ClassID:

182482

G05B2219/32018 - CPC Classification

Classification description:

Program-control systems; Nc systems; Operator till task planning Adapt process as function of results of quality measuring until maximum quality

Recent Application in this class:
#1
20210165400
2021-06-03

Maintaining quality control, regulatory, and parameter measurement data using distributed ledgers in process control systems

#2
20200410345
2020-12-31

Learning quality estimation device, method, and program

#3
20200225649
2020-07-16

Maintaining quality control, regulatory, and parameter measurement data using distributed ledgers in process control systems

#4
20200189167
2020-06-18

Method for controlling film production

#5
20190041833
2019-02-07

PRODUCTION PLANT WITH CONTROL OF THE PRODUCTION AND/OR CONSUMPTION RATE

#6
20180284740
2018-10-04

Intelligent processing modulation system and method

#7
20180239337
2018-08-23

Control method for the movement of a tool and control device

#8
20170144378
2017-05-25

Rapid closed-loop control based on machine learning

#9
20160370796
2016-12-22

System and method for determining field non-uniformities of a wafer processing chamber using a wafer processing parameter

#10
20150227139
2015-08-13

Correction value computation device, correction value computation method, and computer program

#11
20130066475
2013-03-14

Seawater desalination plant system

#12
20130060354
2013-03-07

Method and system for detecting and correcting problematic advanced process control parameters

#13
20110238189
2011-09-29

Method and Apparatus for Controlling a Plant Using Feedback Signals

#14
20100305737
2010-12-02

Tuning a process controller based on a dynamic sampling rate

#15
20080294280
2008-11-27

Processing condition determining method and apparatus, display method and apparatus, processing apparatus, measurement apparatus and exposure apparatus, substrate processing system, and program and information recording medium

#16
20080288100
2008-11-20

Method for creating a cutting plan for a strip-like material

#17
20060195211
2006-08-31

Method of process control

#18
20060116784
2006-06-01

System and method to analyze low yield of wafers caused by abnormal lot events

#19
20050137837
2005-06-23

Management system and apparatus, method therefor, and device manufacturing method

#20
20050118812
2005-06-02

Method of detecting, identifying and correcting process performance

#21
20050033466
2005-02-10

Creation and display of indices within a process plant