182797 ⎘
Program-control systems; Nc systems; Operator till task planning Quality control
PLY TEMPLATING FOR COMPOSITE FABRICATION WITH AI QUALITY CONTROL MODULES
#2METHOD OF DETECTING ABNORMALITY IN SEMICONDUCTOR MANUFACTURING PROCESS AND PROGRAM FOR PERFORMING THE SAME
#3METHODS, SYSTEMS, AND STORAGE MEDIA FOR ASSEMBLY OPERATION CONTROL BASED ON INDUSTRIAL INTERNET OF THINGS
#4EXOGENOUSLY INFORMED TECHNIQUES FOR ROBUST AND CYBERSECURE MANUFACTURING SYSTEMS
#5SYSTEM AND METHOD FOR COLLECTING REAL-TIME MANUFACTURING DATA USING AN INTERNET OF THINGS FACTORY GATEWAY
#6SYSTEMS AND METHODS FOR MONITORING THIN FILM SUBSTRATE MANUFACTURING PROCESSES
#7FABRICATION FINGERPRINT FOR PROACTIVE YIELD MANAGEMENT
#8SYSTEM, INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AND RECORDING MEDIUM
#9MANUFACTURING INSPECTION SYSTEMS AND ASSOCIATED METHODS
#10BATTERY SERVICING SYSTEM FOR USE IN BATTERY SERVICING STATION AND METHOD THEREOF
#11SYSTEMS AND METHODS OF ASSIGNING MICROTASKS OF WORKFLOWS TO TELEOPERATORS
#12PROCESS MANAGEMENT SYSTEM AND OPERATING METHOD THEREOF
#13COMPUTER-IMPLEMENTED METHOD AND DEVICE FOR VERIFYING CORRECTNESS OF ASSEMBLY
#14INTELLIGENT AUTOMATION OF PLANT INFORMATION REAL-TIME DATA TAG CONFIGURATION AND QUALITY ASSURANCE/QUALITY CONTROL
#15ABNORMALITY DETERMINATION DEVICE, ABNORMALITY DETERMINATION METHOD, AND RECORDING MEDIUM
#16ADAPTIVE TOLERANCING AND MACHINING PARAMETERS FOR SUBSEQUENT MACHINING
#17ESTIMATION OF CHAMBER COMPONENT CONDITIONS USING SUBSTRATE MEASUREMENTS
#18MODELS FOR MISMATCHED PERFORMANCES IN SEMICONDUCTOR EQUIPMENT
#19RAPID PART ASSESSMENT WITH K-FOLD EVALUATION USING HISTORIC DATA AND TEST DATA
#20System and Method for Post-Production Part Lot Grading
#21DIGITAL TWIN CONTROL SYSTEM FOR PRODUCT PROCESSING QUALITY
#22MANUFACTURING DEVICE
#23DYNAMIC PROCESS CONTROL IN SEMICONDUCTOR MANUFACTURING
#24SYSTEMS AND METHODS FOR AUTOMATIC AND SELECTIVE QUALITY CONTROL USING HYBRID MACHINE LEARNING
#25COMPUTER-SUPPORTED MANUFACTURING METHOD, AND MANUFACTURING SYSTEM
#26SYSTEM AND METHOD FOR MONITORING PRODUCT PROCESSING EQUIPMENT OF AN INDUSTRIAL PLANT
#27COMPUTER IMPLEMENTED METHOD FOR DEFECT DETECTION IN AN IMAGING DATASET OF A WAFER, CORRESPONDING COMPUTER-READABLE MEDIUM, COMPUTER PROGRAM PRODUCT AND SYSTEMS MAKING USE OF SUCH METHODS
#28ROBOTIC AUTOMATION OF PRODUCT QUALITY ASSURANCE METHODS
#29PRODUCTION SYSTEM FOR PACKAGING ELEMENTS FOR AEROSOL-GENERATING ARTICLES WITH PACKAGING ELEMENT IDENTIFICATION
#30Method and Apparatus for Monitoring an Anomaly Score in Semiconductor Manufacturing
#31DEVICE CONTROL METHOD AND APPARATUS, CONTROLLER, ELECTRONIC DEVICE, AND DEVICE CONTROL SYSTEM
#32SYSTEMS FOR CYBER-PHYSICAL PASSPORTS AND RELATED METHODS
#33METHOD OF MANUFACTURING MULTIPLE DOSAGE FORMS WITH PERSONALISED COMPOSITION AND DEVICE FOR CARRYING OUT THIS METHOD
#34SIMULATION METHOD AND SIMULATION APPARATUS FOR COATER FOR SECONDARY BATTERY PRODUCTION
#35INFORMATION PROVIDING SYSTEM, INFORMATION PROVIDING METHOD, AND NON-TRANSITORY COMPUTER-READABLE RECORDING MEDIUM
#36METHODS, SYSTEMS, AND STORAGE MEDIA FOR ASSEMBLY QUALITY CONTROL BASED ON INDUSTRIAL INTERNET OF THINGS (IIOT)
#37Automated Monitoring Using Image Analysis
#38DATA PROCESSING METHOD AND DATA PROCESSING DEVICE
#39MANUFACTURING CONTROL METHOD AND NON-TRANSITORY COMPUTER READABLE MEDIA
#40FINDING POSSIBLE TECHNICAL CAUSES OF OR SOLUTIONS FOR MALFUNCTIONS OF A PRODUCTION CELL
#41CREPING PROCESS PERFORMANCE TRACKING AND CONTROL
