industrial enterprise
#1210Missed cut detection and reaction
#1211Updating of a recipe for evaluating a manufacturing stage of an electrical circuit
#1212Systems and methods for recommending components for an industrial system
#1213Systems and methods for virtually assessing an industrial automation system
#1214Systems and methods for enhancing monitoring of an industrial automation system
#1215Systems and methods for electronically tracking a status of industrial equipment
#1216Numerical control device inspecting screw holes
#1217Self-learning production systems with good and/or bad part variables inspection feedback
#1218System and method for identifying significant and consumable-insensitive trace features
#1219Systems and methods of controlling a manufacturing process for a microelectronic component
#1220Continuous improvement procedure aimed to signal, monitor and terminate action plans classified as improvable in a production process
#1221Methods and apparatus for predictive failure analysis of a cooling device
#1222AUTOMATED PRODUCTION SYSTEM FOR MOBILE PHONE
#1223System and method for using an internet of things network for managing factory production
#1224Methodology of using the various capabilities of the smart box to perform testing of other functionality of the smart device
#1225Smart box for automatic feature testing of smart phones and other devices
#1226Smart box for automatic feature testing of smart phones and other devices
#1227Multi-sensor quality inference and control for additive manufacturing processes
#1228Determining critical parameters using a high-dimensional variable selection model
#1229System and method for equipment monitoring using a group candidate baseline and probabilistic model
#1230Reliability monitor test strategy definition
#1231Systems and methods for assuring and improving process quality
#1232Intelligent processing tools
#1233Method of performing aging for a process chamber
#1234Computer-implemented system and method for attribute-based manufacturing quality control
#1235THREE DIMENSIONAL PRINTING INSPECTION APPARATUS AND METHOD
#1236Portable device and method for production control and quality control
#1237System and method for inspecting a composite part during manufacture
#1238Management apparatus, substrate processing system and non-transitory computer-readable recording medium
#1239Photolithography systems and associated methods of overlay error correction
#1240Quality controlling device and control method thereof
#1241Welding control system
#1242Substrate processing apparatus and substrate processing method
#1243Method for the quality assessment of a component produced by means of an additive manufacturing method
#1244Production Control Support Apparatus and Production Control Support Method
#1245System and method for automated object measurement
#1246Computer program and method for evaluating a crankshaft
#1247Production line quality processes
#1248Adaptive processes for improving integrity of surfaces
#1249Identifying registration errors of DSA lines
#1250In-situ monitoring of fabrication of integrated computational elements
#1251Control system, control device, image processing device, and control method
#1252Manufacturing supporting system, manufacturing supporting method, and manufacturing supporting program for electronic device
#1253METHOD AND APPARATUS FOR QUANTIFYING DIMENSIONAL VARIATIONS AND PROCESS CAPABILITY INDEPENDENTLY OF DATUM POINTS
#1254System, methods and apparatus using virtual appliances in a semiconductor test environment
#1255Identifying integrated circuit origin using tooling signature
#1256Computer-assisted methods of quality control and corresponding quality control systems
#1257Automatic recipe stability monitoring and reporting
#1258Method and device for monitoring and controlling an industrial process
#1259Intelligent condition monitoring and fault diagnostic system for preventative maintenance
#1260Semiconductor process management system, semiconductor manufacturing system including the same, and method of manufacturing semiconductor
#1261Information integration system and methodology
#1262METHOD AND APPARATUS FOR DISCOVERING EQUIPMENT CAUSING PRODUCT DEFECT IN MANUFACTURING PROCESS
#1263A METHOD AND SYSTEM FOR QUALITY INSPECTION WITHIN A MULTI LAYER MANUFACTURING LIFECYCLE
#1264Object production using an additive manufacturing process and quality assessment of the object
#1265Dynamically calculated refractive index for determining the thickness of roofing materials
