ClassID:

182629

G05B2219/32182 - CPC Classification

Classification description:

Program-control systems; Nc systems; Operator till task planning If state of tool, product deviates from standard, adjust system, feedback

Recent Application in this class:
#1
20240142958
2024-05-02

SYSTEM AND METHOD FOR DEFECT MITIGATION USING DATA ANALYSIS

#2
20230367286
2023-11-16

INTELLIGENT COGNITIVE ASSISTANT SYSTEM AND METHOD

#3
20230016208
2023-01-19

Method for determining propelling condition for shot medium, and method for manufacturing coil spring

#4
20210349452
2021-11-11

System and method for manufacturing a product having predetermined specifications

#5
20210116897
2021-04-22

Production and measurement of workpieces

#6
20200201304
2020-06-25

Systems and Methods for Adjusting Target Manufacturing Parameters on an Absorbent Product Converting Line

#7
20190240941
2019-08-08

Press and process for operating same

#8
20190143482
2019-05-16

Surface treatment processing method and surface treatment processing device

#9
20190049933
2019-02-14

Methods, systems, articles of manufacture and apparatus to improve boundary excursion detection

#10
20180217584
2018-08-02

Insitu tool health and recipe quality monitoring on a CDSEM

#11
20180143621
2018-05-24

Systems and methods for adjusting target manufacturing parameters on an absorbent product converting line

#12
20170185074
2017-06-29

Adjusting method for imprint apparatus, imprinting method, and article manufacturing method

#13
20160378094
2016-12-29

Online real-time control method for product manufacturing process

#14
20160239012
2016-08-18

Systems and methods of controlling a manufacturing process for a microelectronic component

#15
20150246588
2015-09-03

Uniformity of a tire using tooling signature analysis

#16
20150066187
2015-03-05

Systems and methods for adjusting target manufacturing parameters on an absorbent product converting line

#17
20150005945
2015-01-01

Real-time feedback control for performing tooling operations in assembly processes

#18
20140046466
2014-02-13

Integrated circuit product yield optimization using the results of performance path testing

#19
20140031969
2014-01-30

Run-to-run control utilizing virtual metrology in semiconductor manufacturing

#20
20140031968
2014-01-30

Run-to-run control utilizing virtual metrology in semiconductor manufacturing

#21
20130270728
2013-10-17

Method for regulating an injection molding process

#22
20130110274
2013-05-02

Systems and methods for process control including process-initiated workflow

#23
20120216169
2012-08-23

Based device risk assessment

#24
20120136470
2012-05-31

PROCESS FOR IMPROVING THE PRODUCTION OF PHOTOVOLTAIC PRODUCTS

#25
20120130520
2012-05-24

Factory level process and final product performance control system

#26
20120116733
2012-05-10

Data perturbation for wafer inspection or metrology setup using a model of a difference

#27
20120029856
2012-02-02

Method and system for providing process tool correctables

#28
20110093365
2011-04-21

System and process for monitoring, control and withdrawal of consumable items in a production environment

#29
20110049741
2011-03-03

METHOD OF MAKING CERAMIC BODIES HAVING REDUCED SHAPE VARIABILITY

#30
20090200171
2009-08-13

ELECTROCHEMICAL SENSING AND DATA ANALYSIS SYSTEM, APPARATUS AND METHOD FOR METAL PLATING

#31
20090132078
2009-05-21

Controlling device for substrate processing apparatus and method therefor

#32
20090063077
2009-03-05

Automated process control using parameters determined with approximation and fine diffraction models

#33
20090030543
2009-01-29

Semiconductor manufacturing process monitoring

#34
20080306624
2008-12-11

Advanced finishing control

#35
20080154420
2008-06-26

Method and algorithm for the control of critical dimensions in a thermal flow process

#36
20080140590
2008-06-12

PROCESS CONTROL INTEGRATION SYSTEMS AND METHODS

#37
20070221502
2007-09-27

TUNING ELECTRODES USED IN A REACTOR FOR ELECTROCHEMICALLY PROCESSING A MICROELECTRONIC WORKPIECE

#38
20070179651
2007-08-02

Automated tool recipe verification and correction

#39
20070162172
2007-07-12

Process monitoring device for sample processing apparatus and control method of sample processing apparatus

#40
20070034516
2007-02-15

Tuning electrodes used in a reactor for electrochemically processing a microelectronic workpiece

#41
20070017896
2007-01-25

Method for controlling a process for fabricating integrated devices

#42
20060235563
2006-10-19

METHOD AND APPARATUS FOR PROVIDING INTRA-TOOL MONITORING AND CONTROL

#43
20060195215
2006-08-31

Management system, management apparatus, management method, and device manufacturing method

#44
20060195211
2006-08-31

Method of process control

#45
20060142888
2006-06-29

Process monitoring device for sample processing apparatus and control method of sample processing apparatus

#46
20050288814
2005-12-29

System and method for fully automatic manufacturing control in a furnace area of a semiconductor foundry

#47
20050209723
2005-09-22

Method for yield improvement of manufactured products

#48
20050192698
2005-09-01

Method and system for improving process control for semiconductor manufacturing operations

#49
20050182596
2005-08-18

Method and system for analyzing wafer yield against uses of a semiconductor tool

#50
20050090914
2005-04-28

Process monitoring device for sample processing apparatus and control method of sample processing apparatus