#42ACCELERATING PREVENTATIVE MAINTENANCE RECOVERY AND RECIPE OPTIMIZING USING MACHINE-LEARNING BASED ALGORITHM
#43COMPUTER-IMPLEMENTED METHOD AND TOOL FOR OPTICAL QUALITY CONTROL OF INTERMEDIATE OR END PRODUCTS OF PRODUCTION INSTALLATIONS, AND PRODUCTION INSTALLATION CONTROLLER
#44COMPUTER IMPLEMENTED METHOD FOR THE DETECTION AND CLASSIFICATION OF ANOMALIES IN AN IMAGING DATASET OF A WAFER, AND SYSTEMS MAKING USE OF SUCH METHODS
#45MULTI-TARGET DESIGN FOR IN-SITU ANALYSIS OF SEMICONDUCTOR FABRICATION PROCESS
#46PROGNOSTICS ACCELERATION FOR MACHINE LEARNING ANOMALY DETECTION
#47INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AND PROGRAM
#48Deep-learning-based SLM online quality monitoring and repairing methods and deep-learning-based SLM online quality monitoring and repairing system
#49APPARATUS, METHOD, AND COMPUTER PROGRAM PRODUCT FOR QUALITY REPORT WORKFLOW CONFIGURATION AND STATUS TRACKING
#50Method and apparatus for processing accelerated test data based on multiple performance degradation, and computer device
#51WELD MONITORING SYSTEMS WITH UNKNOWN DOWNTIME DISABLING
#52NPU WITH CAPABILITY OF BUILT-IN SELF-TEST
#53Molding Management System
#54SYSTEMS, METHODS, AND COMPUTER PROGRAM PRODUCTS FOR QUALITY CONTROL
#55Production Process Management System
#56QUALITY ABNORMALITY ANALYSIS METHOD, METHOD OF MANUFACTURING METAL MATERIAL, AND QUALITY ABNORMALITY ANALYSIS DEVICE
#57AUTOMATED ARTIFICIAL INTELLIGENCE (AI) INSPECTION OF CUSTOMIZED PART PRODUCTION
#58METHOD FOR PERFORMING AGING TEST ON SEMICONDUCTOR USED FOR NEURAL NETWORK
#59NPU CAPABLE OF PERFORMING RUNTIME TEST
#60MATERIAL PROCESSING OPTIMIZATION
#61Device for Clustering-based Labeling, Device for Anomaly Detection, and Methods therefor
#62SYSTEMS AND METHODS FOR MONITORING AND CONTROLLING INDUSTRIAL PROCESSES
#63AN APPARATUS, SYSTEM AND METHOD FOR FUNCTIONAL TEST FAILURE PREDICTION
#64MODULE FOR PREDICTING SEMICONDUCTOR PHYSICAL DEFECTS AND METHOD THEREOF
#65METHOD AND DEVICE FOR QUALITY ASSURANCE OF A CONTAINER PROCESSING PLANT
#66DATA PROCESSING METHODS AND SYSTEMS, AND COMPUTER-READABLE STORAGE MEDIA
#67SHARED DATA INDUCED QUALITY CONTROL SYSTEM FOR MATERIALS
#68INDUSTRIAL QUALITY MONITORING SYSTEM WITH PRE-TRAINED FEATURE EXTRACTION
#69CHAMBER MATCHING BY EQUIPMENT CONSTANT UPDATES
#70Computer-Implemented Methods Referring to an Industrial Process for Manufacturing a Product and System for Performing Said Methods
#71DETECTING DEFECTS OF SEMICONDUCTOR MANUFACTURING ASSEMBLIES
#72HYBRID MODEL CREATION METHOD, HYBRID MODEL CREATION DEVICE, AND RECORDING MEDIUM
#73AUTOMATED SIMULATION METHOD BASED ON DATABASE IN SEMICONDUCTOR DESIGN PROCESS, AUTOMATED SIMULATION GENERATION DEVICE AND SEMICONDUCTOR DESIGN AUTOMATION SYSTEM PERFORMING THE SAME, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE USING THE SAME
#74VIRTUAL METROLOGY METHODS FOR WAFERS, PREDICTION METHODS FOR CIRCUIT CHARACTERISTICS OF WAFERS AND PROCESS CONTROL SYSTEMS
#75WELD QUALITY INSPECTION SYSTEM
#76STATIC ELIMINATOR AND STATIC ELIMINATION SYSTEM
#77QUALITY IMPROVEMENT ASSISTANCE DEVICE
#78DATA PROCESSING METHOD, AND ELECTRONIC DEVICE AND STORAGE MEDIUM
#79MACHINE TOOL AND METHOD OF MACHINING A WORKPIECE
#80System of Matching Segmented Words to Check Correctness of Components of Device and Method Thereof
#81METHODS FOR QUALITY CONTROL OF CONTACT LENSES
#82WELD SPOT ANALYTICS
#83NPU capable of testing component including memory during runtime
