Patents-Review.com
ClassID:

182664 ⎘

G05B2219/32221 - CPC Classification

Classification description:

Program-control systems; Nc systems; Operator till task planning Correlation between defect and measured parameters to find origin of defect

Recent Application in this class:
#1
20240192668
2024-06-13

DEFECT PROFILING AND TRACKING SYSTEM FOR PROCESS-MANUFACTURING ENTERPRISE

 #2
20180259944
2018-09-13

Management system and non-transitory computer-readable recording medium

 #3
20180224836
2018-08-09

Management system and non-transitory computer-readable recording medium

 #4
20170308057
2017-10-26

Computer-implemented method for part analytics of a workpiece machined by at least one CNC machine

 #5
20170308049
2017-10-26

Production system that sets determination value of variable relating to abnormality of product

 #6
20130074667
2013-03-28

DEVICE FOR SLICING A FOOD PRODUCT AND DEVICE WITH A ROBOT

 #7
20130030760
2013-01-31

ARCHITECTURE FOR ANALYSIS AND PREDICTION OF INTEGRATED TOOL-RELATED AND MATERIAL-RELATED DATA AND METHODS THEREFOR

 #8
20120323855
2012-12-20

Substrate processing system and group managing apparatus

 #9
20110245956
2011-10-06

Method and system for managing semiconductor manufacturing device

 #10
20110153660
2011-06-23

METHOD OF SEARCHING FOR KEY SEMICONDUCTOR OPERATION WITH RANDOMIZATION FOR WAFER POSITION

 #11
20100175965
2010-07-15

PALLET MONITORING SYSTEM AND MONITORING METHOD

 #12
20100093114
2010-04-15

METHOD OF SEARCHING FOR KEY SEMICONDUCTOR OPERATION WITH RANDOMIZATION FOR WAFER POSITION

 #13
20100004775
2010-01-07

Method and system for defect detection in manufacturing integrated circuits

 #14
20090157357
2009-06-18

DIAGNOSTIC METHOD FOR MANUFACTURING PROCESSES

 #15
20090058456
2009-03-05

Manufacturing system, manufacturing method, managing apparatus, managing method and computer readable medium

 #16
20080270058
2008-10-30

Combine-information processing apparatus, method for processing combine-information, program, and recording medium

 #17
20080147226
2008-06-19

Method and system for managing semiconductor manufacturing device

 #18
20080004823
2008-01-03

Defect detection system, defect detection method, and defect detection program

 #19
20070219738
2007-09-20

Tool health information monitoring and tool performance analysis in semiconductor processing

 #20
20070038412
2007-02-15

Diagnostic method for manufacturing processes

 #21
20060168484
2006-07-27

System and method for process degradation problematic tool identification

 #22
20060143547
2006-06-29

Method and device for identifying the cause of failures in industrial processes

 #23
20060106579
2006-05-18

Diagnostic method for manufacturing processes

 #24
20050278053
2005-12-15

Semiconductor manufacturing fault detection and management system and method

 #25
20050143849
2005-06-30

Controlling method for manufacturing process comprising determining a priority of manufacturing process needing recovery in response to degree of risk

 #26
20050096871
2005-05-05

Diagnostic method for manufacturing processes