#1266MODULAR CONTROL SYSTEM OF AN INSTALLATION FOR PRODUCING CONTAINERS
#1267Monitoring liquid mixing systems and water based systems in pharmaceutical manufacturing
#1268Method for producing web-like material
#1269UNIFORMITY CORRECTION USING PROGRESSIVE ABLATION
#1270Straightness management system and control method thereof for mounting pin
#1271Metrology sampling method and computer program product thereof
#1272Manufacturing apparatus control system and manufacturing apparatus control method
#1273Method for coupling quality control data of a subassembly of components to a main product assembly
#1274Monitor data attachment to product lots for batch processes
#1275Method and system for analyzing process monitoring data
#1276Uniformity of a tire using tooling signature analysis
#1277Production line monitoring device
#1278Correction value computation device, correction value computation method, and computer program
#1279Method For Energy Demand Management In A Production Flow Line
#1280Image processing device, managing system, and managing method
#1281Failure detection apparatus for substrate processing apparatus, and substrate processing apparatus
#1282Adaptive value capture for process monitoring
#1283METHOD OF MONITORING ENVIRONMENTAL VARIATIONS IN A SEMICONDUCTOR FABRICATION EQUIPMENT AND APPARATUS FOR PERFORMING THE SAME
#1284WORK-IN-PROCESS INSPECTION SYSTEM USING MOTION DETECTION, AND METHOD THEREOF
#1285System and method for similarity search in process data
#1286System and method for programming workpiece feature inspection operations for a coordinate measuring machine
#1287Method, storage medium and system for controlling the processing of lots of workpieces
#1288Uniformity correction by ablation at different track locations along a tire bead
#1289Information processing apparatus, control method thereof, information processing system, and non-transitory computer-readable storage medium
#1290Quality control system and method
#1291Display method, display device, and recording medium
#1292Workpiece processing apparatus and workpiece transfer system
#1293System and method for operating a machine and performing quality assurance
#1294Method for managing a manufacturing plant for the production of carbon fiber pieces
#1295Device for checking the construction of an extruder screw
#1296Modular system for real-time evaluation and monitoring of a machining production-line overall performances calculated from each given workpiece, tool and machine
#1297Manufacturing process management support device
#1298Target signature closed loop control system and method
#1299Device and method for verifying CNC production accuracy
#1300COMPUTING DEVICE AND METHOD FOR IMAGE MEASUREMENT
#1301Matching process controllers for improved matching of process
#1302Production support system, production support method, and production support program
#1303Semiconductor fabrication component retuning
#1304CONSTRUCTION PROCESS MANAGEMENT SYSTEM AND CONSTRUCTION PROCESS MANAGEMENT METHOD
#1305Systems and methods for adjusting target manufacturing parameters on an absorbent product converting line
#1306Fail-over system and method for a semiconductor equipment server
#1307Component control in semiconductor performance processing with stable product offsets
#1308Manufacturing and Asset Maintenance
#1309Automatic process control of additive manufacturing device
#1310Stencil programming and inspection using solder paste inspection system
#1311System and method for presenting information in an industrial monitoring system
#1312Event processing based system for manufacturing yield improvement
#1313Substrate processing system, management device, and display method for facilitating trouble analysis
#1314Selection and use of representative target subsets
#1315Quality control of additive manufactured parts
#1316Closed-loop automatic defect inspection and classification
#1317Antenna inspection system, antenna inspection apparatus and antenna inspection method
#1318Cigarette package coding system and associated method
#1319Method and apparatus for manufacturing radiation intensity bolus
#1320Method and apparatus for database-assisted requalification reticle inspection
#1321ROBOT SYSTEM
#1322Replacement of suspect or marginally defective computing system components during fulfillment test of build-to-order test phase
#1323Methods and apparatus for measuring a property of a substrate
#1324Method and apparatus to automatically create virtual sensors with templates