#84NPU capable of testing component therein during runtime, the testing including function test
#85Neural processing unit capable of testing component therein during runtime
#86CHEMICAL PRODUCTION
#87CHEMICAL PRODUCTION CONTROL
#88Bayesian decomposition for mismatched performances in semiconductor equipment
#89Manufacturing process qualification system and method
#90METHOD AND APPARATUS FOR AUTOMATED QUALITY CONTROL FOR CUTTING MACHINES OF FLEXIBLE MATERIAL PARTS
#91DATA FUSION OF MULTIPLE SENSORS
#92Automatic testing method and automatic testing device employing the method
#93MANUFACTURING MANAGEMENT SYSTEM
#94SYSTEM AND METHOD FOR PREDICTIVE ANALYTICS FOR FITNESS OF TEST PLAN
#95Production and measurement of workpieces
#96PRODUCTION MANAGEMENT SYSTEM, PRODUCTION MANAGEMENT METHOD, AND PRODUCTION MANAGEMENT PROGRAM
#97METHOD FOR APPLYING CONTROL REFERENCE VALUE TO SPECIMEN ANALYZER, SPECIMEN ANALYZER, AND COMPUTER PROGRAM
#98MATERIAL PROCESSING OPTIMIZATION
#99MANUFACTURING STEP MANAGEMENT SYSTEM, MANUFACTURING STEP MANAGEMENT DEVICE, MANUFACTURING STEP MANAGEMENT METHOD, AND PROGRAM
#100SUBSTRATE PROCESSING CONDITION SETTING METHOD, SUBSTRATE PROCESSING METHOD, SUBSTRATE PROCESSING CONDITION SETTING SYSTEM, AND SUBSTRATE PROCESSING SYSTEM
#101Method and system for performing quality control on a diagnostic analyzer
#102System, method and computer program for controlling a production plant consisting of a plurality of plant parts, in particular a metallurgical production plant for producing industrial goods such as metal semi-finished products and/or metal end products
#103ESTIMATION OF CHAMBER COMPONENT CONDITIONS USING SUBSTRATE MEASUREMENTS
#104SYSTEM AND METHOD FOR MANUFACTURING AND MAINTENANCE
#105SYSTEM AND METHOD OF ENHANCING RELIABILITY OF FUSED DEPOSITION MODELLING (FDM) PROCESS USING A NOZZLE CAMERA AND ARTIFICIAL INTELLIGENCE
#106Industrial internet of things systems for inspection operation management of inspection robots and methods thereof
#107VISUAL FEEDBACK CONTROLLER
#108PRODUCTION DEFECT AND ABNORMALITY REPORT AND TRACK RECORD RETRIEVAL SYSTEM FOR THE TEXTILE INDUSTRY
#109Accelerating preventative maintenance recovery and recipe optimizing using machine-learning based algorithm
#110Distributed computing system for product defect analysis
#111WHOLE-PROCESS DIGITAL PROCESSING SYSTEM OF MAGNETIC SWITCH SENSOR AND PROCESSING METHOD THEREOF
#112METHOD FOR PRODUCING MATERIAL BOARDS IN A PRODUCTION PLANT, PRODUCTION PLANT, COMPUTER-PROGRAM PRODUCT AND USE OF A COMPUTER-PROGRAM PRODUCT
#113Manufacture Modeling And Monitoring
#114PLY TEMPLATING FOR COMPOSITE FABRICATION WITH AI QUALITY CONTROL MODULES
#115SYSTEMS AND METHODS FOR COMPOSITE FABRICATION WITH AI QUALITY CONTROL MODULES
#116MOLD INSPECTION FOR COMPOSITE FABRICATION WITH AI QUALITY CONTROL MODULES
#117LAYUP TABLE FOR COMPOSITE FABRICATION WITH AI QUALITY CONTROL MODULES
#118MODEL-BASED CHARACTERIZATION OF PLASMAS IN SEMICONDUCTOR PROCESSING SYSTEMS
#119Method for testing a standard interface and interface-tester
#120Automated monitoring using image analysis
#121PROCESSING APPARATUS GROUP MANAGEMENT SYSTEM, PROCESSING APPARATUS GROUP MANAGEMENT METHOD, AND PROGRAM
#122USING ELEMENTAL MAPS INFORMATION FROM X-RAY ENERGY-DISPERSIVE SPECTROSCOPY LINE SCAN ANALYSIS TO CREATE PROCESS MODELS
#123State monitoring method, state monitoring apparatus and state monitoring system for developing device
#124Image analysis device, control device, mechanical system, image analysis method, and computer program for image analysis
