ClassID:

182646

G05B2219/32201 - CPC Classification

Classification description:

Program-control systems; Nc systems; Operator till task planning Build statistical model of past normal proces, compare with actual process

Recent Application in this class:
#1
20250271847
2025-08-28

DATA INTERGRATION

#2
20240272629
2024-08-15

MATERIAL PROCESSING OPTIMIZATION

#3
20230273608
2023-08-31

MATERIAL PROCESSING OPTIMIZATION

#4
20230273607
2023-08-31

INSPECTION RATE ADAPTATION

#5
20230205196
2023-06-29

SENSOR METROLOGY DATA INTERGRATION

#6
20220395954
2022-12-15

Prognostic and health management system for precision ball grinding machines

#7
20220179402
2022-06-09

METHOD AND DEVICE FOR ANALYZING A SEQUENTIAL PROCESS

#8
20210133593
2021-05-06

Analysis of anomalies in a facility

#9
20210116895
2021-04-22

Characterizing and monitoring electrical components of manufacturing equipment

#10
20200264335
2020-08-20

Sensor metrology data integration

#11
20200209839
2020-07-02

Material processing optimization

#12
20200026590
2020-01-23

Component failure prediction

#13
20190033840
2019-01-31

Facility diagnosis device, facility diagnosis method, and facility diagnosis program

#14
20180267521
2018-09-20

Method for manufacturing parts based on analysis of weighted statistical indicators

#15
20180267520
2018-09-20

METHOD FOR MANUFACTURING PARTS BASED ON SIMULTANEOUS ANALYSIS OF STATISTICAL INDICATORS

#16
20180267519
2018-09-20

METHOD OF MANUFACTURING PARTS BASED ON THE ANALYSIS OF CENTRING COEFFICIENTS

#17
20180217584
2018-08-02

Insitu tool health and recipe quality monitoring on a CDSEM

#18
20180203439
2018-07-19

Prediction model creation apparatus, production facility monitoring system, and production facility monitoring method

#19
20180150038
2018-05-31

Building a workpiece quality prediction model

#20
20170365155
2017-12-21

Method and system for monitoring sensor data of rotating equipment

#21
20170083012
2017-03-23

Methods and apparatus to define stages for multi-variate batch control analytics

#22
20160328892
2016-11-10

Method and computer program for the monitoring of a thrust reverser having hydraulic actuators

#23
20160313023
2016-10-27

Systems and methods for retraining outlier detection limits in a building management system

#24
20160154395
2016-06-02

System and method for equipment monitoring using a group candidate baseline and probabilistic model

#25
20160054231
2016-02-25

Method for the quality assessment of a component produced by means of an additive manufacturing method

#26
20140365195
2014-12-11

System and method for monitoring a process

#27
20140279795
2014-09-18

Facility state monitoring method and device for same

#28
20130338810
2013-12-19

Manufacturing control apparatus and manufacturing control system

#29
20130110263
2013-05-02

Bi-directional association and graphical acquisition of time-based equipment sensor data and material-based metrology statistical process control data

#30
20130024019
2013-01-24

APPARATUS AND METHODS FOR END POINT DETERMINATION IN SEMICONDUCTOR PROCESSING

#31
20120303142
2012-11-29

AUTOMATED MODEL BUILDING AND MODEL UPDATING

#32
20120136470
2012-05-31

PROCESS FOR IMPROVING THE PRODUCTION OF PHOTOVOLTAIC PRODUCTS

#33
20120102052
2012-04-26

Specification establishing method for controlling semiconductor process

#34
20120041574
2012-02-16

Temporary expanding integrated monitoring network

#35
20120035755
2012-02-09

Process control using process data and yield data

#36
20120016643
2012-01-19

VIRTUAL MEASURING SYSTEM AND METHOD FOR PREDICTING THE QUALITY OF THIN FILM TRANSISTOR LIQUID CRYSTAL DISPLAY PROCESSES

#37
20110307220
2011-12-15

Identifying failures in an aeroengine

#38
20110224819
2011-09-15

Method for controlling critical dimension in semiconductor production process, and semiconductor manufacturing line supporting the same

#39
20100100223
2010-04-22

Process control using process data and yield data

#40
20100017008
2010-01-21

Systems and methods for offline and/or online batch monitoring using decomposition and signal approximation approaches

#41
20090299497
2009-12-03

Tolerance interval determination method

#42
20090295561
2009-12-03

System and method for advanced condition monitoring of an asset system

#43
20090292385
2009-11-26

Automated throughput control system and method of operating the same

#44
20090228247
2009-09-10

Process control using process data and yield data

#45
20090185493
2009-07-23

Hierarchical and incremental multivariate analysis for process control

#46
20090037013
2009-02-05

Automated model building and model updating

#47
20090019408
2009-01-15

Production method, design method and design system for semiconductor integrated circuit

#48
20080306624
2008-12-11

Advanced finishing control

#49
20080306621
2008-12-11

SEMICONDUCTOR MANUFACTURING APPARATUS CONTROL SYSTEM AND STATISTICAL PROCESS CONTROL METHOD THEREOF

#50
20080243271
2008-10-02

SYSTEM AND METHOD FOR QUANTIFYING AN IMPROVEMENT IN AN ADVANCED PROCESS CONTROL STRATEGY

#51
20080103751
2008-05-01

Temporary expanding integrated monitoring network

#52
20080033589
2008-02-07

Data mining to detect performance quality of tools used repetitively in manufacturing

#53
20080015814
2008-01-17

Adaptive multivariate fault detection

#54
20080010032
2008-01-10

Yield estimation method for LSI

#55
20080005066
2008-01-03

Methods of analyzing integrated circuit equivalency and manufacturing an integrated circuit

#56
20070203604
2007-08-30

Product quality tracking system and method

#57
20060259163
2006-11-16

Temporary expanding integrated monitoring network

#58
20060195212
2006-08-31

Automated throughput control system and method of operating the same

#59
20060080055
2006-04-13

Automatic quality control method for production line and apparatus therefor as well as automatic quality control program

#60
20050216114
2005-09-29

Method for providing control to an industrial process using one or more multidimensional variables

#61
20050159922
2005-07-21

System for monitoring an environment

#62
20050154542
2005-07-14

Method and apparatus to diagnose mechanical problems in machinery

#63
20050154482
2005-07-14

Plasma processing method and apparatus

#64
20050131573
2005-06-16

System and method for manufacturing control

#65
20050118812
2005-06-02

Method of detecting, identifying and correcting process performance

#66
20050043849
2005-02-24

Method for assessing accuracy of positioning of a multi-axis numerically controlled machine