ClassID:

181963

G05B2219/2602 - CPC Classification

Classification description:

Program-control systems; Pc systems; Pc applications Wafer processing

Recent Application in this class:
#1
20260104696
2026-04-16

OPTIMIZATION OF FABRICATION PROCESSES

#2
20260093245
2026-04-02

AI-based System and Method for Optimizing Lot Dispatching in Semiconductor Fabrication Using Reinforcement Learning and Fab-wide Digital Twin

#3
20260093223
2026-04-02

INPUT/OUTPUT (IO) HANDLING DURING UPDATE PROCESS FOR MANUFACTURING SYSTEM CONTROLLER

#4
20260052951
2026-02-19

FILM FRAME CARRIER WITH WHOLE WAFER HYBRID CHUCK

#5
20250334887
2025-10-30

MACHINE AND DEEP LEARNING METHODS FOR SPECTRA-BASED METROLOGY AND PROCESS CONTROL

#6
20250291343
2025-09-18

INFORMATION PROCESSING APPARATUS, SUBSTRATE PROCESSING APPARATUS, AND INFORMATION PROCESSING METHOD

#7
20250199521
2025-06-19

MATCHING PROCESS CONTROLLERS FOR IMPROVED MATCHING OF PROCESS

#8
20250096029
2025-03-20

TRANSPORT APPARATUS AND ADAPTER PENDANT

#9
20250036110
2025-01-30

METHOD AND SYSTEM TO TRAIN AND APPLY A NEURAL NETWORK TO ACHIEVE RAPID ADAPTIVE INITIALIZATION OF SOLVER SOFTWARE

#10
20240361759
2024-10-31

METHODS AND SYSTEMS FOR DETERMINING SOURCES OF ANOMALIES IN MANUFACTURING PROCESSES

#11
20240310737
2024-09-19

Machine and deep learning methods for spectra-based metrology and process control

#12
20240201673
2024-06-20

METHOD, APPARATUS, AND SYSTEM WITH ABNORMALITY DETERMINATION

#13
20230333531
2023-10-19

Treatment condition setting method, storage medium, and substrate treatment system

#14
20230288917
2023-09-14

STATE MANAGEMENT SYSTEM, STATE MANAGEMENT METHOD, AND STORAGE MEDIUM

#15
20230124431
2023-04-20

Machine and deep learning methods for spectra-based metrology and process control

#16
20230089092
2023-03-23

MACHINE LEARNING PLATFORM FOR SUBSTRATE PROCESSING

#17
20230057774
2023-02-23

Wafer processing apparatus and wafer transfer method

#18
20220359241
2022-11-10

SUBSTRATE TREATMENT APPARATUS WITH FLEX-LL FUNCTION, AND SUBSTRATE TRANSFER METHOD

#19
20220277974
2022-09-01

INPUT/OUTPUT (IO) HANDLING DURING UPDATE PROCESS FOR MANUFACTURING SYSTEM CONTROLLER

#20
20220181180
2022-06-09

Semiconductor manufacturing apparatus, failure prediction method for semiconductor manufacturing apparatus, and failure prediction program for semiconductor manufacturing apparatus

#21
20220137603
2022-05-05

Recipe updating method

#22
20220026885
2022-01-27

Method of handling transaction request, and semiconductor production system

#23
20220019191
2022-01-20

SUBSTRATE PROCESSING APPARATUS, DEVICE MANAGEMENT CONTROLLER, AND RECORDING MEDIUM

#24
20210397152
2021-12-23

Method for determining root causes of events of a semiconductor manufacturing process and for monitoring a semiconductor manufacturing process

#25
20210302935
2021-09-30

Abatement system, abatement device, and system control device

#26
20210287920
2021-09-16

Semiconductor manufacturing apparatus and method for transferring wafer

#27
20210225685
2021-07-22

Transport apparatus and adapter pendant

#28
20210116898
2021-04-22

Matching process controllers for improved matching of process

#29
20200393803
2020-12-17

Treatment condition setting method, storage medium, and substrate treatment system

#30
20200257269
2020-08-13

Substrate processing system

#31
20200192324
2020-06-18

Substrate processing apparatus, device management controller, and recording medium

#32
20200050180
2020-02-13

METHODS & APPARATUS FOR CONTROLLING AN INDUSTRIAL PROCESS

#33
20190347785
2019-11-14

System, method and computer program product for generating a training set for a classifier