#125Semiconductor Analysis System
#126Wafer defect test apparatus, wafer defect test system, wafer test method and fabrication method of a wafer
#127Online monitoring of additive manufacturing using acoustic emission methods
#128METHOD FOR DETERMINING THE LEVEL OF UNUSUALNESS OF INDIVIDUALS, IN PARTICULAR IN ORDER TO STATISTICALLY DETECT UNUSUAL INDIVIDUALS IN A MULTIVARIATE CONTEXT
#129SYSTEM AND METHOD FOR CONTROLLING AUTOMATIC INSPECTION OF ARTICLES
#130SYSTEMS AND METHODS FOR ANOMALY RECOGNITION AND DETECTION USING LIFELONG DEEP NEURAL NETWORKS
#131Automated inspection program generation
#132System and method for AI visual inspection
#133SYSTEM FOR THE OPERATION OF A PRODUCTION MACHINE FOR PLASTICS PROCESSING
#134Anomaly determination device and anomaly determination method
#135Systems and methods for enhanced wafer manufacturing
#136FABRICATION FINGERPRINT FOR PROACTIVE YIELD MANAGEMENT
#137CLOUD-BASED VIBRATORY FEEDER CONTROLLER
#138System and method for controlling quality of vehicle
#139Dynamic process control in semiconductor manufacturing
#140Method for Controlling a Production Process for Producing Components
#141INTEGRATED HARDWARE-SOFTWARE COMPUTER VISION SYSTEM FOR AUTONOMOUS CONTROL AND INSPECTION OF SUBSTRATE PROCESSING SYSTEMS
#142METHOD, APPARATUSES, COMPUTER PROGRAM AND MEDIUM INCLUDING COMPUTER INSTRUCTIONS FOR PERFORMING INSPECTION OF AN ITEM
#143Device and method for automatic calculation of measurement confidence in flexible modular plants and machines
#144Creping process performance tracking and control
#145HEART VALVE MANUFACTURING DEVICES AND METHODS
#146Method and computer programme for discovering possible errors in a production process
#147METHOD FOR ANALYSING QUALITY DEFICIENCIES
#148METHOD FOR CHECKING WORKPIECES, CHECKING FACILITY AND TREATMENT FACILITY
#149METHOD FOR MEASURING AND CORRECTING MISREGISTRATION BETWEEN LAYERS IN A SEMICONDUCTOR DEVICE, AND MISREGISTRATION TARGETS USEFUL THEREIN
#150MONITORING SYSTEM
#151SYSTEM AND METHOD FOR COLLECTING REAL-TIME MANUFACTURING DATA USING AN INTERNET OF THINGS FACTORY GATEWAY
#152Coating Process and Quality Control of Coated Objects
#153ABNORMALITY MONITORING DEVICE AND ABNORMALITY MONITORING METHOD
#154PRODUCTION PROCESSING APPARATUS
#155Analysis system and analysis method
#156Systems and methods for improved manufacturing diagnostics
#157Manufacturing condition setting automating apparatus and method
#158Negotiation-based method and system for coordinating distributed MES order management
#159END TO END SMART MANUFACTURING ARCHITECTURE FOR OPERATIONAL EFFICIENCY AND QUALITY CONTROL
#160SYSTEMS AND METHODS OF ASSIGNING MICROTASKS OF WORKFLOWS TO TELEOPERATORS
#161Method and device of detecting fault in production
#162Method and device for producing a product and computer program product
#163Product inspection method and device, producing system and computer storage medium
#164Metal additive manufacturing qualification test artifact
#165Implementation of deep neural networks for testing and quality control in the production of memory devices
#166INFORMATION PROCESSING APPARATUS AND MONITORING METHOD
#167Method for determining root cause affecting yield in a semiconductor manufacturing process
#168Inspection system, terminal device, inspection method, and non-transitory computer readable storage medium
#169Coordinate measuring machine measurement and analysis of multiple workpieces
