Data management and mining to correlate wafer alignment, design, defect, process, tool, and metrology data

Product quality prediction method for mass customization

Continuous prediction of expected chip performance throughout the production lifecycle

Automated model building and batch model building for a manufacturing process, process monitoring, and fault detection

Management system of semiconductor fabrication apparatus, abnormality factor extraction method of semiconductor fabrication apparatus, and management method of the same

Data representation relating to a non-sampled workpiece

System and method for performing process visualization