#34
20190332094
2019-10-31

Systems and methods for calibrating scalar field contribution values for a limited number of sensors including a temperature value of an electrostatic chuck and estimating temperature distribution profiles based on calibrated values

#35
20190325601
2019-10-24

Wireless substrate-like teaching sensor for semiconductor processing

#36
20190270222
2019-09-05

Methods and system for controlling a surface profile of a wafer

#37
20190221407
2019-07-18

Plasma processing apparatus

#38
20190079503
2019-03-14

System and method for automating user interaction for semiconductor manufacturing equipment

#39
20190025799
2019-01-24

Substrate processing system

#40
20190019719
2019-01-17

Semiconductor process transport apparatus comprising an adapter pendant

#41
20180294174
2018-10-11

Semiconductor manufacturing apparatus, failure prediction method for semiconductor manufacturing apparatus, and failure prediction program for semiconductor manufacturing apparatus

#42
20180269088
2018-09-20

Wafer processing apparatus, recording medium and wafer conveying method

#43
20180231957
2018-08-16

Crystal oscillator and the use thereof in semiconductor fabrication

#44
20180101165
2018-04-12

Workpiece processing apparatus and workpiece transfer system

#45
20180056545
2018-03-01

Methods and system for controlling a surface profile of a wafer

#46
20170285613
2017-10-05

Substrate processing apparatus, device management controller, and recording medium

#47
20170168477
2017-06-15

Matching process controllers for improved matching of process

#48
20160370795
2016-12-22

Systems and methods for calibrating scalar field contribution values for a limited number of sensors including a temperature value of an electrostatic chuck and estimating temperature distribution profiles based on calibrated values

#49
20160246307
2016-08-25

Processing liquid supply device, processing liquid supply method, and storage medium

#50
20160070250
2016-03-10

Production management apparatus, production management method and recording medium

#51
20150253764
2015-09-10

Monitor data attachment to product lots for batch processes

#52
20150241866
2015-08-27

Adjustment apparatus for adjusting processing units provided in a substrate processing apparatus, and a substrate processing apparatus having such an adjustment apparatus

#53
20150206734
2015-07-23

Method and manufacturing system

#54
20150198942
2015-07-16

Object carrier transport system and method of transporting object carriers

#55
20150194355
2015-07-09

Crystal oscillator and the use thereof in semiconductor fabrication

#56
20150192924
2015-07-09

METHOD OF MONITORING ENVIRONMENTAL VARIATIONS IN A SEMICONDUCTOR FABRICATION EQUIPMENT AND APPARATUS FOR PERFORMING THE SAME

#57
20150168962
2015-06-18

Method of determining thermal stability of a substrate support assembly

#58
20150153729
2015-06-04

Workpiece processing apparatus and workpiece transfer system

#59
20150148935
2015-05-28

SUBSTRATE PROCESSING SYSTEM, SUBSTRATE PROCESSING APPARATUS, DATA PROCESSING METHOD, AND STORAGE MEDIUM

#60
20150105895
2015-04-16

Matching process controllers for improved matching of process

#61
20150066180
2015-03-05

Quick processing system and method for SMT equipment

#62
20150039116
2015-02-05

Substrate processing system, management device, and display method for facilitating trouble analysis

#63
20150011091
2015-01-08

Substrate processing method and control apparatus

#64
20140303769
2014-10-09

Substrate processing system, substrate processing apparatus and method for accumulating data for substrate processing apparatus

#65
20140303765
2014-10-09

Semiconductor processing dispatch control

#66
20130041494
2013-02-14

Alignment data based process control system

#67
20130013097
2013-01-10

Semiconductor processing dispatch control

#68
20120016509
2012-01-19

Semiconductor processing dispatch control

#69
20080097640
2008-04-24

Semiconductor equipment control system and method

#70
20060206223
2006-09-14

Methods for configuring a plasma cluster tool

#71
20060194351
2006-08-31

Methods and apparatus for configuring plasma cluster tools

#72
20060032517
2006-02-16

Apparatus and method for monitoring a process of wet cleaning

#73
20060010416
2006-01-12

System and method for searching for patterns of semiconductor wafer features in semiconductor wafer data

#74
20060009943
2006-01-12

Method and system for managing, analyzing and automating data in the production of semiconductor wafers and for monitoring the production process

#75
20060009942
2006-01-12

System and method for integrated data transfer, archiving and purging of semiconductor wafer data

#76
16551038
2020-08-25

Across-wafer profile control in semiconductor processes