#170Fleet Matching Of Semiconductor Metrology Tools Without Dedicated Quality Control Wafers
#171Online monitoring of additive manufacturing using acoustic emission methods
#172System and method for controlling semiconductor manufacturing equipment
#173Inspection method for inspecting display panel and inspection apparatus
#174System and method for controlling semiconductor manufacturing apparatus
#175In-Situ Inspection Method Based on Digital Data Model of Weld
#176Weld spot analytics
#177Work support system and work support method
#178Substrate processing apparatus equipped with substrate scanner
#179Method and system for manufacturing industrial goods using influence diagram mapped to maximum expected utilities
#180Production system, production method, control device, and production process analysis method
#181Device and method for the additive manufacture of a workpiece
#182Laser processing system and method
#183Systems and methods for enhanced wafer manufacturing
#184Apparatus and method for controlling process
#185Systems and methods for a multi-purpose sensing device for industrial automation equipment
#186Display system, display method, and non-transitory computer-readable recording medium recording display program for checking cause of abnormality
#187Pharmaceutical Manufacturing Process Line Clearance
#188Display system, display method, and non-transitory computer-readable recording medium recording display program
#189Methods, (measuring) devices, and components thereof, for identifying events in a material-processing or material production process using event patterns
#190Progressive guidance of digital twin model assembly
#191Platform and method of operating for integrated end-to-end fully self-aligned interconnect process
#192Platform and method of operating for integrated end-to-end fully self-aligned interconnect process
#193Real-time anomaly detection and classification during semiconductor processing
#194Unified control system and method for machining of parts
#195Automated material welding
#196Process optimization using design of experiments and response surface models
#197Processing information management system and method for managing processing information
#198Product inspection system and production inspection method
#199Quality review management system
#200PORTABLE DEVICE AND METHOD FOR PRODUCTION CONTROL AND QUALITY CONTROL
#201EVENT MONITOR COUPLED TO A QUALITY REVIEW SYSTEM
#202Manufacturing system for biopharmaceutical products
#203QUALITY REVIEW SYSTEM WITH PLUG-INS
#204Quality review management system with configurable exception rules
#205Process control of semiconductor fabrication based on spectra quality metrics
#206Computed tomography for non-destructive evaluation of manufactured parts
#207Method and system for performing quality control on a diagnostic analyzer
#208Weld monitoring systems with unknown downtime disabling
#209System and method for monitoring a production process
#210Automated inspection process for batch production
#211Graphical user interface for scheduling and monitoring an automated inspection process for batch production
#212Method for measuring and correcting misregistration between layers in a semiconductor device, and misregistration targets useful therein
#213Managing apparatus and managing system
#214System for generating a custom hair dye formulation
#215Method for harmonising colour in manufactured items
#216Failure information sharing system
#217Apparatus and method for assembling optical module