#1325Extracting attribute fail rates from convoluted systems
#1326System and method for monitoring wafer handling and a wafer handling machine
#1327Process for monitoring at least one machine tool
#1328Sensor system and method for determining paper sheet quality parameters
#1329Manufacture modeling and monitoring
#1330ANOMALY DETECTION METHOD, COMPUTER-READABLE NON-TRANSITORY STORAGE MEDIUM, AND ANOMALY DETECTION APPARATUS
#1331Printer With Integrated RFID Data Collector
#1332Device and method for diagnosing an evolutive industrial process
#1333Systems and methods for detecting and rejecting defective absorbent articles from a converting line
#1334Inspecting device monitoring system
#1335TEST DEVICE FOR TESTING STARTUP FUNCTION OF ELECTRONIC DEVICE
#1336Method and apparatus for autonomous identification of particle contamination due to isolated process events and systematic trends
#1337QUALITY CONTROL OF AN OBJECT DURING MACHINING THEREOF
#1338System and Method to Test and Certify Equipment for Regulatory Compliance
#1339Method and apparatus for autonomous tool parameter impact identification system for semiconductor manufacturing
#1340Board inspection apparatus system and board inspection method
#1341Mobility product traceability building system and production line operation controlling method
#1342Aggregate processing control system
#1343Monitoring tablet press systems and powder blending systems in pharmaceutical manufacturing
#1344Manufacturing control system, manufacturing control method, and manufacturing control program
#1345Capturing data during operation of an industrial controller for the debugging of control programs
#1346Adaptive and automatic determination of system parameters
#1347Integrated circuit product yield optimization using the results of performance path testing
#1348Reliability test screen optimization
#1349System and method to reduce pre-back-grinding process defects
#1350Information processing apparatus, processing system, processing method, and program
#1351Method and assembly for determining and/or producing a drive or parts for a drive and interface and method for determining an operational reliability factor SB
#1352Run-to-run control utilizing virtual metrology in semiconductor manufacturing
#1353Run-to-run control utilizing virtual metrology in semiconductor manufacturing
#1354Recording information for a web manufacturing process
#1355Production installation with time-indexed historical display
#1356Method and apparatus for hierarchical wafer quality predictive modeling
#1357Manufacturing control apparatus and manufacturing control system
#1358Method and Apparatus for Hierarchical Wafer Quality Predictive Modeling
#1359Process monitoring system, apparatus and method
#1360Method and device for using substrate geometry to determine optimum substrate analysis sampling
#1361Method for corrective action on the operation of a line for the production of absorbent sanitary articles, such as nappies for babies or incontinence pads for adults, sanitary towels or the like
#1362Production line quality processes
#1363Method for serial personalization of smart cards
#1364Method for regulating an injection molding process
#1365QUANTIFYING DEFECTS AND HANDLING THEREOF
#1366Monitoring acceptance criteria of pharmaceutical manufacturing processes
#1367Tool function to improve fab process in semiconductor manufacturing
#1368Method for monitoring the quality of industrial processes and system therefrom
#1369Workpiece positioning method and apparatus
#1370Systems and methods for enabling and disabling operation of manufacturing machines
#1371METHOD AND SYSTEM FOR PROVIDING MONITORING CHARACTERISTICS IN AN SOA BASED INDUSTRIAL ENVIRONMENT
#1372Fastening part tightening management system
#1373Intelligent defect diagnosis method
#1374Process control system for production of parts with graphical interface
#1375Method and system for position control based on automated defect detection feedback
#1376Bi-directional association and graphical acquisition of time-based equipment sensor data and material-based metrology statistical process control data
#1377Cigarette package coding system and associated method
#1378COMPUTING DEVICE AND METHOD FOR GENERATING ENGINEERING TOLERANCES OF A MANUFACTURED OBJECT
#1379Systems and Methods For Use In Populating Information Into A Document
#1380Continuous prediction of expected chip performance throughout the production lifecycle
#1381DEVICE FOR SLICING A FOOD PRODUCT AND DEVICE WITH A ROBOT
