ClassID:

182637

G05B2219/32191 - CPC Classification

Classification description:

Program-control systems; Nc systems; Operator till task planning Real time statistical process monitoring

Recent Application in this class:
#1
20250321568
2025-10-16

INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AND STORAGE MEDIUM

#2
20250164986
2025-05-22

SYSTEM AND METHOD FOR MONITORING MANUFACTURING

#3
20230409014
2023-12-21

Industrial Bottleneck Detection and Management Method and System

#4
20230064629
2023-03-02

MONITORING OF A PLANT CONDITION

#5
20230043354
2023-02-09

Method of Determining at least one tolerance band limit value for a technical variable under test and corresponding calculation device

#6
20220244713
2022-08-04

Methods for Determining a Limit of a Tolerance Interval, Method for Evaluating a Production Process and Corresponding Calculation Device

#7
20220137579
2022-05-05

OPTIMIZED PROCESS CONTROL

#8
20210349455
2021-11-11

System and method for monitoring manufacturing

#9
20210173387
2021-06-10

Industrial bottleneck detection and management method and system

#10
20200233408
2020-07-23

System and method for monitoring manufacturing

#11
20200057433
2020-02-20

Anomaly detection and anomaly-based control

#12
20200050180
2020-02-13

METHODS & APPARATUS FOR CONTROLLING AN INDUSTRIAL PROCESS

#13
20190369607
2019-12-05

DISTRIBUTED INDUSTRIAL PERFORMANCE MONITORING AND ANALYTICS PLATFORM

#14
20190265688
2019-08-29

Anomaly detection and anomaly-based control

#15
20190265686
2019-08-29

PRODUCT QUALITY MANAGEMENT SYSTEM AND METHOD FOR MANAGING QUALITY OF PRODUCT

#16
20190035657
2019-01-31

Substrate processing apparatus and device management controller

#17
20180335769
2018-11-22

SYSTEM AND METHOD FOR MANUFACTURING DATA CAPTURE AND MESSAGING

#18
20180311914
2018-11-01

Process control of a composite fabrication process

#19
20180267521
2018-09-20

Method for manufacturing parts based on analysis of weighted statistical indicators

#20
20180267520
2018-09-20

METHOD FOR MANUFACTURING PARTS BASED ON SIMULTANEOUS ANALYSIS OF STATISTICAL INDICATORS

#21
20180267519
2018-09-20

METHOD OF MANUFACTURING PARTS BASED ON THE ANALYSIS OF CENTRING COEFFICIENTS

#22
20180239340
2018-08-23

Method for determining abnormal equipment in semiconductor manufacturing system and program product

#23
20180232339
2018-08-16

Monitoring device, method and computer-readable recording medium for controlling monitoring device

#24
20180232338
2018-08-16

Monitoring device, method and computer-readable recording medium for controlling monitoring device

#25
20180113442
2018-04-26

Process device condition and performance monitoring

#26
20170329317
2017-11-16

Method of manufacturing parts based on analysis of statistical indicators in a situation of diminished control

#27
20170160733
2017-06-08

System and method for monitoring manufacturing

#28
20170102694
2017-04-13

Distributed industrial performance monitoring and analytics platform

#29
20170097638
2017-04-06

Methods of error detection in fabrication processes

#30
20170086480
2017-03-30

WEARABLE TASTE GENERATION DEVICE

#31
20170031344
2017-02-02

METHOD OF MANAGING ADDITIVE APPLICATIONS IN AN AGRICULTURAL ENVIRONMENT

#32
20160328892
2016-11-10

Method and computer program for the monitoring of a thrust reverser having hydraulic actuators

#33
20160054231
2016-02-25

Method for the quality assessment of a component produced by means of an additive manufacturing method

#34
20150193378
2015-07-09

Adaptive value capture for process monitoring

#35
20150148933
2015-05-28

Monitor system and method for semiconductor processes

#36
20130338810
2013-12-19

Manufacturing control apparatus and manufacturing control system

#37
20130173042
2013-07-04

Semiconductor manufacturing equipment

#38
20130060354
2013-03-07

Method and system for detecting and correcting problematic advanced process control parameters

#39
20130006406
2013-01-03

Method and system for evaluating a machine tool operating characteristics

#40
20120150330
2012-06-14

Method of controlling semiconductor process distribution

#41
20120136470
2012-05-31

PROCESS FOR IMPROVING THE PRODUCTION OF PHOTOVOLTAIC PRODUCTS

#42
20110320026
2011-12-29

System and method for data mining and feature tracking for fab-wide prediction and control

#43
20110307220
2011-12-15

Identifying failures in an aeroengine

#44
20110251707
2011-10-13

Manufacturing execution system with virtual-metrology capabilities and manufacturing system including the same

#45
20110224819
2011-09-15

Method for controlling critical dimension in semiconductor production process, and semiconductor manufacturing line supporting the same

#46
20110071661
2011-03-24

Substrate processing system

#47
20100249976
2010-09-30

Method and system for evaluating a machine tool operating characteristics

#48
20100233830
2010-09-16

Method for monitoring fabrication parameter

#49
20100100221
2010-04-22

Expert knowledge methods and systems for data analysis

#50
20100004775
2010-01-07

Method and system for defect detection in manufacturing integrated circuits

#51
20090292385
2009-11-26

Automated throughput control system and method of operating the same

#52
20090222123
2009-09-03

Method and system for scheduling a set of events in real time

#53
20090171476
2009-07-02

Control System for Production Machine

#54
20090105854
2009-04-23

Method of optimizing queue times in a production cycle

#55
20080306625
2008-12-11

Dual-phase virtual metrology method

#56
20080306621
2008-12-11

SEMICONDUCTOR MANUFACTURING APPARATUS CONTROL SYSTEM AND STATISTICAL PROCESS CONTROL METHOD THEREOF

#57
20080262795
2008-10-23

Process Equipment Monitoring

#58
20070191980
2007-08-16

Method for managing tools using statistical process control

#59
20070168069
2007-07-19

Solid model of statistical process control

#60
20070124118
2007-05-31

Expert knowledge methods and systems for data analysis

#61
20070012085
2007-01-18

Method and apparatus for detecting abnormal characteristic values capable of suppressing detection of normal characteristic values

#62
20060195215
2006-08-31

Management system, management apparatus, management method, and device manufacturing method

#63
20060195212
2006-08-31

Automated throughput control system and method of operating the same

#64
20060173652
2006-08-03

Method for balancing an article for rotation

#65
20060075314
2006-04-06

Fault detection and classification (FDC) specification management apparatus and method thereof

#66
20060070014
2006-03-30

Real time monitoring system of semiconductor manufacturing information

#67
20050288810
2005-12-29

Automatic statistical process control (SPC) chart generation apparatus and method thereof

#68
20050187648
2005-08-25

Semiconductor process and yield analysis integrated real-time management method

#69
20050075835
2005-04-07

System and method of real-time statistical bin control

#70
20050043849
2005-02-24

Method for assessing accuracy of positioning of a multi-axis numerically controlled machine

#71
20050038543
2005-02-17

Method and system for synchronizing control limit and equipment performance

#72
20050015176
2005-01-20

Method for automatic configuration of processing system