#218Production and measurement of workpieces
#219Method and apparatus for monitoring a quality of an object of a 3D-print-job series of identical objects
#220MANUFACTURE MODELING AND MONITORING
#221Material processing optimization
#222Substrate processing apparatus, method of monitoring abnormality of substrate processing apparatus, and recording medium
#223CAD-based design control
#224Manufacturing statistical process control in the presence of multiple batch effects
#225Control device of substrate processing apparatus and control method of substrate processing apparatus
#226Mounting state informing apparatus and mounting state informing method
#227Method for controlling film production
#228Self-aware and correcting heterogenous platform incorporating integrated semiconductor processing modules and method for using same
#229Self-aware and correcting heterogenous platform incorporating integrated semiconductor processing modules and method for using same
#230Temperature detecting material, temperature detecting ink using same, temperature indicator, and product control system
#231Quality determination method, quality determination device, quality determination system and computer-readable non-transitory medium
#232Method to monitor additive manufacturing process for detection and in-situ correction of defects
#233Inspection, analysis, classification, and grading of transparent sheets using segmented datasets of photoelasticity measurements
#234Systems and methods for a multi-purpose sensing device for industrial automation equipment
#235Manufacturing system for biopharmaceutical products
#236Platform and method of operating for integrated end-to-end fully self-aligned interconnect process
#237Platform and method of operating for integrated end-to-end fully self-aligned interconnect process
#238Platform and method of operating for integrated end-to-end CMP-less interconnect process
#239Method for inspecting products in a manufacturing process
#240System and method for performing manufacturing quality control with the aid of a digital computer
#241METHOD OF PRODUCING PRODUCT
#242METHOD AND DATA DETECTION DEVICE FOR PROVIDING, RETRIEVING AND USING A DATA ELEMENT IN A PROCESS FOR PRODUCING PLASTIC SHEET MATERIAL
#243Systems and methods for virtually tagging and securing industrial equipment
#244Manufacture modeling and monitoring
#245Aircraft assembly tracker systems and methods
#246Method and system for performing quality control on a diagnostic analyzer
#247Quality control isometric for inspection of field welds and flange bolt-up connections
#248Quality control apparatus
#249Methodology of using the various capabilities of the smart box to perform testing of other functionality of the smart device
#250Quality management systems, methods, and program products for additive manufacturing supply chains
#251Systems and methods for virtually tagging and securing industrial equipment
#252Smart box for automatic feature testing of smart phones and other devices
#253Smart factory for production and quality management of thermoplastic and thermosetting compound
#254Industrial control apparatus, control method, program, packaging machine, and packaging machine control apparatus
#255Intelligent processing modulation system and method
#256INDUSTRIAL MACHINE MANAGEMENT APPARATUS AND INDUSTRIAL MACHINE MANAGEMENT SYSTEM
#257AUTOMATED PRODUCTION SYSTEM FOR MOBILE PHONE
