ClassID:

182633

G05B2219/32186 - CPC Classification

Classification description:

Program-control systems; Nc systems; Operator till task planning Teaching inspection data, pictures and criteria and apply them for inspection

Recent Application in this class:
#1
20220147871
2022-05-12

METHOD AND SYSTEM FOR QUALITY CONTROL IN INDUSTRIAL MANUFACTURING

#2
20190271962
2019-09-05

Control method for processing apparatus

#3
20190243346
2019-08-08

Controlling multi-stage manufacturing process based on internet of things (IOT) sensors and cognitive rule induction

#4
20190223337
2019-07-18

Inspection management system, inspection management apparatuses, and inspection management method

#5
20190219521
2019-07-18

Inspection management system, inspection management apparatuses, and inspection management method

#6
20190039274
2019-02-07

Method for performing a cyclic production process

#7
20190004504
2019-01-03

Systems and methods for predicting defects and critical dimension using deep learning in the semiconductor manufacturing process

#8
20180292812
2018-10-11

Controlling multi-stage manufacturing process based on internet of things (IOT) sensors and cognitive rule induction

#9
20180197714
2018-07-12

Diagnostic methods for the classifiers and the defects captured by optical tools

#10
20170370714
2017-12-28

Shape evaluation method and shape evaluation apparatus

#11
20160012577
2016-01-14

Control system, control device, image processing device, and control method

#12
20110206242
2011-08-25

Instrumental Support for Monitoring the Color Imprint in the Manufacture of Surfaces Patterned in Multiple Colors

#13
20090281755
2009-11-12

Recipe parameter management system and recipe parameter management method

#14
20090063077
2009-03-05

Automated process control using parameters determined with approximation and fine diffraction models

#15
20080013821
2008-01-17

Method for controlling the appearance of products and process performance by image analysis

#16
20070239306
2007-10-11

Automatically selecting wafers for review

#17
20070185683
2007-08-09

Method and system for deriving time-dependent dielectric breakdown lifetime

#18
20070135960
2007-06-14

Production evaluation managing system and managing method

#19
20060271226
2006-11-30

Inspection standard setting device, inspection standard setting method and process inspection device

#20
20050205528
2005-09-22

Method for controlling the quality of industrial processes and system therefrom