#1382Method and system for detecting and correcting problematic advanced process control parameters
#1383Event management apparatus, systems, and methods
#1384ARCHITECTURE FOR ANALYSIS AND PREDICTION OF INTEGRATED TOOL-RELATED AND MATERIAL-RELATED DATA AND METHODS THEREFOR
#1385MONITORING SYSTEM FOR A PACKAGING SYSTEM
#1386METHOD OF FABRICATING SEMICONDUCTOR DEVICE INCLUDING CALIBRATING PROCESS CONDITIONS AND CONFIGURATIONS BY MONITORING PROCESSES
#1387APPARATUS AND METHODS FOR END POINT DETERMINATION IN SEMICONDUCTOR PROCESSING
#1388Capturing data during operation of an industrial controller for the debugging of control programs
#1389Substrate processing system and group managing apparatus
#1390Photolithography systems and associated methods of overlay error correction
#1391Method and machine for examining wafers
#1392AUTOMATED MODEL BUILDING AND MODEL UPDATING
#1393METHOD FOR THE PRODUCTION AND CONTROL OF PLATES FOR ELECTRONICS AND RELATED APPARATUS
#1394Method and apparatus for parallel testing of semiconductor devices
#1395Method and computer system for characterizing a sheet metal part
#1396METHOD OF PROCESSING A JUICE AND/OR SODA PRODUCT
#1397Module for monitoring industrial processes
#1398Closed loop cyclic timing optimizer control system and method
#1399INSPECTION SYSTEM, MANAGEMENT SERVER, INSPECTION APPARATUS AND METHOD FOR MANAGING INSPECTION DATA
#1400Metal organic chemical vapor deposition device and temperature control method therefor
#1401Based device risk assessment
#1402Detecting combined tool incompatibilities and defects in semiconductor manufacturing
#1403Manufacturing execution system (MES) including a wafer sampling engine (WSE) for a semiconductor manufacturing process
#1404Tool performance by linking spectroscopic information with tool operational parameters and material measurement information
#1405SUBSTRATE INSPECTION SYSTEM
#1406System and method for storing, using and evaluating manufacturing data
#1407Vertical glass distribution habituating control system and method
#1408Automated fault analysis and response system
#1409Systems and methods for detecting and rejecting defective absorbent articles from a converting line
#1410Method of controlling semiconductor process distribution
#1411PROCESS FOR IMPROVING THE PRODUCTION OF PHOTOVOLTAIC PRODUCTS
#1412Adaptive and automatic determination of system parameters
#1413Factory level process and final product performance control system
#1414Data perturbation for wafer inspection or metrology setup using a model of a difference
#1415METHOD OF ANALYZING CAUSE OF ABNORMALITY AND PROGRAM ANALYZING ABNORMALITY
#1416Uniformity correction by ablation at different track locations along a tire bead
#1417Chamber match using important variables filtered by dynamic multivariate analysis
#1418Predicted fault analysis
#1419Electronic supervisor
#1420System and method to reduce pre-back-grinding process defects
#1421Controlling non-process of record (POR) process limiting yield (PLY) inspection work
#1422Manufacturing method and apparatus for semiconductor device
#1423Temporary expanding integrated monitoring network
#1424Dynamic care areas
#1425Method and system for providing process tool correctables
#1426VIRTUAL MEASURING SYSTEM AND METHOD FOR PREDICTING THE QUALITY OF THIN FILM TRANSISTOR LIQUID CRYSTAL DISPLAY PROCESSES
#1427Implementing sequential segmented interleaving algorithm for enhanced process control
#1428System and method for data mining and feature tracking for fab-wide prediction and control
#1429System and method for identifying defects of surfaces due to machining processes
#1430Production system and production method of aluminum alloy billet, and aluminum alloy billet
#1431Technique and tool for efficient testing of controllers in development
#1432On-line alignment of a process analytical model with actual process operation
#1433Process quality predicting system and method thereof
#1434Method for an improved checking of repeatability and reproducibility of a measuring chain for semiconductor device testing
#1435Manufacturing execution system with virtual-metrology capabilities and manufacturing system including the same
#1436Method and system for managing semiconductor manufacturing device
#1437Limit repository limit model and related system and method
#1438Apparatus for monitoring a package handling system
#1439Dynamic compensation in advanced process control
#1440Monitoring of time-varying defect classification performance