#258Quality control method for regulating the operation of an electromechanical apparatus, for example an EBM apparatus, in order to obtain certified processed products
#259Manufacturing evaluation system
#260Systems and methods for virtually tagging and securing industrial equipment
#261Manufacturing system for biopharmaceutical products
#262Product inspection device, product inspection method, and computer program
#263CAD-based design control
#264Method for controlling a folding box machine for quality assurance
#265Method and system for performing quality control on a diagnostic analyzer
#266Machining machine system which determines acceptance/rejection of workpieces
#267Operator and manufacturing quality traceability
#268Methods and Apparatuses for Rejecting Defective Absorbent Articles from a Converting Line
#269Computer-implemented system and method for part surface manufacturing quality control
#270METHOD FOR ANALYZING VARIATION CAUSES OF MANUFACTURING PROCESS AND SYSTEM FOR ANALYZING VARIATION CAUSES OF MANUFACTURING PROCESS
#271Methods of error detection in fabrication processes
#272System and method for identifying manufactured parts
#273Quality assurance system and method
#274Testing arrangement for testing at least one connection interface and method for testing at least one connection interface with a testing arrangement
#275Real Time Monitoring System and Method Thereof of Optical Film Manufacturing Process
#276Online real-time control method for product manufacturing process
#277System and method for evaluation of a three-dimensional (3D) object during formation of the object
#278Systems and methods for detecting and rejecting defective absorbent articles from a converting line
#279Smart box for automatic feature testing of smart phones and other devices
#280Method and apparatus for autonomous identification of particle contamination due to isolated process events and systematic trends
#281Method and apparatus for detecting defects on tyres in a tyre production process
#282Systems and methods integrating multiple pieces of industrial equipment
#283Systems and methods for virtually tagging and securing industrial equipment
#284Systems and methods for a multi-purpose sensing device for industrial automation equipment
#285Systems and methods for assessing a quality of an industrial enterprise
#286Systems and methods for recommending components for an industrial system
#287Systems and methods for virtually assessing an industrial automation system
#288Systems and methods for enhancing monitoring of an industrial automation system
#289Systems and methods for electronically tracking a status of industrial equipment
#290Method to monitor additive manufacturing process for detection and in-situ correction of defects
#291AUTOMATED PRODUCTION SYSTEM FOR MOBILE PHONE
#292System and method for using an internet of things network for managing factory production
#293Methodology of using the various capabilities of the smart box to perform testing of other functionality of the smart device
#294Smart box for automatic feature testing of smart phones and other devices
#295Computer-implemented system and method for attribute-based manufacturing quality control
#296Portable device and method for production control and quality control
#297Production Control Support Apparatus and Production Control Support Method
#298Production line quality processes
#299Identifying registration errors of DSA lines
#300In-situ monitoring of fabrication of integrated computational elements