ClassID:

182649

G05B2219/32204 - CPC Classification

Classification description:

Program-control systems; Nc systems; Operator till task planning Performance assurance; assure certain level of non-defective products

Recent Application in this class:
#1
20250291330
2025-09-18

GENERATING FACILITY HEALTH STATUSES FOR A PROCESSING FACILITY

#2
20250110486
2025-04-03

MANAGING PERFORMANCE OF ASSETS IN INDUSTRIAL FACILITIES

#3
20240402692
2024-12-05

BUILDING MANAGEMENT SYSTEM WITH BUILDING EQUIPMENT SERVICING

#4
20240394163
2024-11-28

SYSTEM, APPARATUS AND METHODS FOR AUTOMATICALLY TESTING MOBILE DEVICES

#5
20230152787
2023-05-18

PERFORMANCE OPTIMIZATION OF COMPLEX INDUSTRIAL SYSTEMS AND PROCESSES

#6
20230070525
2023-03-09

SYSTEM AND METHOD FOR WORK QUALITY ASSURANCE IN VEHICLE MANUFACTURING

#7
20230004138
2023-01-05

Data processing method, device and system, and electronic device

#8
20210011824
2021-01-14

System, apparatus and methods for automatically testing mobile devices

#9
20190346820
2019-11-14

ABNORMALITY DETECTION SYSTEM, SEMICONDUCTOR DEVICE MANUFACTURING SYSTEM AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD

#10
20180305158
2018-10-25

Method and devices and system for winding and unwinding a reel

#11
20180292806
2018-10-11

Abnormality detection system, semiconductor device manufacturing system and semiconductor device manufacturing method

#12
20180074481
2018-03-15

Systems and methods of use for commodities analysis, collection, resource-allocation, and tracking

#13
20180071789
2018-03-15

Systems and methods of use for commodities analysis, collection, resource-allocation, and tracking

#14
20170277165
2017-09-28

Solder inspection apparatus and method of generating feedback information of solder inspection apparatus

#15
20150338847
2015-11-26

METHOD AND APPARATUS FOR DISCOVERING EQUIPMENT CAUSING PRODUCT DEFECT IN MANUFACTURING PROCESS

#16
20140121820
2014-05-01

Systems and methods for manufacturing optimization

#17
20090006300
2009-01-01

Detecting and evaluating operation-dependent processes in automated production utilizing fuzzy operators and neural network system

#18
20070174797
2007-07-26

Predicting IC manufacturing yield by considering both systematic and random intra-die process variations

#19
20060206230
2006-09-14

Method and apparatus for detecting abnormal characteristic values capable of suppressing detection of normal characteristic values