#1441Method for controlling critical dimension in semiconductor production process, and semiconductor manufacturing line supporting the same
#1442Method and device for position locked power tool operation for correction of unacceptable screw joint tightening results
#1443System and method for implementing multi-resolution advanced process control
#1444Instrumental Support for Monitoring the Color Imprint in the Manufacture of Surfaces Patterned in Multiple Colors
#1445Method for manufacturing a drive from a determined minimum operational reliability factor
#1446Integrated menu-driven manufacturing method and system
#1447Printer with integrated RFID data collector
#1448PLANT ANALYSIS SYSTEM
#1449Method And Device For Monitoring Measurement Data In Semiconductor Process
#1450METHOD OF SEARCHING FOR KEY SEMICONDUCTOR OPERATION WITH RANDOMIZATION FOR WAFER POSITION
#1451YIELD LOSS PREDICTION METHOD AND ASSOCIATED COMPUTER READABLE MEDIUM
#1452Tuning order configurator performance by dynamic integration of manufacturing and field feedback
#1453Method and apparatus for optimizing a performance index of a bulk product blending and packaging plant
#1454METHOD FOR CONTROLLING A SYSTEM
#1455System and process for monitoring, control and withdrawal of consumable items in a production environment
#1456FAULT DETECTION AND CLASSIFICATION METHOD FOR WAFER ACCEPTANCE TEST PARAMETERS
#1457Substrate processing system
#1458METHOD OF MAKING CERAMIC BODIES HAVING REDUCED SHAPE VARIABILITY
#1459INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND PROGRAM
#1460Method and apparatus for wireless transmission of diagnostic information
#1461Methods and apparatus to predict process quality in a process control system
#1462Systems and methods for detecting and rejecting defective absorbent articles from a converting line
#1463Tuning a process controller based on a dynamic sampling rate
#1464System and method for implementing a wafer acceptance test (“WAT”) advanced process control (“APC”) with novel sampling policy and architecture
#1465Method for the classification of defects and running of lamination cylinder grinding
#1466Electronic device history record and product release system
#1467SERVICE ORIENTATED COMPUTER SYSTEM WITH MULTIPLE QUALITY OF SERVICE CONTROLS
#1468Manufacturing execution systems (MES)
#1469System and method for detecting part abnormality in a manufacturing assembly line
#1470System and method for implementing multi-resolution advanced process control
#1471Method for monitoring a production process
#1472Controlling cutting of continuously fabricated composite parts with nondestructive evaluation
#1473Method for monitoring fabrication parameter
#1474Quality Information Control Analysis System
#1475Welding quality control and monitoring system
#1476System and method for monitoring and visualizing the output of a production process
#1477METHOD AND MACHINE FOR EXAMINING WAFERS
#1478METHOD AND SYSTEM OF COMMONALITY ANALYSIS FOR LOTS WITH SCRAPPED WAFER
#1479Work piece tracking system and method
#1480System and method for after-market support using as-built data
#1481Method and system for monitoring and controlling a multi-variable process throughout a plurality of distinct phases of the process
#1482PALLET MONITORING SYSTEM AND MONITORING METHOD
#1483Methods and systems to align wafer signatures
#1484Geometric inspection of machined objects
#1485Substrate processing apparatus and method of manufacturing semiconductor device
#1486Substrate Processing System
#1487Photolithography systems and associated methods of overlay error correction
#1488Product-related feedback for process control
#1489Expert knowledge methods and systems for data analysis
#1490Touch systems and methods utilizing customized sensors and genericized controllers
#1491METHOD OF SEARCHING FOR KEY SEMICONDUCTOR OPERATION WITH RANDOMIZATION FOR WAFER POSITION
#1492Validation of laboratory test data based on predicted values of property-of-interest
#1493Sampling inspection method
#1494USE OF DIFFERENT PAIRS OF OVERLAY LAYERS TO CHECK AN OVERLAY MEASUREMENT RECIPE
#1495METHOD FOR DETERMINING TOOL'S PRODUCTION QUALITY
#1496Method for operating an industrial plant
#1497Control method for semiconductor manufacturing apparatus, control system for semiconductor manufacturing apparatus, and manufacturing method for semiconductor device
#1498Defect review and classification system
#1499Systems and methods for offline and/or online batch monitoring using decomposition and signal approximation approaches
#1500Apparatus for monitoring a package handling system