G05B2219/37127 - CPC Classification Index

ClassID:

184789 ⎘

G05B2219/37127 - CPC Classification

Classification description:

Program-control systems; Nc systems; Measurements Spm scanning probe microscopy, stm scanning tunneling microscopy

Recent Application in this class:

20240045408

DYNAMIC SAMPLING METHOD AND DEVICE FOR SEMICONDUCTOR MANUFACTURE

20200124411

Method for validating measurement data

20190178618

MEASUREMENT METHOD AND APPARATUS

20180066939

Method for validating measurement data

20160320183

Method for validating measurement data

20140121799

Method for validating measurement data