ClassID:

185154

G05B2219/37533 - CPC Classification

Classification description:

Program-control systems; Nc systems; Measurements Real time processing of data acquisition, monitoring

Recent Application in this class:
#1
20250076165
2025-03-06

COMPUTER NUMERICALLY CONTROLLED MACHINE SYSTEMS AND METHODS FOR MECHANICALLY TESTING ADDITIVE MANUFACTURED SPECIMENS

#2
20220179392
2022-06-09

SYSTEM AND METHOD FOR CONTINUOUS MACHINE MONITORING AT A KHZ-SCALE

#3
20220083032
2022-03-17

SMART FACTORY MONITORING SYSTEM

#4
20220011738
2022-01-13

PROCESS MANAGEMENT DEVICE, PROCESS MANAGEMENT METHOD, AND PROCESS MANAGEMENT PROGRAM STORAGE MEDIUM

#5
20190278253
2019-09-12

Method for judging key moments in whole process of machining step for computer numerical control machine tools

#6
20180173209
2018-06-21

Self-monitoring manufacturing system

#7
20180067472
2018-03-08

Numerical controller for data request with variable data size

#8
20170038764
2017-02-09

NC machine tool

#9
20160329975
2016-11-10

Digital measurement input for an electric automation device, electric automation device comprising a digital measurement input, and method for processing digital input measurement values

#10
20160078053
2016-03-17

Industrial monitoring system

#11
20140297638
2014-10-02

Data management apparatus, data management method and data management program

#12
20140289251
2014-09-25

Data collection system and data collection system program

#13
20140289250
2014-09-25

Data collection apparatus and data collection program

#14
20130226327
2013-08-29

Closed loop control for reliability

#15
20120143368
2012-06-07

Closed-loop CNC machine system and method

#16
20110264257
2011-10-27

Closed-loop CNC machine system and method

#17
20110161030
2011-06-30

Method And Device For Monitoring Measurement Data In Semiconductor Process

#18
20090326709
2009-12-31

System and method for data collection and analysis using robotic devices

#19
20080270504
2008-10-30

Method and system for filtering of networked, synchronized measurements

#20
20070259285
2007-11-08

Method for creating a built-in self test (BIST) table for monitoring a monolayer deposition (MLD) system

#21
20070239375
2007-10-11

Monitoring a system during low-pressure processes

#22
20070234953
2007-10-11

Monitoring a monolayer deposition (MLD) system using a built-in self test (BIST) table

#23
20070233427
2007-10-04

Monitoring a single-wafer processing system

#24
20070067059
2007-03-22

Closed-loop CNC machine system and method