181963 ⎘
Program-control systems; Pc systems; Pc applications Wafer processing
OPTIMIZATION OF FABRICATION PROCESSES
#2AI-based System and Method for Optimizing Lot Dispatching in Semiconductor Fabrication Using Reinforcement Learning and Fab-wide Digital Twin
#3INPUT/OUTPUT (IO) HANDLING DURING UPDATE PROCESS FOR MANUFACTURING SYSTEM CONTROLLER
#4FILM FRAME CARRIER WITH WHOLE WAFER HYBRID CHUCK
#5MACHINE AND DEEP LEARNING METHODS FOR SPECTRA-BASED METROLOGY AND PROCESS CONTROL
#6INFORMATION PROCESSING APPARATUS, SUBSTRATE PROCESSING APPARATUS, AND INFORMATION PROCESSING METHOD
#7MATCHING PROCESS CONTROLLERS FOR IMPROVED MATCHING OF PROCESS
#8TRANSPORT APPARATUS AND ADAPTER PENDANT
#9METHOD AND SYSTEM TO TRAIN AND APPLY A NEURAL NETWORK TO ACHIEVE RAPID ADAPTIVE INITIALIZATION OF SOLVER SOFTWARE
#10METHODS AND SYSTEMS FOR DETERMINING SOURCES OF ANOMALIES IN MANUFACTURING PROCESSES
#11Machine and deep learning methods for spectra-based metrology and process control
#12METHOD, APPARATUS, AND SYSTEM WITH ABNORMALITY DETERMINATION
#13Treatment condition setting method, storage medium, and substrate treatment system
#14STATE MANAGEMENT SYSTEM, STATE MANAGEMENT METHOD, AND STORAGE MEDIUM
#15Machine and deep learning methods for spectra-based metrology and process control
#16MACHINE LEARNING PLATFORM FOR SUBSTRATE PROCESSING
#17Wafer processing apparatus and wafer transfer method
#18SUBSTRATE TREATMENT APPARATUS WITH FLEX-LL FUNCTION, AND SUBSTRATE TRANSFER METHOD
#19INPUT/OUTPUT (IO) HANDLING DURING UPDATE PROCESS FOR MANUFACTURING SYSTEM CONTROLLER
#20Semiconductor manufacturing apparatus, failure prediction method for semiconductor manufacturing apparatus, and failure prediction program for semiconductor manufacturing apparatus
#21Recipe updating method
#22Method of handling transaction request, and semiconductor production system
#23SUBSTRATE PROCESSING APPARATUS, DEVICE MANAGEMENT CONTROLLER, AND RECORDING MEDIUM
#24Method for determining root causes of events of a semiconductor manufacturing process and for monitoring a semiconductor manufacturing process
#25Abatement system, abatement device, and system control device
#26Semiconductor manufacturing apparatus and method for transferring wafer
#27Transport apparatus and adapter pendant
#28Matching process controllers for improved matching of process
#29Treatment condition setting method, storage medium, and substrate treatment system
#30Substrate processing system
#31Substrate processing apparatus, device management controller, and recording medium
#32METHODS & APPARATUS FOR CONTROLLING AN INDUSTRIAL PROCESS
#33System, method and computer program product for generating a training set for a classifier
#34Systems and methods for calibrating scalar field contribution values for a limited number of sensors including a temperature value of an electrostatic chuck and estimating temperature distribution profiles based on calibrated values
#35Wireless substrate-like teaching sensor for semiconductor processing
#36Methods and system for controlling a surface profile of a wafer
#37Plasma processing apparatus
#38System and method for automating user interaction for semiconductor manufacturing equipment
#39Substrate processing system
#40Semiconductor process transport apparatus comprising an adapter pendant
#41Semiconductor manufacturing apparatus, failure prediction method for semiconductor manufacturing apparatus, and failure prediction program for semiconductor manufacturing apparatus
#42Wafer processing apparatus, recording medium and wafer conveying method
#43Crystal oscillator and the use thereof in semiconductor fabrication
#44Workpiece processing apparatus and workpiece transfer system
#45Methods and system for controlling a surface profile of a wafer
#46Substrate processing apparatus, device management controller, and recording medium
#47Matching process controllers for improved matching of process
#48Systems and methods for calibrating scalar field contribution values for a limited number of sensors including a temperature value of an electrostatic chuck and estimating temperature distribution profiles based on calibrated values
#49Processing liquid supply device, processing liquid supply method, and storage medium
#50Production management apparatus, production management method and recording medium
#51Monitor data attachment to product lots for batch processes
#52Adjustment apparatus for adjusting processing units provided in a substrate processing apparatus, and a substrate processing apparatus having such an adjustment apparatus
#53Method and manufacturing system
#54Object carrier transport system and method of transporting object carriers
#55Crystal oscillator and the use thereof in semiconductor fabrication
#56METHOD OF MONITORING ENVIRONMENTAL VARIATIONS IN A SEMICONDUCTOR FABRICATION EQUIPMENT AND APPARATUS FOR PERFORMING THE SAME
#57Method of determining thermal stability of a substrate support assembly
#58Workpiece processing apparatus and workpiece transfer system
#59SUBSTRATE PROCESSING SYSTEM, SUBSTRATE PROCESSING APPARATUS, DATA PROCESSING METHOD, AND STORAGE MEDIUM
#60Matching process controllers for improved matching of process
#61Quick processing system and method for SMT equipment
#62Substrate processing system, management device, and display method for facilitating trouble analysis
#63Substrate processing method and control apparatus
#64Substrate processing system, substrate processing apparatus and method for accumulating data for substrate processing apparatus
#65Semiconductor processing dispatch control
#66Alignment data based process control system
#67Semiconductor processing dispatch control
#68Semiconductor processing dispatch control
#69Semiconductor equipment control system and method
#70Methods for configuring a plasma cluster tool
#71Methods and apparatus for configuring plasma cluster tools
#72Apparatus and method for monitoring a process of wet cleaning
#73System and method for searching for patterns of semiconductor wafer features in semiconductor wafer data
#74Method and system for managing, analyzing and automating data in the production of semiconductor wafers and for monitoring the production process
#75System and method for integrated data transfer, archiving and purging of semiconductor wafer data
#76Across-wafer profile control in semiconductor processes